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IEC801-2

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max232c

Abstract: IEC-801-2 Human Body Model 2) ±8kV using the contact discharge method specified in IEC801-2 3) ±15kV using IEC801-2â'™s air-gap method. The IEC801-2 standard covers ESD testing and performance of finished , . When tested according to IEC801-2, they survive ±8kV contact-discharges and ±15kV air-gap discharges , Body ESD Test Model IEC801-2 ± IS k V ESD Protection As with all Maxim devices, ESD-protectlon , /MAX241E help you design equipment that meets level 4 (the highest level) of IEC801-2, without the need
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max232c IEC-801-2 RS-232 MAX202E/232E MAX211E/213E/241E MAX202ECPE MAX202ECSE MAX202ECWE

IEC801-2

Abstract: 74F1071 Waveform (IEC801-2 Network) Clamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) Unclamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped - 1 KV ESD Voltage Waveform (IEC801-2 Network
Fairchild Semiconductor
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74F1071 74F1071SC MS-013 74F1071MSA MSA20 74F1071MTC

74F1071

Abstract: 74F1071MSA Circuit Unclamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) DS011685-9 DS011685-10 Unclamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) DS011685
Fairchild Semiconductor
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MTC20 IEC-801-2 ESD F1071 DS011685-1

IEC-801-2

Abstract: ict implant Waveform (IEC801-2 Network) Clamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) Unclamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped - 1 KV ESD Voltage Waveform (IEC801-2 Network
Fairchild Semiconductor
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ict implant MO-153

jedec MO-150

Abstract: IEC-801-2 (Continued) Unclamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) Unclamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) Typical Application 74F1071 ESD Protection of ASIC on
Fairchild Semiconductor
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74F1071SCX 74F1071MSAX 74F1071MTCX jedec MO-150 jedec ms-013 MSA20 Package MO-150

IEC-801-2

Abstract: IEC801-2 SPECIFICATION NOTICE LT1137A August 1995 The LT®1137A product now has improved protection against ESD pulses. The RS232 Driver and Receiver pins are fully compliant to the IEC-801-2 test standard. This standard defines two alternative test methodologies, air gap and contact modes. The LT1137A meets both the ±15kV air gap mode and the ±8kV contact mode test methods of IEC-801-2. For complete specifications, pin-out, typical performance curves and applications information, please see the LT1130A family
Linear Technology
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IEC8012

MAX232EEWE

Abstract: MAX232E contact-discharge method specified in IEC801-2 3) ±15kV using IEC801-2's air-gap method. Human Body Model , µs 6 30 V/µs 6 30 V/µs ±15 IEC801-2, Contact Discharge ±8 IEC801-2 , -232 inputs and outputs, tested using the Human Body Model. When tested according to IEC801-2, they survive , interest, which is then discharged into the test device through a 1.5k resistor. IEC801-2 The IEC801-2 , meets level 4 (the highest level) of IEC801-2, without the need for additional ESD-protection
Maxim Integrated Products
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MAX202E MAX232E MAX203E MAX241E MAX232EEWE MAX232EESE MAX211E MAX232EMJE MAX232EMLP MAX211E/MAX213E/MAX241E MAX202E/MAX211E/MAX213E

74F1071

Abstract: EIAJ-IC-121 ESD Voltage Clamping Test Circuit 330X Unclamped a 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped a 1 KV ESD Voltage Waveform (IEC801-2 Network) Unclamped b 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped b 1 KV ESD Voltage Waveform (IEC801-2 Network) TL F 11685 ­ 6 4 Typical
National Semiconductor
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C1995 EIAJ-IC-121 RRD-B30M115
Abstract: Waveform (IEC801-2 Network) Clamped +1kV ESD Voltage Waveform (IEC801-2 Network) Unclamped -1kV ESD Voltage Waveform (IEC801-2 Network) Clamped -1kV ESD Voltage Waveform (IEC801-2 Network) Typical Fairchild Semiconductor
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J-STD-020B
Abstract: Waveform (IEC801-2 Network) Clamped + 1 KV ESD Voltage Waveform (IEC801-2 Network) Unclamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) Clamped - 1 KV ESD Voltage Waveform (IEC801-2 Network) w -
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1071S 1071M

