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SAA7144HL/V1,557 NXP Semiconductors Quadruple video input processor; Package: SOT425-1 (LQFP128); Container: Tray Dry Pack, Bakeable, Multiple ri Buy
SAA7113H/V2/R5,557 NXP Semiconductors 9-bit video input processor; Package: SOT307-2 (QFP44); Container: Tray Dry Pack, Bakeable, Multiple ri Buy
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Episil process

Catalog Datasheet Results Type PDF Document Tags
Abstract: Reliability and Qualification Report EPISIL 5um CMOS Process (SP3485 SP3485 Product) Prepared by: G. West Manager, Quality Assurance Date: 7/14/06 EPISIL 5um CMOS Process Qualification , Mask Sets: 1567AZ 1567AZ Process: 5um CMOS Wafer Manufacturer: Assembly Location: Episil , As part of the Episil process characterization and qualification program, the Engineering group had , rates at 25°, 55°, and 70°C operation at both 60% and 90% confidence levels for 5um Episil process were ... Original
datasheet

5 pages,
1483.06 Kb

SP483 SP481 SP3485 SP3481 Episil process ESD test plan SP3485 abstract
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Abstract: Reliability and Qualification Report EPISIL 2um CMOS Process (SP232CE SP232CE and SP3223EEA SP3223EEA Products) Prepared by: G. West Manager, Quality Assurance Date: 6/9/06 EPISIL 2um CMOS Process Qualification , Type: EPISIL 2um CMOS Process Qualification SP232CE SP232CE: 16L NSOIC SP3223EEA SP3223EEA: 20L TSSOP Page 2 , 0 0 0 0 0 0 0 0 0 Life Test Results As part of the Episil process characterization and , levels for 2um Episil process were calculated and listed below. FIT Rate: 2um CMOS Episil Process ... Original
datasheet

6 pages,
39.78 Kb

SP3223EEA SP232CE B5C1 Episil process SP232c SP232CE abstract
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Abstract: 5.5V. Wafer Fab: Episil Fab Location: Taiwan Process: Episil - 1x - SC2- mah - a MS: 1087 Assembly , room25oC Episil Episil Process Date Tested 2umCmos 21-FEB2006 21-FEB2006 2umCmos 21-FEB2006 21-FEB2006 2umCmos , hot85oC MS1087DZ MS1087DZ SP232CE SP232CE _ room25oC Episil Episil Process Date Tested 2umCmos , room25oC Episil Episil Process Date Tested 2umCmos 21-FEB2006 21-FEB2006 2umCmos 21-FEB2006 21-FEB2006 2umCmos , SP232CE SP232CE _ room25oC Episil Episil Process Date Tested 2umCmos 21-FEB2006 21-FEB2006 2umCmos ... Original
datasheet

283 pages,
1886.34 Kb

SP232EEP-L 649 592E 971e SP202E SP232A SP232ACN SP232ACP-L SP232ECP SP232E SP232CE SP232c SP232AET-L SP232 SP232EEN 1233 7694 SP232 abstract
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Abstract: : Episil Fab Location: Taiwan Process: Episil - 1x - SC2- mah - a MS: 1105 Assembly location: Carsem , Operation Foundry Process C30P44 C30P44: 3 MS1105G MS1105G SP3243E SP3243E _ Z B 85oC3Vch Episil ar Date Tested Tester , Process C30P44 C30P44: 3 MS1105G MS1105G SP3243E SP3243E _ Z B 85oC3Vch Episil ar Date Tested Tester 2umcmos , Process C30P44 C30P44: 3 MS1105G MS1105G SP3243E SP3243E _ Z B 85oC3Vch Episil ar Date Tested Tester 2umcmos , Device Rev Operation Foundry Process C30P44 C30P44: 3 MS1105G MS1105G SP3243E SP3243E _ Z B 85oC3Vch Episil ar Date ... Original
datasheet

