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JESD22-A102

Catalog Datasheet MFG & Type PDF Document Tags

JESD22-A118

Abstract: SUMITOMO G631H ) JESD22-A102 45/0 High Temp. Storage Test (150 °C, 1000 Hrs) JESD22-A103 45/0 Note: * Test , hrs) JESD22-A102 77/0 High Temp. Storage Test (150 °C, 1000 Hrs) JESD22-A103 77/0 , %RH/2 ATM, 168 hrs) JESD22-A102 45/0 High Temp. Storage Test (150 °C, 1000 Hrs) JESD22-A103 , Test (121 °C/100%RH/15PSIG, 168 hrs) JESD22-A102 77/0 High Temp. Storage Test (150 °C, 1000
Integrated Device Technology
Original
JESD22-A118 SUMITOMO G631H cel9220 Ablebond 8600 sumitomo g770hcd SUMITOMO CRM1076 A1004-01 VFQFP-N-32 9LRS4105BKLF 9LRS4105BKLFT 9LRS4107AKLF 9LRS4107AKLFT

SUMITOMO CRM1076

Abstract: sumitomo g770hcd Test (121 °C/100%RH/15PSIG, 168 hrs) JESD22-A102 45/0 High Temp. Storage Test (150 °C, 1000 , /0 * Pressure Cooker Test (121 °C/100%RH/15PSIG, 168 hrs) JESD22-A102 77/0 High Temp , ) JESD22-A104 45/0 * Pressure Cooker Test (121 °C/100%RH/2 ATM, 168 hrs) JESD22-A102 45/0 High , ) JESD22-A102 77/0 High Temp. Storage Test (150 °C, 1000 Hrs) JESD22-A103 77/0 Note: * Test
Integrated Device Technology
Original
JESD22-A113 sumitomo g770 G631H g770HCD SUMITOMO G700 G770* sumitomo A1004-01R1 9LRS4110BKLF 9LRS4110BKLFT 9LRS4111BKLF 9LRS4111BKLFT 9LRS4112BKLF

EN4900GC

Abstract: JESD22-A103 Test Results (SS / Rej) * Pressure Cooker Test (121 °C/15 psig, 96 Hrs) JESD22-A102 77/0, 77 , Test (121 °C/100%RH, 2 ATM, 500 Hrs) JESD22-A102 77/0 * Temperature Cycle (-65 °C to +150 °C , ) * Pressure Cooker Test (121 °C/100%RH, 2 ATM, 168 Hrs) JESD22-A102 45/0 * High Accelerated Stress , Method Test Results (SS / Rej) * Pressure Cooker Test (121 °C/15 psig, 96 Hrs) JESD22-A102
Integrated Device Technology
Original
LDS6025PYGI EN4900GC CEL9220HF CRM1076 Compound CEL9220HF cel-9220HF JESD-22-A113 A1007-02 SSOP-28 LDS6000PYGI LDS6000PYGI8 LDS6003PYGI LDS6003PYGI8

JESD22-A104

Abstract: JESD22-A101 ) JESD22-A102 JESD22-A119 JESD22-A103 JESD22-A102 Electrical Stress Trials Electrical Trial Type
Zetex Semiconductors
Original
A9273 JESD22-A101 JESD22-B106 JESD22-B102 IEC68-2-20 JESD22-A108 transistor a102 JESD22A104 a102 transistor ISO/TS16949

JESD22-A102

Abstract: JESD22-A101 (Temperature Humidity + Bias) JESD22-A102 JESD22-A119 JESD22-A103 JESD22-A102 JESD22-A104 JESD22-A101
Zetex Semiconductors
Original
a103 transistor A102 JESD22-A-101 JESD22A102 JESD22-A-102 autoclave 854E-04

aec-q100 001

Abstract: JESD22-A108 Standard JESD22-A102 JESD22-A102 JESD22-A102 Test Conditions 121C, 100%RH 121C, 100%RH 121C, 100
Fairchild Semiconductor
Original
CD4049UBCN CD4066BCN MM74C48N MM74C923WM MM74C926N aec-q100 001 JESD22-A110 cd4051bcn MIL-STD-883-2019 mm74c922n 20033803-B 53BCM CD4053BCSJ CD4060BCMX CD4066BCMX CD4066BCSJX

