NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: , JANTX screening. 1) High Temperature Life (non-operating life/ stabilization bake MIL-STD-750) Method 1032 48 hrs @ +175°C 2) Temperature Cycling MIL-STD-750 Method 1051 Condition C , Condition A MIL-STD-750 5) Final Electrical MIL-STD-750 96 hrs min. @ TA=150°C and min. ... | Original |
1 pages, |
electrical electronic guide MIL-STD-750 datasheet abstract |
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| Abstract: (non-operating life/ stabilization bake MIL-STD-750) Method 1032 48 hrs @ +175°C 2) Temperature Cycling MIL-STD-750 Method 1051 Condition C 20 Cycles -65°C to +175°C 15 min. extremes No dwell , Leakage Current Method 1038 Condition A MIL-STD-750 5) Final Electrical MIL-STD-750 96 , 1) High Temperature Life (non-operating life/ stabilization bake MIL-STD-750) Method 1032 , VRWM MIL-STD-750 5) Final Electrical MIL-STD-750 Method 4011 Method 4016 Method 4021 ... | Original |
4 pages, |
4011 MIL-STD-750 MIL-PRF-19500 MIL-PRF-19500 abstract |
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| Abstract: Inspection i.a.w. method 2072 of MIL-STD-750 a. b. c. d. e. Wafer Lot Evaluation Testing (WLAT) i.a.w. method 5001 of MIL-STD-750, including SEM Unclamped Inductive Switching (IAS) i.a.w. method 3470 of MIL-STD-750 at VGS peak= 15 V, L= 100uH, I AS= 132 A Gate Stress Test for 250 us at VGS= 30 Vdc. Safe Operating Area i.a.w. method 3474 of MIL-STD-750 at VDS= 160 V, ID= 2.8 A for 10 ms High Temperature Gate Bias i.a.w. method 1042 cond.B of MIL-STD-750: 48 hrs at T ambient= 150° Drain shorted to ... | Original |
4 pages, |
MX043J MX043G MIL-STD-750 2072 ID100 FSC260R MIL-STD-750 MX043J abstract |
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| Abstract: Appendix D: Screening Guides HRP 106 : Space Level Hybrid Multiplier Assemblies The following screening for multiplier assemblies is a guide for a suggested procedure. It can be modified or adjusted to suit requirements for a hi-rel / space level hybrid multiplier application. 1) Pre-pot Visual MIL-STD-750 Method 2071 2) High Temp Life MIL-STD-750 Method 1032 24 hours @ TA =125°C 3) Temperature Cycling MIL-STD-750 Method 107 20 Cycles -55°C to +105°C 15 minutes at extremes 15 ... | Original |
1 pages, |
electrical electronic guide MIL-STD-750 datasheet abstract |
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| Abstract: Temperature Life (non-operating life/ stabilization bake MIL-STD-750) Method 1032 24 hrs @ 125°C 2 , Leakage Current Method 1038 Condition A 24 hrs @ +125°C at 80% of VRWM MIL-STD-750 5) Final Electrical MIL-STD-750 Method 4011 Method 4016 Method 4021 Forward Voltage Drop Leakage Current ... | Original |
1 pages, |
MIL-PRF-19500 MIL STD 750 electrical electronic guide 4011 MIL-STD-750 MIL-PRF-19500 abstract |
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| Abstract: HTRB (Life Test) MIL-STD-750, Method 1038A Ta = 125 deg C VR = 32 Vdc Duration = 1000 Hours , hours 77 Units 0 0% Completed Temperature Cycling MIL-STD-750, Method 1051 Temp , MIL-STD-750, Method 2006 Y1 Direction 15,000 G's Minimum 77 Units 0 0% Completed Variable Frequency Vibration MIL-STD-750, Method 2056 50 G's Minimum 100Hz to 2kHz 77 Units 0 0% Completed Mechanical Shock MIL-STD-750, Method 2016 Non-Operating , 1500 G's, 0.5 ms duration, 5 ... | Original |
3 pages, |
UPS840e3 plaskon qualify thomas shear UPGA301A UPS1040E3 1038A UPS835LE3 CK6001 MIL-STD-750 CK6001 abstract |
