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X9409WS24IZ-2.7T1 Intersil Corporation QUAD 10K DIGITAL POTENTIOMETER, 2-WIRE SERIAL CONTROL INTERFACE, 64 POSITIONS, PDSO24, 300 MIL, ROHS COMPLIANT, PLASTIC, MS-013AD, SOIC-24 visit Intersil
X9409WS24IZ-2.7 Intersil Corporation QUAD 10K DIGITAL POTENTIOMETER, 2-WIRE SERIAL CONTROL INTERFACE, 64 POSITIONS, PDSO24, 300 MIL, ROHS COMPLIANT, PLASTIC, MS-013AD, SOIC-24 visit Intersil
X9409WS24I-2.7T1 Intersil Corporation QUAD 10K DIGITAL POTENTIOMETER, 2-WIRE SERIAL CONTROL INTERFACE, 64 POSITIONS, PDSO24, 300 MIL, PLASTIC, MS-013AD, SOIC-24 visit Intersil
X9409WS24I-2.7 Intersil Corporation QUAD 10K DIGITAL POTENTIOMETER, 2-WIRE SERIAL CONTROL INTERFACE, 64 POSITIONS, PDSO24, 300 MIL, PLASTIC, MS-013AD, SOIC-24 visit Intersil
CC2500_REFDES_062 Texas Instruments CC2500 reference design (62 mil layer spacing) visit Texas Instruments
5962-9760601Q9A Texas Instruments MILITARY DIGITAL SIGNAL PROCESSORS 0-XCEPT -55 to 125 visit Texas Instruments

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Part : MIL-S-19500/435 Supplier : - Manufacturer : Chip One Exchange Stock : 3 Best Price : - Price Each : -
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MIL-S-19500/558

Catalog Datasheet MFG & Type PDF Document Tags

2N2907A

Abstract: 2N6987 measureable as an outgoing test. TX and TXV screening, if requested, will be performed similar to MIL-S-19500/558 per 2N6987 conditions. Order HCT790TX or HCT790TXV. IB 14 OptekTechnology, Inc. 1215 W.Crosby , PNP transistor die. The HCT790 electrical characteristics are similar to the MIL-S-19500/291
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OCR Scan
2N2907A equivalent for 2N2907A PNp Transistor MIL-S-19500TX MIL-S-19500/291
Abstract: HCT790 electrical characteristics are similar to the MIL-S-19500/291 specification for the 2N2907A. TX and TXV screening, if requested, will be performed similar to MIL-S-19500/558 per 2N6987 conditions , MIL-S-19500 TX or TXV equivalent levels on request Description The HCT790 is a 20 pad, hermetically -
OCR Scan
MIL-S-19500/558 100MH

2N2907A surface mount

Abstract: 2N2907A electrical characteristics are similar to the MIL-S-19500/291 specification for the 2N2907A. TX and TXV screening, if requested, will be performed similar to MIL-S-19500/558 per2N6987 conditions. Order HCT790TX , '¢ Electrical performance similar to a 2N2907A â'¢ Hermetically sealed package â'¢ Screened per MIL-S-19500 TX
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OCR Scan
2N2907A surface mount
Abstract: Voltage NCC Available in Three Hermetic Packages 38, BC * â¡e, Qualified to MIL-S-19500/558 pending 8 7 TO-86 M19500/558-02 C, 14 B< E -
OCR Scan
CHQ2907 2N2907 M19500/558-01 20-LCC 02140U

crystal diode

Abstract: 1N31 MIL-S-19500/236A 20 October 1970 SUPERSEDING MIL-S-19500/236 AA A _* 1 4AAA 23 Apm iao2 , MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. STANDARD MILITARY MEL-STD-750 - , MIN MAX MIN MAX A .215 99.0 R 4 fi 5.58 B .734 .766 18.64 19.45 C .147 3.73 D .011 .028 .28 .71 , . TrmtTRTT 1 Com i r»nnr>r< riaiHio sMnrio hrrio 1M31 ""â'"I "j Iâ'" â'"- 2 MIL-S-19500/236A 3. REQUIREMENTS 3.1 General. Requirements shall be in accordance with MIL-S-19500 and as specified herein. 3.2
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OCR Scan
crystal diode 1N31 LTPJ MIL-S-19500/236A MIL-S-19500/236 118-JAN MIL-S-195 0/236A
Abstract: PART NUMBER JANSR2N7294 PACKAGE TO-254AA Symbol Die family TA17652. MIL-PRF-19500/605. Package TO-254AA CAUTION: Beryllia Warning per M ll-S -19500 refer to package specifications. CAUTION , 2V V Do = 100 V, lD = 23A MAX 5.0 4.0 25 250 100 200 2.78 0.115 0.253 156 510 574 280 558 298 20 66 , Screening is performed in accordance with the latest revision in effect of MiL-S-19500, (Screening , , t = 250ns Required MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25°C) MIL-STD-750, Method -
OCR Scan
FRF250R4 1000K

