LURHUYH3363 QW0905-LURHUYH3363 54TYP MIL-STD-750 MIL-STD-883 MIL-STD-202

Property of Ligitek Only BIPOLAR ROUND TYPE LED LAMPS LURHUYH3363 DATA SHEET DOC. NO : QW0905-LURHUYH3363 REV. : A DATE : 21 -

LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only BIPOLAR ROUND TYPE LED LAMPS LURHUYH3363 LURHUYH3363 DATA SHEET DOC. NO : QW0905-LURHUYH3363 QW0905-LURHUYH3363 REV. : A DATE : 21 - Oct. - 2005 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 1/5 PART NO. LURHUYH3363 LURHUYH3363 Package Dimensions 5.0 5.9 7.6 8.6 URH 1.5MAX UYH 0.5 TYP 25.0MIN 1 1 2 ANODE CATHODE 2 2.54TYP 54TYP 1.0MIN Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 0° -30° 30° -60° 100% 75% 50% 60° 25% 0 25% 50% 75% 100% LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LURHUYH3363 LURHUYH3363 Page 2/5 Absolute Maximum Ratings at Ta=25 Ratings Symbol Parameter UNIT URH UYH Forward Current IF 50 50 mA Peak Forward Current Duty 1/10@10KHz IFP 100 100 mA Power Dissipation PD 130 130 mW Ir 10 A Electrostatic Discharge( * ) ESD 2000 V Operating Temperature Topr -40 ~ +85 Storage Temperature Tstg -40 ~ +100 Soldering Temperature Tsol Reverse Current @5V Max 260 for 5 sec Max (2mm from body) Static Electricity or power surge will the Use of anti-electrosatic *glove is recommended when handingdamageLED.LED.devices, a conductive wrist band or must be properly these All equipment and machinery grounded. Typical Electrical & Optical Characteristics (Ta=25 ) PART NO COLOR MATERIAL Emitted AlGaInP/GaP Red Forward Dominant Spectral voltage wave halfwidth length nm @20mA(V) Dnm Luminous intensity @20mA(mcd) Viewing angle 2 1/2 (deg) Min. Max. Min. Typ. Lens Water Clear 630 20 1.7 2.6 350 700 20 AlGaInP/GaP Yellow Water Clear 590 20 1.7 2.6 450 900 20 LURHUYH3363 LURHUYH3363 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 3/5 PART NO. LURHUYH3363 LURHUYH3363 Typical Electro-Optical Characteristics Curve UR(H) CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.5 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1 01 3.0 2.5 2.0 1.5 1.0 0.5 0.0 1.5 1.0 2.0 2.5 3.0 1 10 Fig.3 Forward Voltage vs. Temperature Fig.4 Relative Intensity vs. Temperature Relative Intensity@20mA Normalize @25 Forward Voltage@20mA Normalize @25 1.2 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 100 Relative Intensity@20mA Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0.0 600 650 Wavelength (nm) 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 Ambient Temperature( ) Ambient Temperature( ) 550 1000 Forward Current(mA) Forward Voltage(V) -40 100 700 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 4/5 PART NO. LURHUYH3363 LURHUYH3363 Typical Electro-Optical Characteristics Curve UY(H) CHIP Fig.1 Forward Current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1.0 0.1 2.5 2.0 1.5 1.0 0.5 0.0 1.0 2.0 3.0 4.0 5.0 1.0 10 Fig.3 Forward Voltage vs. Temperature Fig.4 Relative Intensity vs. Temperature 3.0 1.1 1.0 0.9 0.8 -40 -20 0 20 40 60 80 100 Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0.0 550 600 Wavelength (nm) 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 Ambient Temperature( ) Ambient Temperature( ) 500 Relative Intensity@20mA Normalize @25 1.2 Forward Voltage@20mA Normalize @25 1000 Forward Current(mA) Forward Voltage(V) Relative Intensity@20mA 100 650 80 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LURHUYH3363 LURHUYH3363 Page 5/5 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. MIL-STD-750 MIL-STD-750: 1026 MIL-STD-883 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ±5 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. MIL-STD-883 MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ±5 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ±5 2.RH=90 %~95 % 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. 1.Ta=105 ±5&-40 ±5 (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202 MIL-STD-202: 107D MIL-STD-750 MIL-STD-750: 1051 MIL-STD-883 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ±5 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202 MIL-STD-202: 210A MIL-STD-750 MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ±5 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202 MIL-STD-202: 208D MIL-STD-750 MIL-STD-750: 2026 MIL-STD-883 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202 MIL-STD-202:103B JIS C 7021: B-11