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| Abstract: MIL-STD-750:1051 2585 25 3min -5min30min- 5min Mechanical Test Resistance to Soldering Heat JIS7021 JIS7021:A1 MIL-STD-202 MIL-STD-202:210A MIL-STD-750:2031 Lead Integrity MIL-STD-750D Method 2036.3 260±5 , Method Test Item JIS7021 JIS7021:B4 MIL-STD-202 MIL-STD-202:107D MIL-STD-750:1026 High Temperature Storage Life Test Operating Life Test JIS7021 JIS7021:B10 MIL-STD-202 MIL-STD-202:210A MIL-STD-750:2031 Environment , MIL-STD-202 MIL-STD-202:103D 5 RH=85± 5RH Thermal Shock Test JIS7021 JIS7021:B4 MIL-STD-202 MIL-STD-202:107D MIL-STD-750:1026 ... | Original |
5 pages, |
s3528 JIS7021 b4 smd diode 107d std 107d 1026 MIL-STD-750 diode 107d 107d smd BT-S3528 BT-S3528 abstract |
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| Abstract: MIL-STD-750) Method 1032 48 hrs @ +175°C 2) Temperature Cycling MIL-STD-750 Method 1051 , Condition A MIL-STD-750 5) Final Electrical MIL-STD-750 96 hrs min. @ TA=150°C and min. , Temperature Life (non-operating life/ stabilization bake MIL-STD-750) Method 1032 24 hrs @ 125°C 2 , Leakage Current Method 1038 Condition A 24 hrs @ +125°C at 80% of VRWM MIL-STD-750 5) Final Electrical MIL-STD-750 Method 4011 Method 4016 Method 4021 Forward Voltage Drop Leakage Current ... | Original |
7 pages, |
MIL-STD-750 ingot datasheet abstract |
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| Abstract: Reference Standard MIL-STD-750:1026 MIL-STD-883 MIL-STD-883:1005 JIS C 7021 :B-1 Operation Life Endurance Test , MIL-STD-750:1051 MIL-STD-883 MIL-STD-883:1010 JIS C 7021 :A-4 MIL-STD-202 MIL-STD-202:107D MIL-STD-750:1051 MIL-STD-883 MIL-STD-883:1011 MIL-STD-202 MIL-STD-202:201A MIL-STD-750:2031 JIS C 7021 :A-1 MIL-STD-202 MIL-STD-202:208D MIL-STD-750:2026 MIL-STD-883 MIL-STD-883:2003 JIS C 7021 :A-2 MIL-STD-750:2036 JIS C 7021 :A-11 Temperature Cycling Thermal Shock ... | Original |
4 pages, |
BAS-BK43J7M-6V-A 107D NUMBERBAS-BK43J7M-6V-A NUMBERBAS-BK43J7M-6V-A abstract |
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| Abstract: (Surface Mount DO-214 DO-214 Package) Tin/lead finish Epoxy, meets UL94 V-0 requirements per MIL-STD-750, Method 2026 per MIL-STD-750, Method 2031 per MIL-STD-750, Method 1022 per MIL-STD-750, Method 2016 ... | Original |
2 pages, |
TVB170SC thyristor 308 MIL-STD-750 THYRISTOR 308 f MIL-STD-750 METHOD 2026 datasheet abstract |
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| Abstract: Appendix D: Screening Guides HRP 105: Finished Multiplier Assemblies The following screening for multiplier assemblies is a guide for a suggested procedure. It can be modified or adjusted to suit requirements for a hi-rel multiplier application. 1) Pre-pot Visual MIL-STD-750 Method 2071 2) High Temp Life MIL-STD-750 Method 1032 48 hours @ TA =125°C 3) Temperature Cycling MIL-STD-202 MIL-STD-202 Method 107 10 Cycles -55°C to +105°C 15 minutes at extremes 4) Pre-Electrical ... | Original |
1 pages, |
MIL-STD-750 datasheet abstract |
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| Abstract: 7.2.2 12 METHODS PER MIL-STD-750 UNLESS OTHERWISE SPECIFIED SUMMARY OF TEST RESULTS GROUP B , 12 0 0 12 0 0 METHODS PER MIL-STD-750 UNLESS OTHERWISE SPECIFIED SUMMARY OF , Ton = Toff IF/Io = 2.0 Amps COMMENTS: Upr5ge~2 METHODS PER MIL-STD-750 UNLESS OTHERWISE , : Upr5ge~2 0 METHODS PER MIL-STD-750 UNLESS OTHERWISE SPECIFIED SUMMARY OF TEST RESULTS GROUP B , Autoclave TA = 121C/15psi t=96 hrs COMMENTS: Upr5ge~2 7.2.8 METHODS PER MIL-STD-750 UNLESS ... | Original |
10 pages, |
100C MIL-STD-750 datasheet abstract |
