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HM1-65642B/883 Intersil Corporation 8KX8 STANDARD SRAM, 150ns, CDIP28 visit Intersil
24502BVA Intersil Corporation 1KX4 STANDARD SRAM, 120ns, CDIP18 visit Intersil
HM1-65642/883 Intersil Corporation 8KX8 STANDARD SRAM, 150ns, CDIP28, CERAMIC, DIP-28 visit Intersil
ISL6843IU-T Intersil Corporation Improved Industry-Standard Single-Ended PWM Controller; DFN8, MSOP8, SOIC8; Temp Range: See Datasheet visit Intersil Buy
8403606JA Intersil Corporation 2KX8 STANDARD SRAM, 70ns, CDIP24, CERAMIC, DIP-24 visit Intersil
HM1-6551/883 Intersil Corporation 256X4 STANDARD SRAM, 300ns, CDIP22, CERAMIC, DIP-22 visit Intersil

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Part : DO-DI-MIL-SECMON-GNU-WW Supplier : Xilinx Manufacturer : Avnet Stock : - Best Price : €22,838.6270 Price Each : €22,838.6270
Part : MT5600SMI-LS Supplier : Multi-Tech Systems Manufacturer : Avnet Stock : - Best Price : $0.3012 Price Each : $0.3290
Part : MT5634SMI-LS Supplier : Multi-Tech Systems Manufacturer : Avnet Stock : - Best Price : $0.3012 Price Each : $0.3290
Part : MT5692SMI-LS Supplier : Multi-Tech Systems Manufacturer : Avnet Stock : - Best Price : $0.3012 Price Each : $0.3290
Part : MT9234SMI-LS Supplier : Multi-Tech Systems Manufacturer : Avnet Stock : - Best Price : $0.3012 Price Each : $0.3290
Part : DIL16W/SOIC16 ZIF 300MIL SFLAS Supplier : Dataman Programmers Manufacturer : Newark element14 Stock : - Best Price : $115.00 Price Each : $115.00
Part : DIL8W/SOIC8 ZIF 150MIL SFLASH- Supplier : Dataman Programmers Manufacturer : Newark element14 Stock : - Best Price : $110.00 Price Each : $110.00
Part : DIL8W/SOIC8 ZIF 200MIL SFLASH- Supplier : Dataman Programmers Manufacturer : Newark element14 Stock : - Best Price : $130.00 Price Each : $130.00
Part : DIL8W/SOIC8-2 ZIF 200MIL SFLAS Supplier : Dataman Programmers Manufacturer : Newark element14 Stock : - Best Price : $130.00 Price Each : $130.00
Part : DIL8W/TSSOP8 ZIF 170MIL SFLASH Supplier : Dataman Programmers Manufacturer : Newark element14 Stock : - Best Price : $130.00 Price Each : $130.00
Part : M23053/5-116-0 MIL SPEC Supplier : TE Connectivity Manufacturer : Newark element14 Stock : - Best Price : $17.28 Price Each : $21.72
Part : MIL-SPEC WIRE Supplier : Carlisle Interconnect Components Manufacturer : Newark element14 Stock : - Best Price : - Price Each : -
Part : MT5600SMI-LS Supplier : Multi-Tech Systems Manufacturer : Future Electronics Stock : - Best Price : $0.3050 Price Each : $0.3050
Part : MT5634SMI-LS Supplier : Multi-Tech Systems Manufacturer : Future Electronics Stock : - Best Price : $0.34 Price Each : $0.34
Part : MT5692SMI-LS Supplier : Multi-Tech Systems Manufacturer : Future Electronics Stock : 500 Best Price : $0.3150 Price Each : $0.3150
Part : MT5692SMI-LS Supplier : Multi-Tech Systems Manufacturer : Future Electronics Stock : 500 Best Price : $0.3150 Price Each : $0.3150
Part : LM7709H-MIL-SPECIAL Supplier : National Semiconductor Manufacturer : Rochester Electronics Stock : 738 Best Price : - Price Each : -
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MIL-STD-973

