500 MILLION PARTS FROM 12000 MANUFACTURERS

DATASHEET SEARCH ENGINE

Search Stock

Shift+Click on the column header for multi-column sorting 
Part
Manufacturer
Supplier
Stock
Best Price
Price Each
Ordering
Part : AES-Z7-JESD3-G Supplier : Avnet Catalog Manufacturer : Avnet Stock : 21 Best Price : - Price Each : -
Part : EF-DI-JESD204-SITE Supplier : Xilinx Manufacturer : Avnet Stock : - Best Price : $7000.00 Price Each : $7000.00
Part : EFR-DI-JESD204-SITE Supplier : Xilinx Manufacturer : Avnet Stock : - Best Price : $1400.00 Price Each : $1400.00
Part : PJESD5V6LC-4T/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0644 Price Each : €0.1289
Part : PJESD5V6LC-4T/R7 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0644 Price Each : €0.1289
Part : PJESD5V6LC-4WT/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD5V6LC-4WT/R7 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD5V6LC-5WT/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD5V6LC-5WT/R7 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD5V6LCQ4G_R1_00001 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : PJESD5V6LCQ5G _R1 _00001 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : PJESD6V2LC-4T/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0644 Price Each : €0.1289
Part : PJESD6V2LC-4T/R7 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0644 Price Each : €0.1289
Part : PJESD6V2LC-4WT/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD6V2LC-4WT/R7 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD6V2LC-5WT/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD6V2LC-5WT/R7 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0583 Price Each : €0.1166
Part : PJESD6V2LCQ4G_R1_00001 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : PJESD6V2LCQ5G_R1_00001 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : - Price Each : -
Part : PJESD6V8LC-4T/R13 Supplier : PanJit International Manufacturer : Avnet Stock : - Best Price : €0.0644 Price Each : €0.1289
Part : AD-FMCJESDADC1-EBZ Supplier : Analog Devices Manufacturer : Newark element14 Stock : - Best Price : $630.00 Price Each : $630.00
Part : PK2N-2DJE-SD Supplier : Prolight Opto Technology Manufacturer : TME Electronic Components Stock : 283 Best Price : $1.37 Price Each : $1.71
Part : PK2N-2JJE-SD Supplier : Prolight Opto Technology Manufacturer : TME Electronic Components Stock : 39 Best Price : $1.01 Price Each : $1.50
Part : PK2N-2LJE-SD Supplier : Prolight Opto Technology Manufacturer : TME Electronic Components Stock : 1,271 Best Price : $0.7888 Price Each : $1.01
Part : PM2B-2LJE-SD Supplier : Prolight Opto Technology Manufacturer : TME Electronic Components Stock : 6 Best Price : $1.08 Price Each : $1.60
Part : AD-FMCJESDADC1-EBZ Supplier : Analog Devices Manufacturer : element14 Asia-Pacific Stock : - Best Price : $953.6160 Price Each : $953.6160
Part : JESD-204A-E3-U Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $1,057.0900 Price Each : $1,057.0900
Part : JESD-204A-E3-UT Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $3,170.0501 Price Each : $3,170.0501
Part : JESD-204B-E3-U1 Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $1,057.0900 Price Each : $1,057.0900
Part : JESD-204B-E3-UT1 Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $3,170.0501 Price Each : $3,170.0501
Part : JESD-204B-E5-U Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $1,057.0900 Price Each : $1,057.0900
Part : JESD-204B-E5-UT Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $3,170.0501 Price Each : $3,170.0501
Part : JESD-204B-E5G-U Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $1,268.5100 Price Each : $1,268.5100
Part : JESD-204B-E5G-UT Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $3,804.0601 Price Each : $3,804.0601
Part : JESD-207-E3-U1 Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $1,057.0900 Price Each : $1,057.0900
Part : JESD-207-E3-UT1 Supplier : Lattice Semiconductor Manufacturer : Symmetry Electronics Stock : - Best Price : $3,170.0501 Price Each : $3,170.0501
Shipping cost not included. Currency conversions are estimated. 

