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MIL-STD-973

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: , Manufacturing, General Specification for. MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS MILITARY MIL-HDBK , MIL-STD-973. STANDARD SIZE MICROCIRCUIT DRAWING A 5962-97572 DEFENSE SUPPLY CENTER COLUMBUS REVISION , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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qml-38535 CQCC1-N20 5962-E142-97 MIL-HDBK-103 QML-38535 5962-9757201QCA SNJ54AS86AJ 5962-9757201Q2A
Abstract: Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review for , accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of -
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TL5001 TL5001A 5962-E498-99 QML-38353 5962-9958301QPA 5962-9958301Q2A TL5001MFKB
Abstract: -883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD , herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973 , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change -
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qml38535 CDFP2-F14 GDFP1-F14 5962-E141-97 0047DA 5962-9756101QC SNJ54AS11J 5962-9756101QDA 5962-9756101Q2A
Abstract: for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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CLC440 5962-E234-97 T0Q47G 0Q3147D 5962-9751801MPA CLC440A8B T00470
Abstract: DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973 , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692 -
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LF442 5962-E302-97 TGG47D D03D754 5962-9763301QGA LF442MH/883 0D30755
Abstract: Microelectronics. Configuration Management. Microcircuit Case Outlines. MILITARY MIL-STD-883 MIL-STD-973 MIL-STD , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of -
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GDIP1-T16 hLB 124 transistor 5962-E117-97 5962-9650301QEA LM2595J-5
Abstract: DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration Management. MIL-STD , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of -
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5962-8993001MIA LM126 5962-E107-00 TW223T LM126/MIA
Abstract: Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS Test Method , to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review for , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal -
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SMD MARKING CODE b73 5962-E319-98 5962-9861101QCA SNJ54128J 5962-9861101QDA SNJ54128W 5962-9861101Q2A
Abstract: , General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 - , defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC , individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form -
Original
5962-E182-00 5962-9959501QPA THS4031MJGB 5962-9959501Q2A THS4031MFKB
Abstract: Microcircuits. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Interface Standard For Microcircuit Case , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and -
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5962-9650201QEA LM2595-12 5962-E385-98 OD47D LM2595J-12-QML
Abstract: -883 MIL-STD-973 MIL-STD-1835 Test Methods and Procedures for Microelectronics. Configuration Management , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6. NOTES SIZE STANDARD MICROCIRCUIT -
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LM2595 5962-E051-97 T0047Q MIL-PRF-38535 5962-9650401QEA LM2595J-AD
Abstract: -883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD , MIL-STD-973. STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97535 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO , the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using -
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5962-9753502VPA AD648S AD648T 5962-E184-97 RDD47G AD648SH/QMLV 5962-9753501VPA AD648SQ/QMLV 5962-9753502VGA
Abstract: DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change -
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HA-4741 5962-E481 TD0470A HA1-4741/883
Abstract: for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal -
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5962-98651 990526 DS90LV031A GDFP2-F16 5962-E283-99 DS90LV031AW-QML
Abstract: , General Specification for. MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS MILITARY MIL-HDBK-103 MIL-HDBK , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESC's agent, and , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change -
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AD677 16-BIT 5962-E259-96 MIL-HDBK-1331 10047G
Abstract: MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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CLC111 GDS443L MIL-PRF-38535 appendix a MIL-PRF38535 5962-E528-96 00E4433 5962-9687601MPA CLC111A8B DD47G0 0D24442
Abstract: DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692 -
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CLC449 electrical symbols MILPRF38535 5962-E248-97 5962-9752001MPA CLC449A8B
Abstract: Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , required for any change as defined In MIL-STD-973. 3.9 Verification and review for device class M. For , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and -
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OP467 5962-E047-00 OP467AY/883 OP467ARC/883
Abstract: DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change -
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54LS14 5962-E101-98 5962-9665801QCA SNJ54LS14J 5962-9665801QDA SNJ54LS14W 5962-9665801Q2A
Abstract: for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 HANDBOOKS DEPARTMENT OF , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal -
Original
5962-9084201MGA 5962-R180-94 5962-E578-00 5962-9084201MPA 5962-9084202MGA 5962-9084202MPA
Abstract: . MIL-STD-973 - Configuration Management. MIL-STD-1835 - Microcircuit Case Outlines. BULLETIN MILITARY , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESC's agent, and , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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QML-38534 AMP03 5962-E216-95 MIL-H-38534 MIL-I-38535 5962-XXXXXZZ MIL-BUL-103
Abstract: MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration , as defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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DG384AA 5962-E498-96 QML-3B535 L-HDBK-103
Abstract: Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973 , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and -
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TL1431 5962-E004-00 5962-9962001QPA TL1431MJGB 5962-9962001Q2A TL1431MFKB
Abstract: for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal -
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LT1127A 5962-E208-99 LT1127AMJ/883
Abstract: -883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD , MIL-STD-973. STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97521 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal -
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CLC452A8B CLC452 5962-E249-97 5962-9752101M TD0470
Abstract: , Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and , with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and DEPARTMENT OF DEFENSE
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5962-E258-99 5962-9864601QEA AD8306A/QML
Abstract: for. STANDARDS MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , accordance with MIL-STD-973 using DO Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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LF412 5962-E294-96 0DM70 M1L-HDBK-1331 TQGM70
Abstract: for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuit. MIL-STD-973 - , required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692 -
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CLC446 5962-E240-97 5962-9751901MPA CLC446A8B
Abstract: Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD-1835 - , devices acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification , coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change DEPARTMENT OF DEFENSE
Original
GE2 TRANSISTOR AD603 military BJT100 5962-E157-94 5962-9457201MEX 5962-9457202MEX 5962-9457203MPX AD600SQ/883B AD602SQ/883B
Abstract: Microcircuits. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Interface Standard For Microcircuit Case , any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class , documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692 -
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596287619 65E smd UC1707 UC2707 Unitrode cage code Unitrode Semiconductor 5962-R056-92 5962-R234-92 5962-R122-93 UC1707J/883B UC1707L/883BC 5962-8761902NXB
Abstract: Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 , required for any change as defined In MIL-STD-973. 3.9 Verification and review for device class M. For , will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal -
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5962-98590 5962-E074-00 5962P98590 OM3957SM/883B OM3957NM/883B OM3957ST/883B 5962P9859001
Abstract: Circuits, Manufacturing, General Specification for. STANDARDS MILITARY MIL-STD-973 - Configuration , required for any change as defined in MIL-STD-973. STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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59C22 CDIP6-T24 TQQ470 L-BUL-103
Abstract: Integrated Circuits, Manufacturing, General Specification for. MIL-STD-883 MIL-STD-973 MIL-STD-1835 BULLETIN , MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESC's agent, and , accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military -
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5962-E135-96
Abstract: DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-973 - Configuration , ) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 , record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 -
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5962-8551401VPA REF02 5962R8551401VHA REF-02ARC REF02AJ8 REF-02A F02A REF02A 1ES66 REF02AZ/883 REF-02AJ8/883 REF02AZ/883B REF-02ARC/883 8551402GC
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