JEDEC JESD22-B116

Abstract: SUMIKON EME -883 Method 1010 MIL-STD-883 Method 1005 MIL-STD-883 Method 1008 EIA/JESD22-A102 JEDEC J-STD-20 MIL-STD , 1008 EIA/JESD22-A102 JEDEC J-STD-20 MIL-STD-883 Method 2010 MIL-STD-883 Method 2009 JEDEC J-STD-035 Per , -883 Method 1005 MIL-STD-883 Method 1008 EIA/JESD22-A102 JEDEC J-STD-20 MIL-STD-883 Method 2010 MIL-STD , -883 Method 1005 MIL-STD-883 Method 1008 EIA/JESD22-A102 JEDEC J-STD-20 MIL-STD-883 Method 2010 MIL-STD
Integrated Device Technology
Original
SB-U-00-004 SB-U-03-002 SB-U-04-043 JEDEC JESD22-B116 SUMIKON EME EME7351-LP EME-7351 71V016H KMC-184 G-0110-06 EME-7351LP EME-S351LP SB-U-03-003 SB-U-03-005 SB-U-02-002

EN4900GC

Abstract: NC7720 ) hrs Autoclave (PCT) JESD22-A102 121°C / 100% RH, 96 hrs 77/0 Biased HAST JESD22-A110 130°C / 85 , ) hrs HAST JESD22-A102 130°C / 85%RH, 96 hrs 77/0 Biased HAST JESD22-A110 130°C / 85%RH, 3.3V, 96
Energy Micro
Original
NC7720 CEL9220HF10 EME-G760L HL832nxa EME-G760 Yizbond PCN1-110704 EFM32G200F16 EFM32G200F32 EFM32G200F64 EFM32G210F128 EFM32G230F32

JESD22-A108

Abstract: JESD22-A105 NBR OF LOTS 3 SS Results Ref Specs 25 0 Data sheet JESD22-A102 96 Hrs 3 , Data sheet JESD22-A102 96 Hrs 3 77 0 1000 cycles 3 77 0 1000 hours 3
Fairchild Semiconductor
Original
HGTG40N60A4 JESD22-A105 FGK60N6S2D HGTG20N60A4D PCG30N60A4W JESD22A108 a105 transistor JESD-22-A108 JESD22-A110-b jesd22a105 FGB20N6S2 FGB20N6S2T FGB30N6S2DT FGB40N6S2T FGH30N6S2 FGH40N6S2D

AEC-Q100-006

Abstract: aec-q100 001 Q20030060ABACLVA Device NC7SV125P5X NC7SV125P5X Industry Standard JESD22-A102 JESD22-A102 Test
Fairchild Semiconductor
Original
FS35C NC7SP126P5X NC7SP32P5X NC7SV04P5X NC7SV86P5X NC7SP125P5X AEC-Q100-006 AEC-Q100 NC7SV158 tsmc cmos Q20030060AACSAM1A Q20030060ABCSAM1A Q20030060AACSAM2A Q20030060ABCSAM2A J-STD-20B Q20030060

AEC-Q100-006

Abstract: aec-q100 001 Q20030061AAACLVA Q20030061ABACLVA Device NC7SV125P5X NC7SV125P5X Industry Standard JESD22-A102 JESD22-A102 Test Conditions 121C, 100%RH 121C, 100%RH Read Points 96 hrs 96 hrs Test: (High
Fairchild Semiconductor
Original
NC7SP34P5X NC7SV00P5X NC7WV04P6X NC7SVU04P5X b0332 0.35 tsmc cmos front of fabrication process tsmc 0.35 Q20030061AACSAM1A Q20030061ABCSAM1A Q20030061AACSAM2A Q20030061ABCSAM2A Q20030061 SC-70

