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LT1017MJ8/883 Linear Technology LT1017 - Micropower Dual Comparator; Package: CERDIP; Pins: 8; Temperature: Military visit Linear Technology - Now Part of Analog Devices
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MIL-HDBK-217

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: uses the MIL-HDBK-217F Notice 2 prediction model, and Windchill Prediction (formerly Relex) software , purpose of MIL-HDBK-217 to provide a common basis for reliability prediction, MS Kennedy does not modify , the MIL-HDBK-217 method, where base failure rates are imported from the software, and are not , rates were calculated based on the following formula from MIL-HDBK-217: λP = [ΣNCλC](1 + .2Ï'E) Ï'F Ï'Q Ï'L Failures/106 hrs Given from MIL-HDBK-217: NC = Number of each particular component λC MS Kennedy
Original
AN001 MIL-STD-756B

785e

Abstract: HCPL-7851 the system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , factors that have been accounted for in MIL-HDBK217. For example, it is unlikely that your application , comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , section of MIL-HDBK-217. Environmental Testing All high reliability hermetic optocouplers listed meet
Avago Technologies
Original
HCPL-7851 785e ACPL-785E 5962-9755701EP 5962-9755701HP MIL-PRF-38534 MIL-STD-883

MIL-HDBK-217

Abstract: 500VDC - =500VDC - =500VDC -10+60 -0+85 MTBF MIL-HDBK-217(25 , MIL-HDBK-217(25) *: 55 0.35W/ mm 1 +Vin 2 -Vin 3 +Vout , -40+105 0 MTBF MIL-HDBK-217(25) 8*105h Guoyao Technologies
Guoyao Technologies
Original
260KH 300KH

Hybrid Microcircuits 1976

Abstract: lm741 die ) MIL-HDBK-217B Notice 2 17 Mar. (1978). 11) MIL-HDBK-217C "Reliability Prediction of Electronic Equipment," Apr. 9, (1979). 12) MIL-HDBK-217C Notice 1, May 1. (1980). 13) MIL-HDBK-217D Notice 1, 13 June (1983). 14) MIL-HDBK-217E Oct. 27. (1986). 15) MIL-HDBK-217F Dec. 2. (1991). 16) MIL-HDBK-217F Notice 1 , .146 2.1 MIL-HDBK-217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL.147 2.2 MIL-HDBK-217 MICROCIRCUIT PREDICTION MODEL. 147 3. MIL-HDBK-217F
Mitsubishi
Original
MIL-HDBK-217A Hybrid Microcircuits 1976 lm741 die LM741A GaAs wafer LM106 R76-48 R75-7 R75-21 R76-22

MIL-HDBK-217

Abstract: system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component reliability , that have been accounted for in MIL-HDBK-217. For example it is unlikely that your application will , Table 2 to predictions using MIL-HDBK-217. Definition of Failure Inability to switch, i.e. "functional , as in the hybrid section of MIL-HDBK-217. Application Information The data of Table 1 and 2 were
Avago Technologies
Original
HCPL-7601/7611 5989-3533EN

HCPL 454

Abstract: MIL-HDBK-217 using MIL-HDBK-217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MIL-HDBK-217 , and duty cycle must be carefully considered when comparing Table 2 to predictions using MIL-HDBK-217 , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. Application Information
Avago Technologies
Original
HCPL 454 HCPL-4200 5988-7900EN

JESD-B-102

Abstract: AVAGO DIP relationship, where a 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. OTHER , necessary to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK-217 , to different conditions and factors that have been accounted for in MIL-HDBK-217. For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Application Information
Avago Technologies
Original
JA113 JESD-A102 JESD-B-102 AVAGO DIP ACPL-M71U ACPL-M72U JESD-A104 20-2000H JESD-B100 JESD-B102

JA113

Abstract: JESD-A103 section of MIL-HDBK-217. OTHER MANUFACTURERS' SIMILAR PART TYPES. Operating Life Test For valid , operation. Note that if you are using MIL-HDBK-217 for predicting component reliability, the results may not , accounted for in MIL-HDBK-217. For example it is unlikely that your application will exercise all available , using MIL-HDBK-217. Application Information The data of Table 1 and 2 were obtained on devices with
Avago Technologies
Original
JESD-A103 JESDA103 optocoupler MTTF avago MSL 1 ACPL-K49T J-STD-020 JESD-A110 AV02-3187EN

6N137

Abstract: MTTF test data system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , factors that have been accounted for in MIL-HDBK217. For example, it is unlikely that your application , when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , hybrid section of MIL-HDBK-217. Table 2. Reliability Projections (per channel) for Devices Listed
Avago Technologies
Original
6N137 MTTF test data HCPL-2601/2611 HCPL-2630/2631/4661 5988-2651EN AV01-0495EN

hcpl 731

Abstract: HCPL 601 using MIL-HDBK-217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MIL-HDBK-217 , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated , energy is used as in the hybrid section of MIL-HDBK-217. Table 2. Reliability Projections (per
Avago Technologies
Original
HCPL-2300 hcpl 731 HCPL 601 Optocoupler 601 MIL-STD-217 FIT optocoupler avago OPTOCOUPLER 436 5989-1824EN AV01-0487EN