Catalog Datasheet MFG & Type PDF Document Tags

qml-38535

Abstract: CQCC1-N20 , Manufacturing, General Specification for. MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS MILITARY MIL-HDBK , MIL-STD-973. STANDARD SIZE MICROCIRCUIT DRAWING A 5962-97572 DEFENSE SUPPLY CENTER COLUMBUS REVISION , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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qml-38535 CQCC1-N20 5962-E142-97 MIL-HDBK-103 QML-38535 5962-9757201QCA SNJ54AS86AJ 5962-9757201Q2A

QML-38535

Abstract: CQCC1-N20 Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review for , accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of
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TL5001 TL5001A 5962-E498-99 QML-38353 5962-9958301QPA 5962-9958301Q2A TL5001MFKB

QML-38535

Abstract: CQCC1-N20 , General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 - , defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC , individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form
-
Original
5962-E182-00 5962-9959501QPA THS4031MJGB 5962-9959501Q2A THS4031MFKB

qml38535

Abstract: qml-38535 -883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD , herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973 , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change
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qml38535 CDFP2-F14 GDFP1-F14 5962-E141-97 0047DA 5962-9756101QC SNJ54AS11J 5962-9756101QDA 5962-9756101Q2A

QML-38535

Abstract: CLC440 for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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CLC440 5962-E234-97 T0Q47G 0Q3147D 5962-9751801MPA CLC440A8B T00470

qml-38535

Abstract: LF442 DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973 , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692
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LF442 5962-E302-97 TGG47D D03D754 5962-9763301QGA LF442MH/883 0D30755

qml-38535

Abstract: GDIP1-T16 Microelectronics. Configuration Management. Microcircuit Case Outlines. MILITARY MIL-STD-883 MIL-STD-973 MIL-STD , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of
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GDIP1-T16 hLB 124 transistor 5962-E117-97 5962-9650301QEA LM2595J-5

LM126

Abstract: QML-38535 DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration Management. MIL-STD , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of
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LM126 5962-8993001MIA 5962-E107-00 TW223T LM126/MIA

qml-38535

Abstract: CDFP2-F14 Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS Test Method , to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review for , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal
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SMD MARKING CODE b73 5962-E319-98 5962-9861101QCA SNJ54128J 5962-9861101QDA SNJ54128W 5962-9861101Q2A

qml-38535

Abstract: GDIP1-T16 Microcircuits. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Interface Standard For Microcircuit Case , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and
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5962-9650201QEA LM2595-12 5962-E385-98 OD47D LM2595J-12-QML

GDIP1-T16

Abstract: LM2595 -883 MIL-STD-973 MIL-STD-1835 Test Methods and Procedures for Microelectronics. Configuration Management , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6. NOTES SIZE STANDARD MICROCIRCUIT
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LM2595 5962-E051-97 T0047Q MIL-PRF-38535 5962-9650401QEA LM2595J-AD

qml38535

Abstract: AD648S -883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD , MIL-STD-973. STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97535 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO , the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using
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5962-9753502VPA AD648S AD648T 5962-E184-97 RDD47G AD648SH/QMLV 5962-9753501VPA AD648SQ/QMLV 5962-9753502VGA

qml-38535

Abstract: HA-4741 DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change
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HA-4741 5962-E481 TD0470A HA1-4741/883

5962-98651

Abstract: QML-38535 for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal
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5962-98651 DS90LV031A GDFP2-F16 990526 5962-E283-99 DS90LV031AW-QML

QML-38535

Abstract: AD677 , General Specification for. MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS MILITARY MIL-HDBK-103 MIL-HDBK , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESC's agent, and , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change
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AD677 16-BIT 5962-E259-96 MIL-HDBK-1331 10047G

MIL-PRF-38535

Abstract: QML-38535 MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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CLC111 GDS443L MIL-PRF-38535 appendix a MIL-PRF38535 5962-E528-96 00E4433 5962-9687601MPA CLC111A8B DD47G0 0D24442