IEC-801-2

Abstract: AX7042W-PAD % White Noise Vcc = 5V IEC801-2 IEC801-2 Non-Condensing 80g/11 ms 5-500MHz 9.8N 1 million
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RS-310C AX7042W-PAD AX7042T-PAD 1u 5V keyboard touch pad keyboard datasheet AX7042 170DPI 187DPI 153DPI 5-500MH
Abstract: Human Body Model. They survive ±7kV discharges when te ste d a c c o rd in g to IEC801-2. The rugged , ver±7kV using the model specified in IEC801-2. A I /X I A 1 ESD Test Conditions Maxim has , interest, which is then discharged into the test device through a 1.5 k ii resistor. IEC801-2 The IE C , A X 2 13E /M A X 2 41 E he lp you d e s ig n equipment that meets level 3 of IEC801-2 without the , Human Body Model and tests to IEC801-2 is that the IEC801-2 ESD generator circuit creates higher peak -
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MAX211 E/MAX213E/MAX241E EIA/TIA-232E MAX213E AX211E/MAX241E BA/TIAE-232E
Abstract: , No Damage 0°C -40°C 5% White Noise Vcc = 5V IEC801-2 IEC801-2 Non-Condensing 80 g/11 -
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AX7042W AX7042T

150pf 6kv

Abstract: 74F1071 Protection Device DC Electrical Characteristics Unclamped +1kV ESD Voltage Waveform (IEC801-2 Network) Clamped +1kV ESD Voltage Waveform (IEC801-2 Network) Unclamped -1kV ESD Voltage Waveform (IEC801-2 Network) Clamped -1kV ESD Voltage Waveform (IEC801-2 Network) Typical Application 74F1071 ESD
Fairchild Semiconductor
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150pf 6kv

8786

Abstract: IEC-801-2 Simulator, (per IEC801-2 requirements). Additional units were tested with PolyClamp ® ESD protection , IEC801.2 Standard. The energy storage capacitance is 150 pF, while the discharge resistor is 330. The , of the PolyClamp device shows that it provides a 15V DC clamp for a 15,000V IEC801.2 ESD event (see
National Semiconductor
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DS14C88 DS14C89A 8786 connector life testing TIA/EIA-232-E

RS232-A

Abstract: ±8kV- IEC801-2, Contact Discharge ±15kV- IEC801-2, Air-Gap Discharge Latchup Free (unlike bipolar
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RS232-A X203E R20UT R10U1 T10UT T20UT

deutsch connector

Abstract: IEC801-2 Simulator, (per IEC801-2 requirements). Additional units were tested with PolyClamp ® ESD protection , IEC801.2 Standard. The energy storage capacitance is 150 pF, while the discharge resistor is 330. The , . Characterization testing of the PolyClamp device shows that it provides a 15V DC clamp for a 15,000V IEC801.2 ESD
National Semiconductor
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deutsch connector

zy 406

Abstract: IEC1000-4-4 applications Ideal for ESD protection of data lines in accordance with IEC 1000-4-2(IEC801-2) Ideal for EFT protection of data lines in accordance with IEC1000-4-4(IEC801-2) Plastic package has Underwriters , TO 8KV POSITLVE GOLING ESD PULSE PER IEC1000-4-2(IEC801-2) LET THROUGH VOLTAGE,VOLTS 50 TA
Shunye
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SMAJ170CA SMAJ170 zy 406 SMAJ10 SMAJ10A SMAJ11 DO-214AC C/10S SMAJ15C

AN-878

Abstract: DS14C88 using a KeyTek Human Body ESD Simulator, (per IEC801-2 requirements). Additional units were tested , connector pins conforms to the IEC801.2 Standard. The energy storage capacitance is 150 pF, while the , for a 15,000V IEC801.2 ESD event (see Figure 2). In addition, Figure 2 shows a typical front edge
National Semiconductor
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AN-878

1488E

Abstract: . _ Features 4 ESD Protection: ±15kV- Human Body Model ±6kV- IEC801-2, Contact Discharge ±15kV- IEC801-2, Air-Gap Discharge 4 Late hup Free, Even During an ESD Event 4 Low 85 |jA Supply Current from I , Circuit-Terminating Equipment (DCE) Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or ±15kV ESD Protection PART , -4-2 (formerly IEC801-2) 3 )± 1 5 k V using the A ir-G a p M ethod s p e c ifie d in IEC1000-4-2 (formerly IEC801-2
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1488E MAX1488E EIA/TIA-232 EIA/TIA-562 MC1488 C14C88 SN751

