NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: Output Tristate control / NC Vcc Reference Standard MIL-STD-883D 1011.9, cond. B JIS-C 7022B-5 7022B-5, Cond. C MIL-STD-883D 1009.8, cond. C MIL-STD-883D 1008 MIL-STD-883D 2002.3, cond. B MIL-STD-883D ... | Original |
2 pages, |
883D mil-std 883d MIL-STD883D Mil-Std-883D VFTX312 VFTX312 abstract |
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| Abstract: Mechanical Shock Vibration MIL-STD-883D Method 2003.7 MIL-STD-883D Method 2002 MIL-STD-883D Method , Shock IEC 68-2-20A Method 1B MIL-STD-883D Method 1001 Cyclic Moisture Resistance Fast Temperature Cycling Accelerated Aging (Biased) Damp Heat MIL-STD-883D Method 1004 MIL-STD-883D , MIL-STD-883D Method 2003.7 - No Steam Aging Device PSE6256/03 PSE6256/03 Change in Sensitivity (dB)* - 1.4 Change , and Vibration Mechanical Shock - MIL-STD-883D Method 2002 - Condition B 500 g, 1.0 ms, 5 times/axis ... | Original |
6 pages, |
UL-94-VO SG608 SDX1155 mil-std 883d method 1010 CDX2622 CDX2155 Mil-Std-883D TA-NWT-000983 CDX2155 abstract |
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| Abstract: seconds (maximum) Reference Standard MIL-STD-883D 1011.9, cond. B JIS-C 7022B-5 7022B-5, Cond. C JIS-C-5021 JIS-C-5021 MIL-STD-883D 2002.3, cond. B MIL-STD-883D 2007.2, cond. B 75 South Street, Hopkinton, MA 01748 � ... | Original |
3 pages, |
VFTX332 VCTCXO 12.8Mhz TCXO 20MHz TCXO 26MHz tcxo 13MHz tcxo 10mhz dbc Mil-Std-883D 12,8MHz VFTX332 abstract |
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| Abstract: rated at 20kV ESD using the IEC 61000-42 contact discharge method. Using the MIL-STD-883D (Method 3015 , In-system ESD withstand voltage*: Human Body Model (MIL-STD-883D, method 3015) � IEC 61000-4-2, contact discharge method � Clamping voltage during ESD discharge Positive MIL-STD-883D (Method 3015), 8kV ... | Original |
2 pages, |
PACDN046 PACDN045 PACDN044 PACDN043 PACDN042 HIGH VOLTAGE DIODE 20kv PACDN042/043/ MIL-STD-883D PACDN042/043/ abstract |
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| Abstract: international standard (Level 4, 8kV contact discharge). Using the MIL-STD-883D (Method 3015) specification , In-system ESD withstand voltage*: Human Body Model (MIL-STD-883D, method 3015) IEC 61000-4-2, contact , * MIL-STD-883D (Method 3015), 8kV 13 V Capacitance at 0V dc, 1MHz 45 pF Temperature Range ... | Original |
2 pages, |
PACDN3401C P0402FC05C PACDN3401C abstract |
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| Abstract: 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) MIL-STD-750D MIL-STD-750D: 1026 MIL-STD-883D: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 � 2.t=1000 hrs (-24hrs, +72hrs) MIL-STD-883D:1008 JIS C 7021: B-10 , MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1011 MIL-STD-202F MIL-STD-202F: 208D MIL-STD-750D MIL-STD-750D: 2026 MIL-STD-883D: 2003 IEC 68 Part 2-20 JIS C 7021: A-2 MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1010 JIS C 7021: A-4 ... | Original |
8 pages, |
datasheet abstract |
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| Abstract: Maximum Rating. 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) MIL-STD-750D MIL-STD-750D: 1026 MIL-STD-883D: 1005 JIS C , ) MIL-STD-883D:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ±5 2.t=1000 hrs (-24hrs , ±0.5sec 3.Coverage 95% of the dipped surface MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1011 MIL-STD-202F MIL-STD-202F: 208D MIL-STD-750D MIL-STD-750D: 2026 MIL-STD-883D: 2003 IEC 68 Part 2-20 JIS C 7021: A-2 , : 1051 MIL-STD-883D: 1010 JIS C 7021: A-4 Ramp-up rate(183 to Peak) +3 second max Temp. maintain ... | Original |
7 pages, |
LVY9353 107D LVY9353 abstract |
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| Abstract: 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) MIL-STD-750D MIL-STD-750D: 1026 MIL-STD-883D: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 � 2.t=1000 hrs (-24hrs, +72hrs) MIL-STD-883D:1008 JIS C 7021: B-10 , : 1051 MIL-STD-883D: 1011 1.T.Sol=235 � 2.Immersion time 2 �5sec 3.Immersion rate 25 �5mm/sec , MIL-STD-883D: 2003 IEC 68 Part 2-20 JIS C 7021: A-2 1.105 ~ 25 ~ 55 ~ 25 30mins 5mins 30mins 5mins 2.10 Cyeles MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1010 JIS C 7021: A-4 Ramp-up ... | Original |
8 pages, |
Mil-Std-883D 107D L9UG9553/TR1 L9UG9553/TR1 abstract |
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| Abstract: MIL-STD-883D: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ±5 2.t=1000 hrs (-24hrs, +72hrs) MIL-STD-883D:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ±5 2.t=1000 , ) (10min) 3.total 10 cycles MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1011 1.T.Sol=235 , 5.Coverage 95% of the dipped surface MIL-STD-202F MIL-STD-202F: 208D MIL-STD-750D MIL-STD-750D: 2026 MIL-STD-883D: 2003 IEC 68 , MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1010 JIS C 7021: A-4 Ramp-up rate(183 to Peak) +3 ... | Original |
