NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: NDL7552P REFERENCE DOCUMENT NAME DOCUMENT NO. IEI-1205 IEI-1205 Quality grade on NEC semiconductor devices , To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC , DATA SHEET LASER DIODE NDL7552P InGaAsP STRAINED MQW DC-PBH PULSED LASER DIODE MODULE 1550 nm OTDR APPLICATION uc t DESCRIPTION NDL7552P is a 1550 nm newly developed Strained Multiple , connector nt NDL7552P 1.0 DESCRIPTION 12.16 in ue PART NUMBER 25.4 *1 Pulse ... | Original |
8 pages, |
NEC NDL7552p NDL7552PC NDL7552P NDL7502P NDL7113 NDL7103 datasheet abstract |
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| Abstract: Module with SMF 290/320 20/30 NDL7565P/P1 NDL7565P/P1 8/11 400 NDL7502P NDL7502P 125/190 NDL7552P , NDL7515P NDL7515P Series REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor devices C11531E C11531E Semiconductor , hermetic seal. NEC Corporation DANGER INVISIBLE LASER RADIATION AVOID DIRECT EXPOSURE TO BEAM OUTPUT , EXPOSURE-Invisible Laser Radiation is emitted from this aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku ... | Original |
8 pages, |
NDL7552P NDL7515PC NDL7515P1C NDL7515P1 NDL7515P NDL7113 NDL7103 nec laser diode OTDR NDL7515P abstract |
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| Abstract: NDL7565P/P1 NDL7565P/P1 8/11 400 NDL7502P NDL7502P 125/190 NDL7552P 100/125 1000 NDL7512P NDL7512P 90/110 , Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor devices C11531E C11531E Semiconductor device mounting technology manual C10535E C10535E , ingested. Please do not under any circumstances break the hermetic seal. NEC Corporation DANGER , aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku, Tokyo 108-01, Japan Type number: Manufactured ... | Original |
8 pages, |
NDL7103 NDL7113 NDL7563P NDL7563P1 NDL7563P1C NDL7563P1D NDL7563PC NDL7563PD nec laser diode OTDR NEC diode 1550 NDL7563P abstract |
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| Abstract: /30 NDL7565P/P1 NDL7565P/P1 8/11 400 NDL7502P NDL7502P 125/190 NDL7552P 100/125 1000 NDL7512P NDL7512P , Document Name Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor devices C11531E C11531E Semiconductor device mounting technology manual , substance if ingested. Please do not under any circumstances break the hermetic seal. NEC Corporation , from this aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku, Tokyo 108-01, Japan Type number ... | Original |
8 pages, |
C11531E NDL7553PD NDL7103 NDL7113 NDL7553P NDL7553P1 NDL7553P1C NDL7553P1D NDL7553PC NEC diode 1550 nec laser diode OTDR NDL7553P abstract |
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| Abstract: Module with SMF 125/190 NDL7552P 100/125 1 000 NDL7512P NDL7512P 90/110 NDL7562P NDL7562P 70/80 , : With frange With TEC and Thermistor NDL7510P NDL7510P REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system C11159E C11159E Quality grades on NEC semiconductor , ingested. Please do not under any circumstances break the hermetic seal. NEC Corporation DANGER , aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku, Tokyo 108-01, Japan Type number: Manufactured ... | Original |
8 pages, |
NEC LASER DIODE PIN DIP NDL7510PC NDL7510P NDL7163 NDL7153 NDL7113 NDL7103 81 110 thermistor 310 thermistor NDL7510P abstract |
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| Abstract: Module with SMF 125/190 NDL7552P 100/125 1 000 NDL7512P NDL7512P 90/110 NDL7562P NDL7562P 70/80 , : With frange With TEC and Thermistor NDL7560P NDL7560P REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system C11159E C11159E Quality grades on NEC semiconductor , ingested. Please do not under any circumstances break the hermetic seal. NEC Corporation DANGER , aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku, Tokyo 108-01, Japan Type number: Manufactured ... | Original |
8 pages, |
NDL7560PC NDL7560P NDL7163 NDL7153 NDL7113 NDL7103 NDL7560P abstract |
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| Abstract: NDL7502P NDL7502P 125/190 NDL7552P 100/125 1000 NDL7512P NDL7512P 90/110 NDL7562P NDL7562P 70/80 400 , with TEC and Thermistor NDL7564P NDL7564P Series REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor , not under any circumstances break the hermetic seal. NEC Corporation DANGER INVISIBLE LASER , SEMICONDUCTOR LASER AVOID EXPOSURE-Invisible Laser Radiation is emitted from this aperture NEC Building ... | Original |
8 pages, |
nec laser diode OTDR NDL7564PD NDL7564PC NDL7564P1D NDL7564P1C NDL7564P1 NDL7564P NDL7113 NDL7103 NDL7564P abstract |
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| Abstract: /30 NDL7565P/P1 NDL7565P/P1 8/11 400 NDL7502P NDL7502P 125/190 NDL7552P 100/125 1000 NDL7512P NDL7512P , Document Name Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor devices C11531E C11531E Semiconductor device mounting technology manual , substance if ingested. Please do not under any circumstances break the hermetic seal. NEC Corporation , from this aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku, Tokyo 108-01, Japan Type number ... | Original |
8 pages, |
NDL7503P1C NEC Fiber optic NDL7503PD NDL7503PC NDL7503P1D NDL7103 NDL7503P1 NDL7503P NDL7113 nec laser diode OTDR 1310nm otdr NDL7503P abstract |
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| Abstract: NDL7502P NDL7502P 125/190 NDL7552P 100/125 1000 NDL7512P NDL7512P 90/110 NDL7562P NDL7562P 70/80 400 , with TEC and Thermistor NDL7514P NDL7514P Series REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor , not under any circumstances break the hermetic seal. NEC Corporation DANGER INVISIBLE LASER , SEMICONDUCTOR LASER AVOID EXPOSURE-Invisible Laser Radiation is emitted from this aperture NEC Building ... | Original |
8 pages, |
nec laser diode OTDR NDL7103 NDL7113 NDL7514P NDL7514P1 NDL7514P1C NDL7514P1D NDL7514PC NDL7514PD NEC Fiber optic 1310nm otdr NDL7514P abstract |
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| Abstract: Module with SMF 290/320 20/30 NDL7565P/P1 NDL7565P/P1 8/11 400 NDL7502P NDL7502P 125/190 NDL7552P , NDL7565P NDL7565P Series REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system LEI-1201 LEI-1201 Quality grades on NEC semiconductor devices C11531E C11531E Semiconductor , hermetic seal. NEC Corporation DANGER INVISIBLE LASER RADIATION AVOID DIRECT EXPOSURE TO BEAM OUTPUT , EXPOSURE-Invisible Laser Radiation is emitted from this aperture NEC Building, 7-1, Shiba 5-chome, Minato-ku ... | Original |
8 pages, |
NDL7565PC NDL7565P1C NDL7565P1 NDL7565P NDL7113 NDL7103 nec laser diode OTDR NDL7565P abstract |
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