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EIA-364-31 method iv

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: . EIA-364-31 Condition B Method III IEC-60512-11-12 IEC-60512-11-12 80-98% RH 10 cycles (10 days) +25° C to +65° C , Current Rating Contact Max Size Current 8 40 20 7.5 22 5 EIA-364-70 EIA-364-70 Method , receptacle. ≥ 100 MΩ insulation resistance. MIL-STD-810F MIL-STD-810F Method 512.4 1 meter immersion 1 hour , . Connectors shall meet electrical requirements after vibration test. EIA-364-28 EIA-364-28 Test Condition IV IEC , resistance requirements. EIA-364-32 EIA-364-32 Test Condition IV IEC-60512-11-4 IEC-60512-11-4 5 cycles consisting of -65° C 30 ... Glenair
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4 pages,
130.84 Kb

EIA-364-35 EIA-364-31 method iv TEXT
datasheet frame
Abstract: other damage detrimental to operation of connector 4.5.11.1 or 4.5.11.2 4.5.13 IAW EIA-364-31,Method IV with temperature exceptions; IAW EIA-364-32 EIA-364-32, Test cond. A; IAW IEC 60068-2-14, Test Method Z/AD , Connecting hardware shall conform to A.2; a thru c of TIA/EIA-568-B TIA/EIA-568-B.2 per IEC 60512-2, Test Method 2A, millivolt level method (shall not exceed 0.025 ohms and 0.050 ohms during subsequent tests TIA/EIA-568-B TIA/EIA-568-B.2, Section A.2 IAW IEC 60512-2, Test method 2A Per IEC 60512-2, Test 3a, Method C, test voltage 500 VDC ... Glenair
Original
datasheet

1 pages,
171.94 Kb

EIA-364-31 method iv EIA-364-31 MIL-DTL-5015 TEXT
datasheet frame
Abstract: humidity conditioning in accordance with EIA-364-31, Test Condition IV. After a minimum of 3 hours of step , subjected to humidity conditioning in accordance with EIA-364-31, Test Condition IV. On completion of step , the solderability requirements of MIL-STD-202 MIL-STD-202 Method 208. 3.2.8 Durability. Micro-D connectors , -364-32, Condition IV. Connectors shall not exhibit any detrimental damage or degradation of electrical performance , with EIA-364-28 EIA-364-28 Test Condition IV, which specifies 12 hour duration, 10 Hz to 2000 Hz, and amplitude ... Glenair
Original
datasheet

4 pages,
59.69 Kb

EIA-364-28 EIA-364-26 condition b EIA-364-83 GLENAIR mwd Glenair MWDM GSC19998 eia 364-35 C9-4215 EIA-364-31 EIA-364-26 EIA-364-29 vectra EIA-364-66 EIA-364-06 M22759/11 EIA-364-56 Hysol C9-4215 EIA-364-35 Hysol 4215 TEXT
datasheet frame
Abstract: -364-70 Method 1 IEC-60512-5 IEC-60512-5 Test 9b EIA-364-83 EIA-364-83 IEC-60512-2-6 IEC-60512-2-6 Electroless nickel plated connectors. EIA , . EIA-364-28 EIA-364-28 Test Condition IV IEC-60512-6-4 IEC-60512-6-4 100 milliamp test current 10- 2,000 Hz 20 g, 196 m/s2 , . CAGE Code 06324 D E MIL-STD-810F MIL-STD-810F Method 512.4 1 meter immersion 1 hour © 2009 Glenair, Inc , resistance requirements. EIA-364-32 EIA-364-32 Test Condition IV IEC-60512-11-4 IEC-60512-11-4 5 cycles consisting of -65° C 30 , meet contact resistance, shell-to-shell resistance and DWV requirements. EIA-364-31 Condition B ... Glenair
Original
datasheet

5 pages,
357.07 Kb

EIA-364-28 IEC-60512-4 IEC-60512-4-1 EIA-364-21 IEC-60512-6-3 EIA-364-06 olive oil EIA-364-42 IEC-60512-11-12 IEC-60512-11-4 IEC-60512-23-3 IEC-60512-6 EIA-364-10 AS39029 IEC-60512-3-1 IEC-60512-6-4 EIA-364-03 IEC-60512-5 EIA-364-31 TEXT
datasheet frame
Abstract: -364-13 EIA-364-08 EIA-364-08 100 megohms IR following ten 24 hour cycles EIA-364-31, Method IV. 20 hours , -59551, Gold-Plated TABLE 2: MICRO-D PERFORMANCE SPECIFICATIONS PROPERTY SPECIFICATION TEST METHOD , Condition IV EIA-364-54 EIA-364-54 Printed in U.S.A. GLENAIR, INC. · 1211 AIR WAY · GLENDALE, CA 91201-2497 · ... Glenair
Original
datasheet

1 pages,
34.79 Kb

B733 B733-90 EIA-364-06 ee4215 AMS-QQ-N-290 SAE-AMS-QQ-P-416 MIL-W-16878 liquid crystal polymer dielectric EIA-364-66 EIA-364-28 HD3561 Hysol HD3561 EIA-364-54 EIA-364 EIA-364-21 ASTM B 488 AMS 2700 Hysol ee4215 EIA-364-08 EIA-364-31 method iv TEXT
datasheet frame
Abstract: : IAW EIA-364-31, Method IV, except 7A & 7B (not required) Vibration: IAW EIA-364-28 EIA-364-28 & MIL-DTL , : IAW EIA-364-31, Method IV, except 7A & 7B (not required) Vibration: IAW EIA-364-28 EIA-364-28 & MIL-DTL ... IEH
Original
datasheet

