MIL-PRF-38534 OP11-000C ASD0012817 MIL-STD-883 15-NOV-01 6-JUN-2009

Operational Amplifier OP11 1.0 SCOPE This specification documents the detailed requirements for Analog Devices space qualified

Quad Matched 741-Type Operational Amplifier OP11 1.0 SCOPE This specification documents the detailed requirements for Analog Devices space qualified die including die qualification as described for Class K in MIL-PRF-38534 MIL-PRF-38534, Appendix C, Table C-II except as modified herein. The manufacturing flow described in the STANDARD DIE PRODUCTS PROGRAM brochure at is to be considered a part of this specification. This data sheet specifically details the space grade version of this product. A more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog.com/OP11 2.0 Part Number. The complete part number(s) of this specification follow: Part Number OP11-000C OP11-000C 3.0 Description Quad Matched 741-Type Operational Amplifier Die Information 3.1 Die Dimensions Die Size Bond Pad Metalization 72 mil x 86 mil 3.2 Die Thickness 19 mil ± 2 mil Al/Cu Die Picture ASD0012817 ASD0012817 1. OUTPUT 1 2. -INPUT 1 3. +INPUT 1 4. +VS 5. +INPUT 2 6. -INPUT 2 7. OUTPUT 2 8. OUTPUT 3 9. -INPUT 3 10. +INPUT3 11. -VS 12. +INPUT 4 13. -INPUT 4 14. OUTPUT 4 Rev. G Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective companies. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2009 Analog Devices, Inc. All rights reserved. OP11 3.3 Absolute Maximum Ratings 1/ Positive Supply Voltage (+VS). +22V dc Negative Supply Voltage (-VS) . -22V dc Differential Input Voltage . ±30V dc Input Voltage (VIN). Supply Voltage Output Short Circuit Duration. Continuous Junction Temperature (TJ).+150°C Storage Temperature Range . -65°C to +150°C Ambient Operational Temperature Range. -55°C to +125°C Absolute Maximum Ratings Notes: 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 4.0 Die Qualification In accordance with class-K version of MIL-PRF-38534 MIL-PRF-38534, Appendix C, Table C-II, except as modified herein. (a) Qual Sample Size and Qual Acceptance Criteria 10/0 (b) Qual Sample Package DIP (c) Pre-screen electrical test over temperature performed post-assembly prior to die qualification. Table I - Dice Electrical Characteristics Parameter Symbol Conditions 1/ Input Offset Voltage VOS RS = 50 ,10k Input Offset Current Limit Min Limit Max Units ±0.5 mV IOS ±20 nA Input Bias Current IIB ±300 nA Input Voltage Range Common Mode Rejection Ratio IVR CMRR Power Supply Rejection Ratio PSRR Large Signal Voltage Gain AVOL VOUT = ±10V, RL 2k 100 V/mV Output Voltage Swing VOUT RL 2k ±11 V Supply Current (All Four Amplifiers) ISY VO = 0V ±12 VCM = IVR RS = 50 and 10k VS = ±5V, ±15V RS = 50 and 10k V 100 dB 32 6 Table I Notes: 1/ ±VS = ±15V, RS = 50 , TA = +25°C, and VCM = 0V, unless otherwise specified. ASD0012817 ASD0012817 Rev. G | Page 2 of 5 µV/V mA OP11 Table II - Electrical Characteristics for Qual Samples Parameter Symbol Conditions 1/ Input Offset Voltage VOS RS = 50 ,10k Subgroups Limit Min Limit Max ±1.0 1 ±20 2, 3 ±40 1 ±300 2, 3 Input Bias Current ±0.5 2, 3 Input Offset Current 1 ±375 IOS IIB Units mV nA nA Input Voltage Range IVR 1, 2, 3 Common Mode Rejection Ratio CMRR Power Supply Rejection Ratio PSRR Large Signal Voltage Gain AVOL VOUT = ±10V, RL2k 4 5, 6 100 50 V/mV Output Voltage Swing VOUT RL2k 4, 5, 6 ±11 V Supply Current (All Four Amplifiers) ISY VO = 0V 1 2, 3 RS = 50 and 10k , VCM = IVR VS = ±5V, ±15V RS = 50 and 10k ±12 V 1, 2, 3 100 dB 1, 2, 3 Table II Notes: 1/ ±VS = ±15V, RS = 50 , and VCM = 0V, unless otherwise specified. ASD0012817 ASD0012817 Rev. G | Page 3 of 5 32 6 6.7 µV/V mA OP11 Table III -Life Test Endpoint and Delta Parameter (Product is tested in accordance with Table II with the following exceptions) Life Post Burn In Limit Post Life Test Limit SubTest Parameter Symbol groups Min Max Min Max Delta Input Offset Voltage VOS 1 ±0.7 2, 3 Input Bias Current Input Offset Current 5.0 IIB IOS 1 2, 3 1 2, 3 ±0.9 ±0.2 Units mV ±1.4 ±350 ±400 ±25 ±475 ±30 ±50 Life Test/Burn-In Information 5.1 HTRB is not applicable for this drawing. 5.2 Burn-in is per MIL-STD-883 MIL-STD-883 Method 1015 test condition B or C. 5.3 Steady state life test is per MIL-STD-883 MIL-STD-883 Method 1005. ASD0012817 ASD0012817 Rev. G | Page 4 of 5 ±50 nA nA OP11 Rev A B C D E F G Description of Change Initiate Update web address Update web address Update 1.0 Scope description. Update header/footer and add to 1.0 scope description. Add Junction Temperature (TJ) +150°C to 3.3 Absolute Max. Ratings Updated Section 4.0c note to indicate pre-screen temp testing being performed. © 2009 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective companies. Printed in the U.S.A. 06/09 ASD0012817 ASD0012817 Rev. G | Page 5 of 5 Date 15-NOV-01 15-NOV-01 Jan. 25, 2002 Aug. 5, 2003 26 July 2007 19 Feb. 2008 March 31, 2008 6-JUN-2009 6-JUN-2009