1N53B

Abstract: SCL-5679 substitute for MIL-S-19500/186 which has been inactivated for new design. Prepared in accordance with , a K-band receiver. This drawing supersedes MIL-S-19500/186. 1.2 Part or Identifying Number (PIN). , . DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-19500 - Semiconductor Devices, General Specification for , Interface and physical dimensions. Interface and physical dimensions shall be as specified in MIL-PRF-19500 , shall be as specified in MIL-PRF-19500 and as follows: LC NFo NRo Z(IF) - Conversion loss
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Original
ASME-14 1N53B 1N53BR 1N53BM 1N53BMR SCL-5679 1N53B DIODE OH MARKING diode MIL-S-19500/186 037Z3
Abstract: : Beryllia Warning per MIL-S-19500 Description The Harris Semiconductor Sector has designed a series of , either non TX (commercial), TX equivalent of MIL-S-19500, TXV equivalent of MIL-S-19500, or space equivalent of MIL-S-19500. Contact the Harris Semiconductor High-Reliability Marketing group for any desired , 0.115 156 510 574 280 20 296 558 14 66 144 1.8 1700 1.0 °C/W Junction-To-Ambient 48 V ns V nc UNITS V V -
OCR Scan
FRF250D FRF250R 100KRAD 300KRAD 1000KRAD 3000KRAD

1N6528

Abstract: M25UFG T-os-n I INCH-POUND I MIL-S-19500/577 5 April 1989 MILITARY SPECIFICATION SEMICONDUCTOR , assurance are provided for each device type as specified in MIL-S-19500. 1.2 Physical dimensions. See , > PAGES. 00001Z5 D03S37T IDT â  [ MIL-S-19500/ 577 1.4 Primary electrical characteristics. 1 Types , (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION MILITARY MIL-S-19500 , specification. The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein
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1N6528 1N6535 RM117 M25UFG 1N6531 RA641 RA644 11n65 MIL-S-19500/577 I1N6528 I1N6529 11N6530
Abstract: . Reliability screening is available as either non TX (commercial), TX equivalent of MIL-S-19500, TXV equivalent of MIL-S-19500, or space equivalent of MIL-S19500. Contact the Harris Semiconductor High-Reliability , 5 75 140 3 16 36 0.6 574 280 20 298 558 14 66 nc 144 1.8 1700 1.0 48 V ns V nc UNITS V V nA nA mA -
OCR Scan
2N7294D 2N7294R 2N7294H FRF250 10KRAD AN-8831
Abstract: per MIL-S-19500 Description refer to package specifications. The Harris Semiconductor Sector , shown above. Reliability screening is available as either non TX (commercial), TX equivalent of MIL-S-19500, TXV equivalent of MIL-S-19500, or space equivalent of MIL-S-19500. Contact the Harris Semiconductor , Gate-Charge Threshold QG(th) 5 20 Gate-Charge On State QG(on) 75 298 140 558 3 , : Inch. 7. Revision 1 dated 1-93. WARNING! BERYLLIA WARNING PER MIL-S-19500 Packages containing -
OCR Scan
FRF250H 115S1

MIL-S-19500-507

Abstract: 1N6067 dissipation · Available in ranges from 5.5 to 185 volts · MIL qualified per MIL-S-19500/507 · Hermetically , equi valent RMS voltage characteristic. Also available as JAN, JANTX, and JANTXV devices per MIL-S-19500 , 24.3 25.7 27.0 28.5 29.7 31.4 32.4 34.2 35.1 37.1 38.7 40.9 42.3 44.7 45.9 48.5 50.4 53.2 55.8 58.9
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OCR Scan
1N6066A 1N6067 MIL-S-19500-507 1N605S 1N6055A 1N6036 1N603G MIL-S-19500/507 I1N6070A 1N6072A N6057 1N6057A