939 pages,
5964.15 Kb

6716E 649 592E 09 06 232 6843 SP3243 RX3 0633 PM 8443 MS1324 0709 817 B data sheet MAR 618 transistor Episil process 455e SP3243 abstract
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Abstract: Episil distributions for a given parameter are adjacent. A distribution for a given parameter shows different temperature data which are at -40ºC, 25ºC, and 85ºC. Wafer Fab: Episil Fab Location: Taiwan Process: Episil -1x-sc0-mah-a MS: 901BY 901BY Assembly location: Carsem Characterization Procedure: Episil , Fab in Milpitas, CA, to a contract foundry, Episil, in Taiwan. This characterization report , Distribution Variance Hillview Fab Cpk (across temp) Episil Fab Distribution Mean Episil Fab ... Original
datasheet

7 pages,
214.29 Kb

6502 901by 9934 ca 3056 CARSEM SP483 SP483CN sp483ecn SP483E SP483eep-L SP483ES-L SP483C SP483 abstract
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Abstract: Fab: Episil Fab Location: Taiwan Process: 5u CMOS MS: 668 Assembly location: CEI (Thailand) Characterization Procedure: Episil Lot number(s): 563CH 563CH Temperatures: Ambient (25C), 85C, -40C Tester: LTX Test , foundry, Episil, in Taiwan. This characterization report summarizes data for key SP485R SP485R product family , 0.40466 >4.0000 nS 13.19733 0.530349 Episil Fab Distribution Mean Episil Fab Distribution Variance Episil Fab Cpk (across temp) 256.570 5.485 >4.0000 1.804 115.150E-03 150E-03 ... Original
datasheet

59 pages,
435.67 Kb

SP485RCP-L SP485RCP SP485RCN-L SP485RCN SP485R A12V 9153e 592E 853e SP485R abstract
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Abstract: 2010 171.62 KB Process Qualification Report EPISIL 5um CMOS Process Qualification Report Version 1.0.0 July 2006 1.45 MB Transfer Characterization Report SP3485 SP3485 Family Episil Characterization Report ... Original
datasheet

1 pages,
78.29 Kb

sn75180 SP3491 RS-485 SP3491 abstract
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Abstract: Failsafe Features Version 1.0.0 June 2010 171.62 KB Process Qualification Report EPISIL 5um CMOS Process Qualification Report Version 1.0.0 July 2006 1.45 MB Transfer Characterization Report SP3485 SP3485 Family Episil ... Original
datasheet

1 pages,
78.55 Kb

rs 485 multidrop full duplex SN75179 application SP3490 RS-485 SP3490 abstract
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Abstract: PRODUCT ATTRIBUTE AFFECTED: [ ] [ ] [X] Material Change Design Change Process Change , from Hillview wafer fabrication facility to wafer foundry Episil. See attached Product List no. 09. , site. FABRICATION PROCESS QUALIFICATION COMPLETED (DATE): 5/1/06 PRODUCT CHARACTERIZATION COMPLETED , production shipment. Product Designator: DC suffix of "E" for Episil [ ] STANDARD DISTRIBUTION [X ... Original
datasheet

3 pages,
93.01 Kb

Sp238act SP208CA SP208CA-L SP208CP-L SP208CT SP208EA SP208EA-L SP208ECA SP238ACS SP204EP-L SP208CP MS1341 MS1341 abstract
datasheet frame
Abstract: PRODUCT ATTRIBUTE AFFECTED: [ ] [ ] [X] Material Change Design Change Process Change , from Hillview wafer fabrication facility to wafer foundry Episil. See attached Product List no. 08. , site. FABRICATION PROCESS QUALIFICATION COMPLETED (DATE): 5/1/06 PRODUCT CHARACTERIZATION COMPLETED , production shipment. Product Designator: DC suffix of "E" for Episil [ ] STANDARD DISTRIBUTION [X ... Original
datasheet

3 pages,
93.39 Kb

sp491een SP1485ECN SP1485ECN-L SP1485ECP SP1485EEN SP1485EEN-L SP1485EEP SP1485EMN SP1485EMN-L SP1490E SP490ECN-L sp491ecn SP491ECP-L MS1326 MS1326 MS1326 abstract
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