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| Abstract: Continental Device India Limited An ISO/TS 16949, ISO 9001 and ISO 14001 Certified Company Table I : Types and Details of Reliability Tests Sl. Test Test Condition Reference Method Sample LTPD Size Acc No. No 1. High Temperature Storage Ta = Tj (max.) Time: 1000 hrs Unbiased MIL STD 750 1031 55 7 1 2. High Temperature Reverse Bias (HTRB) Ta = Tj (max.) Time = 1000 hrs VCB = 0.8 Ã- VCBO 55 7 1 3. Wet High Temperature Re ... | Original |
1 pages, |
MIL STD 750 MIL-STD-750 METHOD 2026 datasheet abstract |
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| Powerex Hi-Rel Testing Capability Appl & Tech Info Terms of Use Representatives Distributors About Powerex Home\Products Hi-Rel Testing Capability The testing methods at Powerex are not only rigorous but also application specific. In its testing processes, Powerex simulates the environmental factors the device is expos www.datasheetarchive.com/files/powerex/pages/product/hi-rel-testing.html |
Powerex | 03/07/2003 | 4.98 Kb | HTML | hi-rel-testing.html |
| TID Report 10-120 100815 R1.1 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Total Ionizing Dose (TID) Radiation Testing of the RH117H-Positive Adjustable Regulator for Linear Technology Customer: Linear Technology (PO# 55339L 55339L 55339L 55339L) RAD Job Number: 10-120 Part Type Tested: Linear Technology RH117H RH117H RH117H RH117H Positive Adjustable Regulator Commercial Part Number: RH117H RH117H RH117H RH117H Traceability Information: Lot Da www.datasheetarchive.com/download/62339043-347076ZC/eldrs report_rh117h_fabrication lot# w10737632 1.zip (RLAT Report_RH117H_Fabrication Lot# W10737632 1.pdf) |
Linear | 09/09/2010 | 667.74 Kb | ZIP | eldrs report_rh117h_fabrication lot# w10737632 1.zip |
| TID Test Report 09-288 100711 R1.0 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Total Ionizing Dose (TID) Radiation Testing of the RH1016MW RH1016MW RH1016MW RH1016MW UltraFast Precision Comparator for Linear Technology Customer: Linear Technology (PO 53101L 53101L 53101L 53101L) RAD Job Number: 09-288 Part Type Tested: Linear Technology RH1016MW-ES RH1016MW-ES RH1016MW-ES RH1016MW-ES UltraFast Precision Comparator Commercial Part Number: RH1016MW RH1016MW RH1016MW RH1016MW Traceability Infor www.datasheetarchive.com/download/92495459-347089ZC/rlat report_rh1016mw.zip (RLAT Report_RH1016MW_Fabrication Lot# WD003520.1.pdf) |
Linear | 18/08/2010 | 706.29 Kb | ZIP | rlat report_rh1016mw.zip |
| ELDRS Test Report 09-289 100129 R1.1 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1034MW RH1034MW RH1034MW RH1034MW Micropower Dual Reference for Linear Technology Customer: Linear Technology, PO# 53101L 53101L 53101L 53101L RAD Job Number: 09-289 Part Type Tested: Linear Technology RH1034-1 RH1034-1 RH1034-1 RH1034-1.2 Micropower Dual Reference Traceability Information: Fab lot# WD00326 WD00326 WD00326 WD00326 www.datasheetarchive.com/download/73894363-347079ZC/rh1034 radiation test data.zip (ELDRS Report_RH1034-1.2_Fabrication Lot WD003263.1.pdf) |
Linear | 10/02/2010 | 418.78 Kb | ZIP | rh1034 radiation test data.zip |
| Total Ionizing Dose Report 09-290 100129 R1.1 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Total Ionizing Dose (TID) Testing of the RH1034MW RH1034MW RH1034MW RH1034MW Micropower Dual Reference for Linear Technology Customer: Linear Technology, PO# 53101L 53101L 53101L 53101L RAD Job Number: 09-290 Part Type Tested: Linear Technology RH1034-1 RH1034-1 RH1034-1 RH1034-1.2 Micropower Dual Reference Traceability Information: Fab lot# WD003263 WD003263 WD003263 WD003263.1, Wafer# 2, Ass www.datasheetarchive.com/download/73894363-347079ZC/rh1034 radiation test data.zip (RLAT Report_RH1034-1.2_Fabrication Lot WD003263.1.pdf) |