2430 avago

Abstract: HCPL-2400 system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , factors that have been accounted for in MIL-HDBK217. For example, it is unlikely that your application , when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , section of MIL-HDBK-217. Application Information The data of Tables 1 and 2 were obtained on devices
Avago Technologies
Original
HCPL-2400 HCPL-2430 2430 avago 5988-4129EN AV01-0497EN

hcpl 731

Abstract: HCPL 601 that if you are using MIL-HDBK-217 for predicting component reliability, the results may not be , in MIL-HDBK217. For example it is unlikely that your application will exercise all available , and duty cycle must be carefully considered when comparing Table 2 to predictions using MIL-HDBK217 , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. The data of Table 1
Agilent Technologies
Original
Optocoupler 721 optocoupler 601 217

MIL-STD-217 FIT

Abstract: necessary to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK-217 , to different conditions and factors that have been accounted for in MIL-HDBK-217. For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Definition of Failure , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. Table 2. Reliability
Avago Technologies
Original
HCPL-3140 AV01-0659EN

optocoupler MTTF

Abstract: HCPL-7851 the system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , factors that have been accounted for in MIL-HDBK217. For example, it is unlikely that your application , comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , relationship, where a 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217
Avago Technologies
Original
5962-9755701HPX avago, hcpl 817 AV02-0316EN

MIL-STD-217 FIT

Abstract: AVAGO DIP to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK-217 , to different conditions and factors that have been accounted for in MIL-HDBK-217. For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Stress Test Condition Ta = , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. Table 3. Mechanical Tests
Avago Technologies
Original
0133E HCNW138 HCNW139 1500G AV01-0133EN

signetics linear package marking

Abstract: MIL-STD-480 quality Levels Sand B of MIL-HDBK-217 (jcq - 0.25 for Class S, 1.0 for Class B). · 100% final electrical , conforms to quality level B-1 of MIL-HDBK-217 (JC q = 2.0). Standard M ilitary Drawing (SMD) DESC , standard product part num ber. This category of product conforms to Quality Level B-1 of MIL-HDBK-217 (no = , by MIL-STD-454, Requirement 64 and by MIL-HDBK-217, and are recommended for use in the most critical , product conforms to quality level D of MIL-HDBK-217 (7 Iq = 10.0). work-in-process by customer). For
-
OCR Scan
signetics linear package marking MIL-STD-480 signetics military marking MIL-M-38510

quality assurance for semiconductor devices

Abstract: MIL-HDBK-217 SEMICONDUCTOR DEVICES 1. INTRODUCTION 2. METHODS OF RELIABILITY PREDICTION 2.1 MIL-HDBK-217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL 2.2 MIL-HDBK-217 MICROCIRCUIT PREDICTION MODEL 3. MIL-HDBK-217F RELIABILITY PREDICTION 3.1 HYBRID MICROCIRCUIT FAILURE RATE PREDICTION 5) 3.2 NOTES ON USING MIL-HDBK-217
Mitsubishi
Original
quality assurance for semiconductor devices mitsubishi packaging Semiconductor Devices

GYD01-12RD12

Abstract: 500VDC =500VDC - =500VDC 70KHz -10 +60 -30+85 MTBF 6W MIL-HDBK-217(25 , %) =25mS =20KHz MTBF -10+60 -30+85 MIL-HDBK-217(25) 8×100000h
Guoyao Technologies
Original
GYD01-05RS03 GYD01-05RS05 GYD01-05RS08 GYD01-05RS12 GYD01-05RD05 GYD01-01RD08 GYD01-12RD12 12RD08 GYD01-05RD12

calculating rectifier circuits MTBF

Abstract: bimetal MIL-HDBK-217F Notice 2 and using MILHDBK-217E. In addition, calculations are presented including , MTBF values calculated using MIL-HDBK-217E and MILHDBK-217F Notice 2 shows a dramatic decrease in the , .4 Changes to the model incorporated in Revision F of MIL-HDBK-217 for estimation of hybrid failure rates , results that do not agree with those based on models presented in Revision E of MIL-HDBK-217. To , MIL-HDBK217F Notice 2 and using MILHDBK- 217E. In addition, calculations are presented including application
International Rectifier
Original
AN-1078 ART2815T calculating rectifier circuits MTBF bimetal transformer mtbf CAPACITOR chip mtbf 217F

PWR700A

Abstract: PWR700A/H predicted MTTF of 1,371,486 hours (per MIL-HDBK-217 Rev. E, circuit-stress analysis method, +25°C, ground , predicted MTTF calcula tions per MIL-HDBK-217 Rev. E, circuit-stress analysis method. Some manufacturers
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OCR Scan
PWR700A PWR700A/T PWR700A/H MIL-I-45208A

potenciometro de precision

Abstract: clemas the system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , factors that have been accounted for in MIL-HDBK217. For example, it is unlikely that your application , comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , section of MIL-HDBK-217. Environmental Testing All high reliability hermetic optocouplers listed meet
-
Original
potenciometro de precision clemas 24/F5 HDBK217

ECC89

Abstract: alimentation decoupage 230- 5 system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , factors that have been accounted for in MIL-HDBK217. For example, it is unlikely that your application , when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , hybrid section of MIL-HDBK-217. Table 2. Reliability Projections (per channel) for Devices Listed
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Original
ECC89 alimentation decoupage 230- 5 alimentation decoupage protection alimentation decoupage alimentatore caracteristicas led EN61558 EN55022/B EN61000-4
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