MIL-PRF-38535

Abstract: QML-38535 DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692
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linear application handbooks national semiconductor MILPRF38535 CLC449 electrical symbols 5962-E248-97 5962-9752001MPA CLC449A8B

qml-38535

Abstract: CQCC1-N20 Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , required for any change as defined In MIL-STD-973. 3.9 Verification and review for device class M. For , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and
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OP467 5962-E047-00 OP467AY/883 OP467ARC/883

qml-38535

Abstract: 54LS14 DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change
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54LS14 5962-E101-98 5962-9665801QCA SNJ54LS14J 5962-9665801QDA SNJ54LS14W 5962-9665801Q2A

qml38535

Abstract: 5962-9084201MGA for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS DEPARTMENT OF , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal
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Original
5962-9084201MGA 5962-R180-94 5962-E578-00 5962-9084201MPA 5962-9084202MGA 5962-9084202MPA

QML-38535

Abstract: MIL-STD-973 . MIL-STD-973 - Configuration Management. MIL-STD-1835 - Microcircuit Case Outlines. BULLETIN MILITARY , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESC's agent, and , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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QML-38534 AMP03 5962-E216-95 MIL-H-38534 MIL-I-38535 5962-XXXXXZZ MIL-BUL-103

MIL-STD-973

Abstract: qml-38535 MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration , as defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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DG384AA 5962-E498-96 QML-3B535 L-HDBK-103

QML-38535

Abstract: MIL-PRF-38535 Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973 , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and
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TL1431 5962-E004-00 5962-9962001QPA TL1431MJGB 5962-9962001Q2A TL1431MFKB

QML-38535

Abstract: QML38535 for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal
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LT1127A 5962-E208-99 LT1127AMJ/883

CLC452A8B

Abstract: qml-38535 -883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD , MIL-STD-973. STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97521 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal
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CLC452A8B CLC452 5962-E249-97 5962-9752101M TD0470

qml-38535

Abstract: MIL-STD-973 , Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and
DEPARTMENT OF DEFENSE
Original
5962-E258-99 5962-9864601QEA AD8306A/QML

QML-38535

Abstract: LF412 for. STANDARDS MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accordance with MIL-STD-973 using DO Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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LF412 5962-E294-96 0DM70 M1L-HDBK-1331 TQGM70

QML-38535

Abstract: CLC446 for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuit. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692
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CLC446 5962-E240-97 5962-9751901MPA CLC446A8B

GE2 TRANSISTOR

Abstract: MIL-BUL-103 Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD-1835 - , devices acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change
DEPARTMENT OF DEFENSE
Original
GE2 TRANSISTOR AD603 military BJT100 5962-E157-94 5962-9457201MEX 5962-9457202MEX 5962-9457203MPX AD600SQ/883B AD602SQ/883B

qml-38535

Abstract: 65E smd Microcircuits. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Interface Standard For Microcircuit Case , any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692
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65E smd Unitrode Semiconductor UC1707 UC2707 Unitrode cage code 596287619 5962-R056-92 5962-R234-92 5962-R122-93 UC1707J/883B UC1707L/883BC 5962-8761902NXB

QML-38535

Abstract: 5962-98590 Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , required for any change as defined In MIL-STD-973. 3.9 Verification and review for device class M. For , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal
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5962-98590 5962-E074-00 5962P98590 OM3957SM/883B OM3957NM/883B OM3957ST/883B 5962P9859001

qml-38535

Abstract: CDIP6-T24 Circuits, Manufacturing, General Specification for. STANDARDS MILITARY MIL-STD-973 - Configuration , required for any change as defined in MIL-STD-973. STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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CDIP6-T24 TQQ470 59C22 L-BUL-103

qml-38535

Abstract: MIL-I-38535 Integrated Circuits, Manufacturing, General Specification for. MIL-STD-883 MIL-STD-973 MIL-STD-1835 BULLETIN , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESC's agent, and , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military
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5962-E135-96

REF-02ARC

Abstract: REF02AJ8 DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , ) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 , record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973
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5962-8551401VPA REF02 5962R8551401VHA REF-02ARC REF02AJ8 F02A REF-02A 13t SMD MARKING CODE 1ES66 REF02AZ/883 REF-02AJ8/883 REF02AZ/883B REF-02ARC/883 8551402GC
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