Linear | 10/02/2010 | 418.78 Kb | ZIP | rh1034 radiation test data.zip |
| ELDRS Report 10-121 100815 R1.1 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH117H-Positive Adjustable Regulator for Linear Technology Customer: Linear Technology (PO# 55339L 55339L 55339L 55339L) RAD Job Number: 10-121 Part Type Tested: Linear Technology RH117H RH117H RH117H RH117H Positive Adjustable Regulator Commercial Part Number: RH117H RH117H RH117H RH117H Traceability I www.datasheetarchive.com/download/62339043-347076ZC/eldrs report_rh117h_fabrication lot# w10737632 1.zip (ELDRS Report_RH117H_Fabrication Lot# W10737632 1.pdf) |
Linear | 09/09/2010 | 667.74 Kb | ZIP | eldrs report_rh117h_fabrication lot# w10737632 1.zip |
| ELDRS Report 09-443 100126 R1.1 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1011W RH1011W RH1011W RH1011W Voltage Comparator for Linear Technology Customer: Linear Technology (PO# 54022L 54022L 54022L 54022L) RAD Job Number: 09-443 Part Type Tested: Linear Technology RH1011W RH1011W RH1011W RH1011W Voltage Comparator Commercial Part Number: RH1011W RH1011W RH1011W RH1011W Traceability Information: Assemb www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (ELDRS Report_RH1011W_Fabrication Run 10220414.1.pdf) |
Linear | 04/02/2010 | 1203.5 Kb | ZIP | rh1011_radiation_test_data.zip |
| RLAT Report 09-444 091113 R1.1 An ISO 9001:2008 and DSCC Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Total Ionizing Dose (TID) Radiation Testing of the RH1011W RH1011W RH1011W RH1011W Voltage Comparator for Linear Technology Customer: Linear Technology (PO 54022L 54022L 54022L 54022L) RAD Job Number: 09-444 Part Type Tested: Linear Technology RH1011W RH1011W RH1011W RH1011W Voltage Comparator Commercial Part Number: RH1011W RH1011W RH1011W RH1011W Traceability Information: : Assembly Lot# 524463.1, www.datasheetarchive.com/download/32780785-347077ZC/rh1011_radiation_test_data.zip (RLAT Report_RH1011W_Fabriacation Run 10220414.1.pdf) |
Linear | 04/02/2010 | 1203.5 Kb | ZIP | rh1011_radiation_test_data.zip |
| ELDRS Report 08-125 090825 R1.1 An ISO 9001:2000 Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver for Linear Technology Customer: Linear Technology (PO# 49796L 49796L 49796L 49796L) RAD Job Number: 08-125 Part Type Tested: Linear Technology RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver Commercial Part Number: RH1573K RH1573K RH1573K RH1573K DICE. RH1573 RH1573 RH1573 RH1573 www.datasheetarchive.com/download/92811048-347086ZC/rh1573mj8_radiation_test_data.zip (RH1573MJ8 ELDRS Report 08-125 1p1.pdf) |
Linear | 10/09/2009 | 631.57 Kb | ZIP | rh1573mj8_radiation_test_data.zip |
| RLAT Report 08-126 090825 R1.1 An ISO 9001:2000 Certified Company 1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver for Linear Technology Customer: Linear Technology (PO 49796L 49796L 49796L 49796L) RAD Job Number: 08-126 Part Type Tested: Linear Technology RH1573MJ8 RH1573MJ8 RH1573MJ8 RH1573MJ8 Low Dropout PNP Regulator Driver Commercial Part Number: RH1573K RH1573K RH1573K RH1573K DICE. RH1573K RH1573K RH1573K RH1573K DICE is assembled in www.datasheetarchive.com/download/92811048-347086ZC/rh1573mj8_radiation_test_data.zip (RH1573MJ8 RLAT Report 08-126 1p1.pdf) |
Linear | 10/09/2009 | 631.57 Kb | ZIP | rh1573mj8_radiation_test_data.zip |