IN3800

Abstract: 1N3909 5.58 6.32 1 J .250 .375 6.35 9.53 K .156 - 3.96 - M - .667 - 16.94 Dia. N .030 .080 .760 , '¢ Available in JAN. JANTX. JANTXV â'¢ Mil-S-19500/308 â'¢ 150°C Junction Temperature â'¢ 30 Amp current
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OCR Scan
1N3913 IN3800 1N3910 1N3911 1N3912 1N3909 D0203AB

JV1N6119

Abstract: IN sO T Ü ft\- POWER SEMICONDUCTOR DIVISION JAN AND JANTX 1N6113 THRU 1N6130 BI-DIRECTIONAL TRANSIENT VOLTAGE SUPPRESSORS VOLTAGE - 20 to 100 POWER - 500 Watts Peak FEATURES Qualified to MIL-S-19500/516A High temperature metallurgical^ bonded-glass passivated cavity-free junction ^ Voidless hermetically sealed glass package Low zener impedance Fast response time: typically less than 1 .Ops from 0 , 50.4 55.8 61.2 67.5 73.8 81.9 90.0 NOTES: 1. Breakdown Voltage Tolerance with no Suffix is +
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OCR Scan
JV1N6119 MIL-S-19500/516A MIL-STD202 JV1N6113 JV1N6114 JV1N6115 JV1N6116

SMD TRANSISTOR br-37

Abstract: 1E14 . Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil Corporation for any desired deviations from the data sheet , Screening Information Screening is performed in accordance with the latest revision in effect of MIL-S-19500 , VGS = -30V, t = 250µs Pind Optional Required Pre Burn-In Tests (Note 9) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at
Fairchild Semiconductor
Original
FSYE923A0D FSYE923A0R SMD TRANSISTOR br-37 1E14 2E12 FSYE923A0D1 FSYE923A0D3

2E12

Abstract: 3E12 available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact , Information Screening is performed in accordance with the latest revision in effect of MIL-S-19500 , VGS = 30V, t = 250µs Pind Optional Required Pre Burn-In Tests (Note 9) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at , ) MIL-S-19500, Group A, Subgroup 2 MIL-S-19500, Group A, Subgroups 2 and 3 NOTE: 9. Test limits
Intersil
Original
FSYE430D FSYE430R 3E12 FSYE430D1 FSYE430D3 FSYE430R1 ISO9000

2E12

Abstract: FSYE913A0D . Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil Corporation for any desired deviations from the data sheet , with the latest revision in effect of MIL-S-19500, (Screening Information Table). Delta Tests and , Pre Burn-In Tests (Note 9) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) MIL-S-19500 , Electrical Tests (Note 9) MIL-S-19500, Group A, Subgroup 2 MIL-S-19500, Group A, Subgroups 2 and 3
Fairchild Semiconductor
Original
FSYE913A0D FSYE913A0R FSYE913A0D1 FSYE913A0D3 FSYE913A0R1

2E12

Abstract: FSYE13A0D . Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet. Ordering , MIL-S-19500, (Screening Information Table). Delta Tests and Limits (JANTXV Equivalent, JANS , ) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) MIL-S-19500 Group A, Subgroup 2 (All , ) MIL-S-19500, Group A, Subgroup 2 MIL-S-19500, Group A, Subgroups 2 and 3 NOTE: 9. Test limits
Intersil
Original
FSYE13A0D FSYE13A0R FSYE13A0D1 FSYE13A0D3 FSYE13A0R1 FSYE13A0R3

2E12

Abstract: FSYE13A0D . Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet. Ordering , accordance with the latest revision in effect of MIL-S-19500, (Screening Information Table). Delta Tests , Pre Burn-In Tests (Note 9) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) MIL-S-19500 , Electrical Tests (Note 9) MIL-S-19500, Group A, Subgroup 2 MIL-S-19500, Group A, Subgroups 2 and 3
Fairchild Semiconductor
Original

1E14

Abstract: 2E12 . Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet. SCREENING LEVEL , in effect of MIL-S-19500, (Screening Information Table). Delta Tests and Limits (JANTXV Equivalent , (Note 9) MIL-S-19500 Group A, Subgroup 2 (All Static Tests at 25oC) MIL-S-19500 Group A , Tests (Note 9) MIL-S-19500, Group A, Subgroup 2 MIL-S-19500, Group A, Subgroups 2 and 3 NOTE
Fairchild Semiconductor
Original
FSYE23A0D FSYE23A0R FSYE23A0D1 FSYE23A0D3 FSYE23A0R1 FSYE23A0R3
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