JESD22

Catalog Datasheet MFG & Type PDF Document Tags

JESD22

Abstract: QUALIFICATION RESULTS: Test # Reference AC A3 JESD22 A02 Test # Reference TC A4 JESD22 A104 Test # Reference HTSL A6 JESD22 A103 Test Conditions Autoclave , ) HTOL B1 JESD22 A108 High Temp Operating Life (Test@Room/Hot/ Cold) 408 hrs;@ 105Â , GROUP E QUALIFICATION RESULTS: Test # Reference Test Conditions HBM E1 JESD22 A114 , #18-1185 +500V 1/6 AM AEC Q100 GROUP E QUALIFICATION RESULTS: (cont.) MM E2 JESD22 A115
Micrel Semiconductor
Original
KSZ8842PMBL KSZ8842PMQL 121C/100 GFS0028 1000HRS

Sumitomo 6730B

Abstract: JESD22-A114 TEST (HBM) JESD22 A114 1500 OHM, 100PF +/-2000V +/-15000V 0/3 0/3 Passed Passed (note 1) Latch-up Test JESD22 78- STATIC +/- 200mA or 2X Vcc @ 25C As required 0/6 , ) JESD22 A114 1500 OHM, 100PF +/-2000V +/-15000V 0/3 0/3 Passed Passed (note 1) LATCH-UP TEST JESD22 78- STATIC +/- 200mA or 2X Vcc @ 25C As required 0/6 Passed ESD TEST , Passed TEMPERATURE CYCLING JESD22 A104 500 Cyc 1000 Cyc 0/25 0/25 Passed Passed
Exar
Original
XR5488EID-F Sumitomo 6730B JESD22-A114 transistor A114 JESD22-78 07eV XR5486EID-F SP5486EID-F 6730B-L
Abstract: Conditions HTOL B1 JESD22 A108 High Temp Operating Life (Test@Room/Hot +105C and Cold -40C , HAST A2 JESD22A110 Highly Accelerated Stress Test 130C/ 85% R.H (Test@Room/Hot +105C) Test # Reference Test Conditions AC A3 JESD22 A02 Test # Reference TC A4 JESD22 A104 Test # Reference Autoclave 121C/100% RH (Test@Room) Test , WBP C2 Mil-STD883 Method 2011 Wire Bond Pull SD C3 JESD22 B102 Solderability Micrel Semiconductor
Original
KSZ8864RMN/RMNI/RMNU KSZ8864RMNU AEC-Q100008 AEC-Q100002 AEC-Q100003 AEC-Q100011

MacAdam

Abstract: CLD-AP06 ) JESD22 A108-C : · · · 1 : · 2 · 2 : 45°C : : 1008 : > 200 mV ­ InGaN LEDs ­ AlInGaP LEDs 4 3 · · 6 5 (HTOL) JESD22 A108-C : · · · 1 : · 2 · 2 : 85°C : : 1008 : > 200 mV ­ InGaN LEDs ­ AlInGaP LEDs 4 3 · · 6 5 (WHTOL) JESD22 A101-B , LEDs ­ AlInGaP LEDs 4 3 · · 6 5 (LTOL) JESD22 A108-C : > 15% : > 25% : > 10 µA , ) WHTOL · JEDCE - - MIL-STD-202G 107G JESD22 B104-C B : · ·
Cree
Original
CLD-AP06 MacAdam MacAdam LED MacAdam 5 step 5000K CIE1931
Abstract: NO. HTOL High Temperature Operating Life Test JESD22-A108 TJ = 140 C, Vcc TEST DESCRIPTION METHOD/ CONDITIONS PART NO. JESD22 A114 KSZ8864RMNU ESD-HBM Electrostatic Discharge, Human Body Model KSZ8864RMNU (DONGBU 0.11um) TA = + 25°C ESD-MM JESD-22 , DESCRIPTION METHOD/ CONDITIONS JESD22- A110, 130C/ 85% R.H, w/bias HAST Highly Accelerated Stress , 0/3 TA = +25ï'°C (DONGBU 0.11um) + 150V 0/3 + 200V 0/3 + 500V 0/3 JESD-22 Micrel Semiconductor
Original
KSZ8864CNXCA/CNXIA/RMNU M129V051MNF JESD78 M1010 JESD22A104 JESD22A103

JESD22

Abstract: W3H32M72E-XSBX 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/JESD22 Method A113 EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp. Range 125°C -55°C to
White Electronic Designs
Original
W3H32M72E-XSBX A104 A108 A113 EIA/JESD22 200A00004-45 AN0044