10 pages,
789.94 Kb

EIA-364-06 LOCTITE 454 ams YEAR DATE CODE EIA-364-28 EIA-364-21 B-197 astm standards ASTM b734 MIL-STD-55302 EIA-364-31 method iv AMS 2418 MIL-M-24519 GST-40F MIL-DTL-55302 SAE-AMS-P-81728 SAE-AMS2700 TEXT
datasheet frame
Abstract: subjected to humidity conditioning in accordance with EIA-364-31, Test Condition IV. After a minimum of 3 , connectors shall be subjected to humidity conditioning in accordance with EIA-364-31, Test Condition IV. On , the solderability requirements of MIL-STD-202 MIL-STD-202 Method 208. 3.2.8 Durability. Micro-D connectors , -364-32, Condition IV. Connectors shall not exhibit any detrimental damage or degradation of electrical performance , accordance with EIA-364-28 EIA-364-28 Test Condition IV, which specifies 12 hour duration, 10 Hz to 2000 Hz, and ... Glenair
Original
datasheet

6 pages,
72.92 Kb

TEXT
datasheet frame
Abstract: +71°C 75 min. dwell 5 minute transfer rate J EIA-364-31 Condition B Method III IEC , REQUIREMENT PROCEDURE EIA-364-31 Condition C Method II IEC-60512-11-3 IEC-60512-11-3 Severity C 21 day humidity (damp , 23 13 7.5 5 EIA-364-70 EIA-364-70 Method 1 IEC-60512-5 IEC-60512-5 Test 9b M Dimensions in inches (millimeters , after vibration test. MIL-STD-202 MIL-STD-202 Method 204, test Condition G 30 g's, 3 axes, 4 hours per axis , MIL-STD-810F MIL-STD-810F Method 519.5 Mechanical shock No discontinuity of greater than 1 microsecond, no ... Glenair
Original
datasheet

6 pages,
346.14 Kb

EIA-364-21 EIA-364-06 EIA-364-03 B-23 60512 IEC-60512-11-12 IEC-60512-6-4 IEC-60512-11-4 EIA-364-29 eia-364-42 IEC-60512-1-1 EIA-364-66 EIA-365-35 EIA-365-02 EIA-364-20 EIA-364-83 AS39029 IEC-60512-5 IEC-60512-4-1 TEXT
datasheet frame
Abstract: subjected to humidity conditioning in accordance with EIA-364-31, Test Condition IV. After a minimum of 3 , connectors shall be subjected to humidity conditioning in accordance with EIA-364-31, Test Condition IV. On , the solderability requirements of MIL-STD-202 MIL-STD-202 Method 208. 3.2.8 Durability. Micro-D connectors , -364-32, Condition IV. Connectors shall not exhibit any detrimental damage or degradation of electrical performance , accordance with EIA-364-28 EIA-364-28 Test Condition IV, which specifies 12 hour duration, 10 Hz to 2000 Hz, and ... Glenair
Original
datasheet

5 pages,
64.91 Kb

Hysol C9-4215 TEXT
datasheet frame
Abstract: resistance and DWV requirements. EIA-364-31 Condition B Method III IEC-60512-11-12 IEC-60512-11-12 80-98% RH 10 cycles , Current Carrying Capacity EIA-364-70 EIA-364-70 Method 1 IEC-60512-5 IEC-60512-5 Test 9b Shell-to-shell , „¦ insulation resistance. MIL-STD-810F MIL-STD-810F Method 512.4 1 meter immersion 1 hour Ingress Protection IP67 , electrical requirements after vibration test. EIA-364-28 EIA-364-28 Test Condition IV IEC-60512-6-4 IEC-60512-6-4 100 milliamp , IV IEC-60512-11-4 IEC-60512-11-4 5 cycles consisting of -65° C 30 minutes, +25° C 5 minutes max., +150° C 30 ... Glenair
Original
datasheet

3 pages,
187.54 Kb

TEXT
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. . . . . . . . . . . . . . 19 IV V.25BIS 25BIS COMMANDS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 IV.1 STANDARD V.25bis COMMANDS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 IV.2 STANDARD V.25bis INDICATIONS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 IV.3 EXTENDED V.25bis COMMAND SET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 IV
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enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
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NXP 01/07/2006 56.55 Kb IBS ahct02.ibs
enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
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Motorola 25/11/1996 72.26 Kb HTM br135apn.htm
enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
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NXP 01/07/2006 61.47 Kb IBS lvt08.ibs
enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
/datasheets/files/nxp/misc/support/models/lvt/ibis/lvt32.ibs
NXP 01/07/2006 61.47 Kb IBS lvt32.ibs
enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
/datasheets/files/nxp/misc/support/models/lvt/ibis/lvt00.ibs
NXP 01/07/2006 61.47 Kb IBS lvt00.ibs
enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
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NXP 01/07/2006 58.32 Kb IBS ahct14.ibs
enable an industry standard method to electronically transport | IBIS Modeling Data between semiconductor notation IS allowed (e.g., 1.2345e-12). | | 9) The I-V data tables should use enough data points around sharply curved | areas of the I-V curves to describe the curvature accurately. In linear
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NXP 01/07/2006 61.46 Kb IBS lvt04.ibs