diode 716

Abstract: 1N5646A JANTX , the issues of these documents are those cited in the solicitation or contract. JESD22-A102 - , JESD22-A102 Hermetic seal not applicable; autoclave, 96 hours, 121°C, 30 psig. B2 4066 Condition , JESD22-A102 1051 JESD22-A102 1051 C5 Not applicable C6 1026 Conditions Autoclave
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Original
1N5555UEJ diode 716 1N5646A JANTX 1N5645A JANTX 1N5635A MIL-PRF-19500/716 1N5555UEG 1N5558UEG 1N5558UEJ 1N5629AUEG

JESD22-A102

Abstract: DO-160G JESD22-A104 JESD22-A102 JESD22-A103 Table 2 ­ Nonhermetic Package/Assembly Qualification Reliability Test , Industry Standard JESD22-A113 AN-400 JESD22-A110 JESD22-A104 JESD22-A102 Accept Criteria Fail/SS , Industry Standard JESD22-A110 JESD22-A104 JESD22-A102 SS/Pkg Family/Quarter 45 45 45 45 High
HOLT Integrated Circuits
Original
44PTQS 64PTQS DO-160G DPM 659 11Q2 JESD22-A104 - TEST CONDITION K QR-1222 92691T 32PTQS 52PTQS

JESD22-B106

Abstract: JESD22-A119 Bias) JESD22-A102 JESD22-A119 JESD22-A103 JESD22-B106 IEC68-2-20 JESD22-A104 JESD22-A101 4
Zetex Semiconductors
Original
MSOP10 QSOP16 QSOP20 qfn16 Zetex Semiconductors ic lnb qsop24 226800 QFN1633085E QFN1633 QFN1644 QFN2444

JESD22-A108

Abstract: A9273 Bias) JESD22-A102 JESD22-A103 JESD22-B106 JESD22-A104 JESD22-A101 1 1 1 1 1 45 45 45
Zetex Semiconductors
Original
SC70-5 203E 312E-04

JESD22-B106

Abstract: A9273 (Resistance to Solder Heat Float) Solderability (Post Hot Store) JESD22-A119 JESD22-A103 JESD22-A102
Zetex Semiconductors
Original
DFN1443 SC70-6 TSOT23-5 361 SOT23

ic of 4543

Abstract: JESD22-A108 ) Solderability (Post Hot Store) JESD22-A119 JESD22-A102 Electrical Stress Trials Electrical Trial Type
Zetex Semiconductors
Original
DFN533075E ic of 4543 test SOt23 692E-03

transistor a102

Abstract: a103 transistor Store) TC (Temperature Cycle Air to Air) THB (Temperature Humidity + Bias) JESD22-A102 JESD22-A119
Zetex Semiconductors
Original
JESD22 pdf A101 datasheet 763E-04

7490

Abstract: data sheet 7490 Store) JESD22-A119 JESD22-A103 JESD22-A102 Electrical Stress Trials Electrical Trial Type
Zetex Semiconductors
Original
7490 data sheet 7490 application of 7490 7490 data sheet 39 77 in sot223 package of 7490 369E-04

JESD22-B106

Abstract: JESD22-A119 Store) JESD22-A119 JESD22-A103 JESD22-A102 Electrical Stress Trials Electrical Trial Type
Zetex Semiconductors
Original
IEC-68-2-20 504E-04

1N6037A

Abstract: 1N6036A those cited in the solicitation or contract. JESD22-A102 - Accelerated Moisture Resistance - , -55°C to +150°C. B2 JESD22-A102 B2 4066 Condition for surge, 1 cycle, see 4.5.3. B3 , JESD22-A102 1051 JESD22-A102 1051 C5 Not applicable C6 1026 Conditions Autoclave
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Original
1N6037A 1N6036A Diode LT 5230 MIL-PRF-19500/717 1N6036AUEG 1N6072AUEG 1N6036AUEJ 1N6072AUEJ MIL-PRF-19500

