MHTS001D 4073225/F MO-153 - Datasheet Archive

 

MHTS001D ­ JANUARY 1995 ­ REVISED MAY 1999 PWP (R-PDSO-G*) PowerPADTM PLASTIC SMALL-OUTLINE 20 PINS SHOWN 0,30 0,19 0,65

 

MECHANICAL DATA MHTS001D MHTS001D ­ JANUARY 1995 ­ REVISED MAY 1999 PWP (R-PDSO-G*) PowerPADTM PLASTIC SMALL-OUTLINE 20 PINS SHOWN 0,30 0,19 0,65 20 0,10 M 11 Thermal Pad (See Note D) 4,50 4,30 0,15 NOM 6,60 6,20 Gage Plane 1 10 0,25 A 0°­8° 0,75 0,50 Seating Plane 0,15 0,05 1,20 MAX PINS * 0,10 14 16 20 24 28 A MAX 5,10 5,10 6,60 7,90 9,80 A MIN 4,90 4,90 6,40 7,70 9,60 DIM 4073225/F 4073225/F 10/98 NOTES: A. B. C. D. All linear dimensions are in millimeters. This drawing is subject to change without notice. Body dimensions do not include mold flash or protrusions. The package thermal performance may be enhanced by bonding the thermal pad to an external thermal plane. This pad is electrically and thermally connected to the backside of the die and possibly selected leads. E. Falls within JEDEC MO-153 MO-153 PowerPAD is a trademark of Texas Instruments Incorporated. POST OFFICE BOX 655303 · DALLAS, TEXAS 75265 1 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER'S RISK. In order to minimize risks associated with the customer's applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI's publication of information regarding any third party's products or services does not constitute TI's approval, warranty or endorsement thereof. Copyright © 1999, Texas Instruments Incorporated