KSZ8895MQXCA

Abstract: 0.11um) M129V0511MNA 0/77 0/77 HTOL High Temperature Operating Life Test JESD22-A108 , / CONDITIONS PART NO. HAST JESD22- A110, KSZ8895MQXCA Highly Accelerated Stress Test 130C , JESD22 A114 KSZ8895MQXCA + 500V 0/3 + 1000V 0/3 + 1500V 0/3 + 2000V 0/3 + , Body Model JESD-22 ESD-MM KSZ8895MQXCA Method A115 Electrostatic Discharge, Machine Model TA = +25ï'°C JESD-22 ESD-CDM Electrostatic Discharge, Charged Device Model Latch-up
Micrel Semiconductor
Original
KSZ8895FQXCA/FQXIA KSZ8895MQXCA/MQXIA KSZ8895RQXCA/RQXIA KSZ8895 KSZ88 M129V0511MNC
Abstract: : Reference Test Conditions B1 JESD22 A108 High Temp Operating Life (ATE Test @Room/Hot +95C , °C HAST # A2 Reference JESD22A110 Test Conditions Highly Accelerated Stress Test 130C , 0 D/C QTY 96 HRS rejects DEVICE LOT ID. # Reference AC A3 JESD22 A02 Test # Reference TC A4 JESD22 A104 FORM #18-1185 REV: J Test Conditions , wires SD C3 JESD22 B102 Solderability KSZ8873MLL AM M111W471MEA 1117 KSZ8873MLL Micrel Semiconductor
Original
KSZ885116MLL/MLLI/MLLU KSZ8851-16MLLU CEL9200HF M1129021MEA M113A35MEA JESD2-103

JESD22

Abstract: SN63 PB37 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/JESD22 Method A113 (level 3) EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp. Range 125
White Electronic Designs
Original
W332M64V-XSBX SN63 PB37 200A00004-X AN0045 W223M64V-XSBX

Qual

Abstract: A104 Reliability Report 200 A 0004-X January 2005 Rev. 0 Reference Standards Temp. Range EIA/JESD22 Method A113 (level 3) EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition C EIA/JESD22 Method 101
White Electronic Designs
Original
W332M64V-XBX W332M72V-XBX W3E32M64S-XBX W3E32M72S-XBX Qual 0004x 256MB

Qual

Abstract: A104 . 1000 cycles 15 1000 hrs. Reference Standards EIA/JESD22 Method A113 EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp. Range 125°C -55°C to +125°C
White Electronic Designs
Original
W3E64M72S-XSBX 200A00004-41 AN0022 WE364M72S-XSBX

A104

Abstract: A108 °C 15 Pass 15 1000 cycles EIA/JESD22 Method A104 Condition C -55°C to +125°C 15 Pass 15 1000 hrs. EIA/JESD22 Method 101 EIA/JESD22 Method A113 Results Pass EIA/JESD22
White Electronic Designs
Original
WEDPS512K32-XBX WEDPS512K32V-XBX

A104

Abstract: A108 1000 hrs. 1000 cycles 15 45 Reference Standards EIA/JESD22 Method A113 EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition C 1000 cycles 1000 hrs. Temp. Range 125°C -55°C to +125°C -65°C to +150°C EIA/JESD22 Method 101 1 Results Pass 15 Pass 21 Pass 15 Pass 45 Pass
White Electronic Designs
Original
WEDPN4M72V-XB2X WEDPN4M64V-XBX Sn63

A108-C

Abstract: 4 step MacAdam Device Engineering Council) (RTOL) (HTOL) JESD22 A108-C JESD22 A108-C · , · 2 · 3 (WHTOL) (LTOL) JESD22 A108-C · · · 1 : · 2 · 2 · 3 , 200 JESD22 B104-C B · : 1500 G · : 0.5 ms · : 6 5 30 1 : · LED JESD22 A107-B B · · · 1 : · LED : 35°C : 30 g/m2 : 48 : 1. LED LED
Cree
Original
4 step MacAdam cree led mce mc-e D-AP23 CLD-AP23 6500K 3500K

JESD22

Abstract: A104 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/JESD22 Method A113 EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp. Range 125°C -55°C to
White Electronic Designs
Original
W3H32M64E-XSBX 200A00004-46 AN0019

JESD22

Abstract: A104 hrs. ( Per Reliability Report 200 A 0004-19 January 2004 Rev. 0 EIA/JESD22 Method A113 (level 3) EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp
White Electronic Designs
Original
W72M64V-XBX C/85RH