2N7560

Abstract: 2N7553 . JESD22-A101 JESD22-A102 JESD22-A113 Steady State Temperature Humidity Bias Life Test. Accelerated , JESD22-A113 (1) Pre conditioning to level 1 for the following sequential tests: B1 JESD22-A102 (1 , / Autoclave Temperature cycling Autoclave Temperature cycling n = 77, c = 0 JESD22-A102 1/ 1051 JESD22-A102 1/ 1051 Condition C, 96 hours Condition G, 500 cycles. Condition C, 96 hours Condition
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Original
2N7558 2N7560 2N7553 MIL-PRF-19500/714 2N7559

2n7563

Abstract: 2N7565 JESD22-A102 JESD22-A112 Steady-State Temperature Humidity Bias Life Test. Accelerated Moisture Resistance , JESD22-A113 (1) Pre conditioning to level 1 for the following sequential tests: B1 JESD22-A102 (1 , cycling JESD22A102 1/ 1051 JESD22A102 1/ 1051 Condition C, 96 hours Condition G, 500 cycles
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Original
2N764 2N7565 2n7563 ISO 3161 MIL-PRF-19500/715 2N7563 2N7564

2N2907AUE1

Abstract: award 686 solicitation (see 6.2). JEDEC Standard 20 JESD22A -112 JESD22-A101 JESD22-A102 JESD22-A103 JESD22-A113 , = 15 c = 0. 2 1051 Temp. cycle: Condition G, 25 cycles, n = 15, c = 0. 3 JESD22-A102 , JESD22-A103 2 1051 3 JESD22-A102 Autoclave: condition C, 96 hours. 4 JESD22-A101 , measurements See group A, subgroup 2. Subgroup 4a n = 77, c = 0 JESD22-A102 1/ Autoclave 96
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Original
2N2907AUE1 award 686 qm marking code sot-23 MIL-PRF19500 MARKING code sot23 h15 MIL-PRF-19500/686

manson

Abstract: JESD22-A101 documents cited in the solicitation (see 6.2). JEDEC Standard 20 JESD22A -112 JESD22-A101 JESD22-A102 , 15 c = 0. 2 1051 Temp. cycle: condition G, 25 cycles, n = 15, c = 0. 3 JESD22-A102 , JESD22-A103 2 1051 3 JESD22-A102 Autoclave: condition C, 96 hours. 4 JESD22-A101 , measurements See group A, subgroup 2. Subgroup 4a n = 77, c = 0 JESD22-A102 1/ Autoclave 96
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manson MIL-PRF-19500/695 2N4033UE1

JESD22-A101

Abstract: JESD22-A102 solicitation (see 6.2). JEDEC Standard 20 JESD22-A101 JESD22-A102 JESD22-A103 JESD22-A112 JESD22-A113 , Temp. cycle: Condition G, 25 cycles, n = 15, c = 0. 3 JESD22-A102 Autoclave: Condition C, 96 , JESD22-A102 Autoclave: condition C, 96 hours. 4 JESD22-A101 Moisture resistance (85/85 biased , , subgroup 2. Subgroup 4a Autoclave n = 77, c = 0 JESD22-A102 1/ 96 hours Electrical
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MIL-PRF-19500/674 2N2484UE1

2N2222AUE1

Abstract: 2N2222A JANTX -112 JESD22-A101 JESD22-A102 JESD22-A103 JESD22-A113 - Moisture Reflow Sensitivity , . 3 JESD22-A102 Autoclave: condition C, 96 hours, n = 15, c = 0. 4 2031 Soldering heat , . Temp. cycle: condition G, 1000 cycles. 3 JESD22-A102 Autoclave: condition C, 96 hours. 4 , n = 77, c = 0 JESD22-A102 1/ 96 hours Electrical measurements See group A, subgroup 2
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2N2222AUE1 2N2222A JANTX 2N2222A JANTXV sot-23 npn marking code cr 2N2222A 2N2222A 331 MIL-PRF-19500/672
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