7 pages, |
107D datasheet abstract |
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| Abstract: hrs (-24hrs, +72hrs) MIL-STD-750D MIL-STD-750D: 1026 MIL-STD-883D: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 � 2.t=1000 hrs (-24hrs, +72hrs) MIL-STD-883D:1008 JIS C 7021: B-10 Low , : 1051 MIL-STD-883D: 1011 MIL-STD-202F MIL-STD-202F: 208D MIL-STD-750D MIL-STD-750D: 2026 MIL-STD-883D: 2003 IEC 68 Part 2-20 JIS C 7021: A-2 MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1010 JIS C 7021: A-4 ... | Original |
8 pages, |
107D datasheet abstract |
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| Abstract: cube" packages, with standard labels attached, were tested according to MIL-STD883D, method 2015.9. In , Special Tests D2 Fiber Pull D1 RGA 550 Reference IEC 68-2-20A Method 1B MIL-STD-883D Method 2002 MIL-STD-883D Method 2007 MIL-STD-883D Method 2002 MIL-STD-883D Method 2003.7 MIL-STD-883D Method 1001 MIL-STD-883D Method 1004 MIL-STD-202 MIL-STD-202 Method 103 MIL-STD-883D Method 1010 Condition , cycles 20 cycles UL-94-VO UL-94-VO H.B.M. 500 V 1 kg x 3 times MIL-STD-883D 5000 ppm limit Method 1018 ... | Original |
11 pages, |
LST3921 LST3821 LST292X LST282X HFBR 5000 CMAC 20063 197412 210895 QP0044 LST292X abstract |
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| Abstract: 61000-4-2 contact discharge method. Using the MILSTD-883D (Method 3015) specification for Human Body Model , (MIL-STD-883D, method 3015 IEC 61000-4-2, contact discharge method ±30 ±25 kV kV Clamping voltage during ESD discharge MIL-STD-883D (Method 3015), 8kV 12 8 V V 30 pF Positive Negative , ESD withstand voltage*: Human Body Model (MIL-STD-883D, method 3015 IEC 61000-4-2, contact discharge method ±30 ±18 kV kV Clamping voltage during ESD discharge MIL-STD-883D (Method 3015), 8kV ... | Original |
3 pages, |
PACDN2408C PACDN1408C without underfill PACDN1408C abstract |
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| Abstract: MIL-STD-883D 1011.9, cond. B JIS-C 7022B-5 7022B-5, Cond. C JIS-C-5021 JIS-C-5021 MIL-STD-883D 2002.3, cond. B MIL-STD-883D ... | Original |
3 pages, |
883-D 19.44MHz TCXO 16.384MHZ tcxo 13MHz STRATUM* vftx332 12.8mhz vftx332 VFTX332 VFTX332 abstract |
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| Abstract: pins are rated at 20kV ESD using the IEC 61000-4-2 contact discharge method. Using the MIL-STD-883D , * Human Body Model (MIL-STD-883D, method 3015) IEC 61000-4-2, contact discharge method Clamping voltage during ESD discharge Positive MIL-STD-883D (Method 3015), 8kV Negative Capacitance @ 2.5V dc, 1 MHz ... | Original |
2 pages, |
20 sot23-6 esd esd diode sot23-6 PACDN042 PACDN043 PACDN044 PACDN045 PACDN046 SC70-5 SC70-6 5 marking diode d044 d42 msop D44 SOT23-6 sot23-6 D42 PACDN042/043/ PACDN042/043/ abstract |
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| Abstract: (3 TIMES) MIL-STD-883D METHOD 2002.3, CONDITION B MIL-STD-883D METHOD 2007.2, CONDITION A 230°C ... | Original |
1 pages, |
datasheet abstract |
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| Xilinx Answer #2126 : 9500 ESD information Answers Database 9500 ESD information Record #2126 Product Family: Hardware Product Line: 9500 Problem Title: 9500 ESD information Problem Description: Keywords: 9500, esd, 95108, reliability Urgency: standard General Description: Electrostatic Data for XC9500 XC9500 XC9500 XC9500 Fa www.datasheetarchive.com/files/xilinx/docs/wcd00007/wcd00720.htm |
Xilinx | 17/07/1998 | 3.63 Kb | HTM | wcd00720.htm |
| Xilinx Answer #2126 : 9500 ESD information Answers Database 9500 ESD information Record #2126 Product Family: Hardware Product Line: 9500 Problem Title: 9500 ESD information Problem Description: Keywords: 9500, esd, 95108, reliability Urgency: standard General Description: Electrostatic Data for XC9500 XC9500 XC9500 XC9500 Fa www.datasheetarchive.com/files/xilinx/docs/wcd00007/wcd0078d-v1.htm |
Xilinx | 16/02/1999 | 3.72 Kb | HTM | wcd0078d-v1.htm |
| New Test Method for Low Dose Rate Applications Getting Realistic Test Results for Low Dose Rate Applications It is long recognized that MIL-STD-883D MIL-STD-883D MIL-STD-883D MIL-STD-883D, Method 1019.4 does not accurately predict a microcircuit's low dose rate irradiation response. In particular, the standby leakage (ICC) and/or TRI-STATE® leakage currents are inaccurately represented. The present Test Method 1019.4 uses a stated dose rate range of 50 - 300 rad(Si)/s which generates induced radiation leakage cur www.datasheetarchive.com/files/national/docs/wcd00012/wcd0121f.htm |
National | 03/04/1998 | 5.93 Kb | HTM | wcd0121f.htm |