Shipping Trays

Abstract: A104 . Reference Standards EIA/JESD22 Method A113 (level 3) EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp. Range 125°C -55°C to +125°C Results Pass 15 Pass 15 Pass
White Electronic Designs
Original
W72M64VK-XBX Shipping Trays 200A00004-19 AN0046

JESD22

Abstract: A104 Samples 15 21 Duration 1000 hrs. 1000 cycles 15 45 Reference Standards EIA/JESD22 Method A113 EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition C 1000 cycles 1000 hrs. EIA/JESD22 Method 101 1 Temp. Range 125°C -55°C to +125°C Results Pass 15 Pass 21 Pass -65°C
White Electronic Designs
Original
WEDPN8M72V-XB2X WEDPN8M64V-XB2X

A104

Abstract: A108 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/JESD22 Method A113 EIA/JESD22 Method A108 EIA/JESD22 Method A104 Condition B EIA/JESD22 Method 101 Temp. Range 125°C -55°C to
White Electronic Designs
Original
W3E64M16S-XSBX 200A00004-42 WE364M16S-XSBX

ky 202

Abstract: jesd22-a103b Biased, 1000hrs at Tj=150°C Wet High Temp Storage5 JESD22-A101b Unbiased, 85°C / 85% RH , (Au) evaluation board 10 Pass Burn-in (85°C,96hrs) JESD22 A103B1, Condition A, except 85 , +150°C, 30 Cycles) JESD22 A104B Condition C 10 Humidity & Temperature (85°C and 85%RH, 1000hrs) JESD22 A101B, except unbiased 10 Pass 7 Pass Results Random Vibration3 (X,Y , Test Standard Sample Size Aging JESD22 A103B 500hrs at 85°C 10 Resistance to Solder
Sirenza Microdevices
Original
ky 202 jesd22-a103b MMIC VCO 213B JESD22-A101-B JESD22 Method A101-B RQR-104298 40PSI JESD22-A101

A108-C

Abstract: LED X10490 Technical Data Sheet 5. Reliability Stress Reference Specification JESD22 A-104 Test , Damage 0 Thermal Shock Temperature Cycling JESD22 A-104 1000 Cycle 0 Power and , ESD Characterization Vibration Variable Frequency Mechanical Shock JESD22 A-105 1000 Cycle 0 JESD22 A-108C 1000 hours 0 - Ta= 25° C, If = 350 mA 1000 hours 0 JESD22 A-108C Ta= 100° C, If = 350 mA 1000 hours 0 JESD22 A-101 85° C/85% RH, If = 350 mA 1000 hours 0
Seoul Semiconductor
Original
SPA08F0E

A108-C

Abstract: JESD22 A101 Z-Power LED X10490 Technical Data Sheet 5. Reliability Stress Reference Specification JESD22 A , Number of Damage 0/77 Thermal Shock Temperature Cycling JESD22 A-104 1000 Cycle 0/77 , Storage Life ESD Characterization Vibration Variable Frequency Mechanical Shock JESD22 A-105 1000 Cycle 0/77 JESD22 A-108C 1000 hours 0/77 - Ta= 25° C, If = 150 mA 1000 hours 0/77 JESD22 A-108C Ta= 100° C, If = 120 mA 1000 hours 0/77 JESD22 A-101 85° C/85% RH
Seoul Semiconductor
Original
JESD22 A101 SPW08 SPW08F0A

SPW08F0C

Abstract: JESD22 Data Sheet 5. Reliability Stress Reference Specification JESD22 A-104 Test Description (as , Shock Temperature Cycling JESD22 A-104 1000 Cycle 0/77 Power and Temperature Cycle , Characterization Vibration Variable Frequency Mechanical Shock JESD22 A-105 1000 Cycle 0/77 JESD22 A-108C 1000 hours 0/77 - Ta= 25° C, If = 150 mA 1000 hours 0/77 JESD22 A-108C Ta= 100° C, If = 120 mA 1000 hours 0/77 JESD22 A-101 85° C/85% RH, If = 150 mA 1000 hours 0/77
Seoul Semiconductor
Original
SPW08F0C