1488E

Abstract: ) Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or ±15kV ESD Protection PART MAX1488ECPD MAX1488ECSD MAX , Contact-Discharge Method specified in IEC1000-4-2 (formerly IEC801-2) 3)±15kV using the A ir-G ap Method s p e c ifie d in IEC1000-4-2 (formerly IEC801-2). ESD Teat Conditions ESD performance depends on a number of
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V--IEC801-2 MC14C88 SN75188 SN75C188 DS1488 X1488E

MAX1488ECPD

Abstract: (DTE) with Data Circuit-Term inating Equipm ent (DCE) Equipm ent M eeting IEC1000-4-2 (formerly IEC801-2
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S-232 AX1488E C1488 MAX1488EC/D MAX1488EEPD MAX1488EESD
Abstract: Equipment (DCE) Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or ±15kV ESD Protection PART TEMP , â  2) ±6kV using the Contact-Discharge Method specified in IEC1000-4-2 (formerly IEC801-2) 3 )± 1 5 k V u sin g th e A ir-G a p M e th o d s p e c ifie d in IEC 1000-4-2 (formerly IEC801-2 -
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DS1488

Abstract: DS14C88 Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or ±15kV ESD Protection _Typical Operating , Body Model 2) ±6kV using the Contact-Discharge Method specified in IEC1000-4-2 (formerly IEC801-2) 3) ±15kV using the Air-Gap Method specified in IEC1000-4-2 (formerly IEC801-2). ESD Test Conditions
Maxim Integrated Products
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capacitor 6kv
Abstract: ) Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or ±15kV ESD Protection _Ordering , specified in IEC1000-4-2 (formerly IEC801-2) 3) ±15kV using the Air-Gap Method specified in IEC1000-4-2 (formerly IEC801-2). Inputs The driver inputs determine the driver output states (Tables 1 and 2). Maxim Integrated Products
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MAX232EEWE

Abstract: MAX211E an B o d y M odel, When tested a ccording to IEC801-2, they survive ±8kV contact-discharges and ±1 5 , . Figure 6a. Human Body ESD Test Model IEC801-2 T he IE C 8 0 1 -2 s ta n d a r d c o v e rs ES D te s , current in IEC801-2, b e cause series resistance is lower in th e IE C 8 0 1 -2 m o d e l. H e n c e , th e ESD w ith s ta n d voltage m easured to IEC801-2 is generally lower than that m easured using the Hum an B ody M odel. Figure 7b shows the current waveform for the 8kV IEC801-2 levelfour ESD co n
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MAX232ECSE TIAE-232E MAX202E/M AX232E/M 11E/MAX213E/MAX241E 211E/M AX213E/M AX241E

IEC-100-4-2

Abstract: Equipment (DCE) Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or ±15kV ESD Protection , specified in IEC1000-4-2 (formerly IEC801-2) 3) ±15kV using the Air-Gap Discharge method specified in IEC1000-4-2 (formerly IEC801-2). Human Body Model Figure 2a shows the Human Body Model, and Figure 2b
Maxim Integrated Products
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IEC-100-4-2 MAX1489E MC1489 MC14C89 SN75189 SN75C189 DS1489

DS14C88

Abstract: DS1488 SO Dice* 14 Plastic DIP PC Motherboards Equipment Meeting IEC1000-4-2 (formerly IEC801-2) or , Body Model 2) ±6kV using the Contact-Discharge Method specified in IEC1000-4-2 (formerly IEC801-2) 3) ±15kV using the Air-Gap Method specified in IEC1000-4-2 (formerly IEC801-2). ESD Test Conditions
Maxim Integrated Products
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Abstract: -4-2 (formerly IEC801-2) or ±15kV ESD Protection _Typic a l Ope ra t ing Circ uit 1â"4 MAX1488E , Method specified in IEC1000-4-2 (formerly IEC801-2) 3) ± 15kV using the Air-Gap Method sp ec ified in IEC1000-4-2 (formerly IEC801-2). ESD Test Conditions ESD performance depends on a number of conditions Maxim Integrated Products
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