8C740

Abstract: .00) Stress Reference Specification Thermal Shock JESD22 A-104 Temperature Cycling Test , dwell, C, , , 1000 cycles 1000 Cycle 0/77 Low Temperature Operating Life JESD22 A-108C Ta= -40° If = , , 1000 hours 0/77 High Temperature Operating Life JESD22 A-108C Ta= 100° If = 300 mA C
Seoul Semiconductor
Original
8C740 7898AB8145C6D64 123456789AB8CDEF D4572 12345635367862952A3B5CA37D3EF35 23456789AB7C34C84A 2E936

ky 202

Abstract: A104B (Au) evaluation board 10 Pass Burn-in (85°C,96hrs) JESD22 A103B1, Condition A, except 85 , +150°C, 30 Cycles) JESD22 A104B Condition C 10 Humidity & Temperature (85°C and 85%RH, 1000hrs) JESD22 A101B, except unbiased 10 Pass 7 Pass Results Random Vibration3 (X,Y , Test Standard Sample Size Aging JESD22 A103B 500hrs at 85°C 10 Resistance to Solder , Pass Burn-in (85°C,96hrs) JESD22 A103B, Condition A, except 85°C 13 Pass Cold
Sirenza Microdevices
Original
PLL300 jesd22 a104b KY Series PLL250 PLL350 PLL400

ky 202

Abstract: a104b ) evaluation board 10 Pass Burn-in (85°C,96hrs) JESD22 A103B1, Condition A, except 85°C 10 , , 30 Cycles) JESD22 A104B Condition C 10 Humidity & Temperature (85°C and 85%RH, 1000hrs) JESD22 A101B, except unbiased 10 Pass 7 Pass Results Random Vibration3 (X,Y,Z 15min , Standard Sample Size Aging JESD22 A103B 500hrs at 85°C 10 Resistance to Solder Heat , Pass Burn-in (85°C,96hrs) JESD22 A103B, Condition A, except 85°C 13 Pass Cold
Sirenza Microdevices
Original

A108-C

Abstract: JESD22 A-104 Test Description (as performed by supplier) -40° C/100° C, 20 min dwell, , Cycle Number of Damage 0/77 Thermal Shock Temperature Cycling JESD22 A-104 1000 Cycle , Temperature Storage Life ESD Characterization Vibration Variable Frequency Mechanical Shock JESD22 A-105 1000 Cycle 0/77 JESD22 A-108C 1000 hours 0/77 - Ta= 25° C, If = 350 mA 1000 hours 0/77 JESD22 A-108C Ta= 100° C, If = 300 mA 1000 hours 0/77 JESD22 A-101 85° C/85
Seoul Semiconductor
Original
SPW08F0D

AEC-Q101-001

Abstract: A108-C JESD22 A-104 Test Description (as performed by supplier) -40° C/100° C, 20 min dwell, , Cycle Number of Damage 0/77 Thermal Shock Temperature Cycling JESD22 A-104 1000 Cycle , Temperature Storage Life ESD Characterization Vibration Variable Frequency Mechanical Shock JESD22 A-105 1000 Cycle 0/77 JESD22 A-108C 1000 hours 0/77 - Ta= 25° C, If = 350 mA 1000 hours 0/77 JESD22 A-108C Ta= 100° C, If = 300 mA 1000 hours 0/77 JESD22 A-101 85° C/85
Seoul Semiconductor
Original
AEC-Q101-001 SPW08F0B

QMI 509 epoxy

Abstract: SUMITOMO eme-6600hr : JESD22 Moisture Sensitivity MSL 1 Result P/F P 168 Hrs., 85°C/85%RH+3IR-Reflow, 220°C+5, -0°C 130°C, 3.63V/5.5V, 85%RH Precondition: JESD22 Moisture Sensitivity MSL 3 Temperature Cycle 192 Hrs., 30°C/60%RH+3IR-Reflow, 220°C+5, -0°C Precondition: JESD22 Moisture Sensitivity MSL 1 P 168 Hrs., 85°C/85%RH+3IR-Reflow, 220°C+5, -0°C Precondition: JESD22 Moisture Sensitivity MSL 3 192 , , -65°C to 150°C Precondition: JESD22 Moisture Sensitivity MSL 1 168 Hrs., 85°C/85%RH+3IR-Reflow, 220
-
Original
6600HR QMI 509 epoxy SUMITOMO eme-6600hr SOJ package MSL EME6600HR QMI 509 epoxy datasheet 85C/85 CY62128BLL-SI 610221877M CY62148LL-SC
Showing first 20 results.