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DC327A Linear Technology 3.3V Micropower EIA/TIA-562 Transceiver visit Linear Technology - Now Part of Analog Devices
LTC1385CSW Linear Technology LTC1385 - 3.3V Low Power EIA/TIA-562 Transceiver; Package: SO; Pins: 18; Temperature Range: 0°C to 70°C visit Linear Technology - Now Part of Analog Devices Buy
LTC1386CS#PBF Linear Technology LTC1386 - 3.3V Low Power EIA/TIA562 Transceiver; Package: SO; Pins: 16; Temperature Range: 0°C to 70°C visit Linear Technology - Now Part of Analog Devices Buy
LTC1385ISW#TR Linear Technology LTC1385 - 3.3V Low Power EIA/TIA-562 Transceiver; Package: SO; Pins: 18; Temperature Range: -40°C to 85°C visit Linear Technology - Now Part of Analog Devices Buy
LTC1385CSW#PBF Linear Technology LTC1385 - 3.3V Low Power EIA/TIA-562 Transceiver; Package: SO; Pins: 18; Temperature Range: 0°C to 70°C visit Linear Technology - Now Part of Analog Devices Buy
LTC1386IS#TRPBF Linear Technology LTC1386 - 3.3V Low Power EIA/TIA562 Transceiver; Package: SO; Pins: 16; Temperature Range: -40°C to 85°C visit Linear Technology - Now Part of Analog Devices Buy

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EIA/JESD78

Catalog Datasheet MFG & Type PDF Document Tags

kvt22

Abstract: transistor BD 540 JEDEC Spec EIA/JESD78 IC Latchup Test 6. For additional information, see Application Note AND8003/D , Default High q Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test q Moisture Sensitivity Level 1 For
ON Semiconductor
Original
kvt22 transistor BD 540 MC100LVELT22 LVELT22 KVT22 AND8002/D MC100LVELT22D MC100LVELT22DR2

JESD22-B116

Abstract: MIL-STD-883 Method 2019 EIA/JESD78 Electrical Characterization Per Applicable Datasheet Expected Completion Date: Lot , Test Vehicle: QLG-00-07 74LVC16245 Test Bond Pull EIA/JESD22-B116 Die Shear Mil-Std-883, Method 2019 Ball Shear EIA/JESD22-B116 Operating Life Test (Dynamic) Mil-Std-883, Method 1005 85/85(THB) or HAST EIA/JESD22-A110 Pressure Pot EIA/JESD22-A102 Thermal Shock Mil-Std-883, Method 1011
Integrated Device Technology
Original
L0007-04 74LVC16244 74LVCH162244 EIA/JESD22-B116 JESD22-B116 MIL-STD-883 Method 2019 EIA/JESD22-A110 EIA/JESD22-A102

HD4004

Abstract: JESD22-A104-A ) EIA/JESD78 6/0 JESD22-A118 45/0 JESD22-A104-A 75/0 JESD22-A103-B 45/0 Test , EIA/JESD22-A114-A 4/0 ESD: Machine Model @ 200 Volts EIA/JESD22-A115-A 9/0 ESD: Charged
Integrated Device Technology
Original
HD4004 TSI310A JESD22-A114-A Polyimide a103 transistor Tsi310A-133CE IBM DATE CODE I0909-01 TSI310A-133CE TSI310A-133CEY 80B6010 QR004

JESD22-B116

Abstract: MIL-STD-883 method 2019 3015 ESD: CDM Latch-Up Immunity EIA/JESD78 Electrical Characterization Per Applicable Datasheet Lot , Pull EIA/JESD22-B116 Die Shear Mil-Std-883, Method 2019 Ball Shear EIA/JESD22-B116 Operating Life Test (Dynamic) Mil-Std-883, Method 1005 85/85(THB) or HAST EIA/JESD22-A110 Pressure Pot EIA/JESD22-A102 Thermal
Integrated Device Technology
Original
MIL-STD-883 PRESSURE JESD22-A110 JESD22A110 EIA/JESD78

EIAJ-IC-121

Abstract: 0.8um HBM Mil-Std-883, Method-3015 ESD-CDM JESD22-C101 ESD-MM EIAJ-IC-121 Latch-up EIA/JESD78 SS/Acc # Test
Integrated Device Technology
Original
0.8um L0108-01R1 IDTQS3VH125 IDTQS3VH126 IDTQS3VH257 IDTQS3VH2245 IDTQS32XVH2245

L0105-03

Abstract: L0105 -883, Method-3015 ESD-CDM JESD22-C101 ESD-MM EIAJ-IC-121 Latch-up EIA/JESD78 SS/Acc # Test Results 116/0
Integrated Device Technology
Original
L0105-03 L0105 EIAJ-IC-121 Method 20 QS3VH245 QS32XVH245 QS34XVH245 QLG-01-01 QS3VH862
Abstract: Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Symbol VSUPPLY VIN Iout TA TSTG Freescale Semiconductor
Original
MC100ES60T22 MC100ES60T22D MC100ES60T22DR2

Clock Drivers

Abstract: Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Symbol VSUPPLY VIN Iout TA TSTG
Freescale Semiconductor
Original
Clock Drivers

jesd22-b116

Abstract: L9912-04 Mil-Std-883, Method 3015 ESD: CDM Latch-Up Immunity EIA/JESD78 Electrical Characterization Per , Bond Pull EIA/JESD22-B116 Die Shear Mil-Std-883, Method 2019 Ball Shear EIA/JESD22-B116 Operating Life Test (Dynamic) Mil-Std-883, Method 1005 85/85(THB) or HAST EIA/JESD22-A110 Pressure Pot EIA
Integrated Device Technology
Original
L9912-04 l9912

JESD78

Abstract: LCK4310 s Meets or exceeds Joint Electron Device Engineering Council (JEDEC) specification EIA®/ JESD78 , , and VEE pins must be externally connected to a power supply to guarantee proper operation. EIA is
Agere Systems
Original
LCK4310 MC100LVE310 PB03-158LCK PB02-133LCK
Abstract: exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Human Body Model Machine Model 0 LFPM, 20 TSSOP 500 LFPM, 20 Freescale Semiconductor
Original
MC100ES6535 ES6535 20-LEAD 948E-02 MC100ES6535DT MC100ES6535DTR2
Abstract: (Junction-to-Ambient) Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Human Body Model Machine Model 0 LFPM, 20 Freescale Semiconductor
Original
TSSOP-20
Abstract: to Ambient) 0 LFPM, 8 TSSOP 500 LFPM, 8 TSSOP TBD TBD Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Symbol VSUPPLY Parameter Conditions Freescale Semiconductor
Original
MC100ES60T23 MC100ES60T23D MC100ES60T23DR2 MC100ES60T23DTR2 MC100ES60T23DT
Abstract: TSSOP 500 LFPM, 8 TSSOP Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test D D Value 75 k 112.5 k 75 Freescale Semiconductor
Original
Abstract: exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Symbol VSUPPLY VIN Freescale Semiconductor
Original
MC100ES6030 751D-06 MC100ES6030DW MC100ES6030DWR2 SO-20
Abstract: TBD TBD TBD JA Thermal Resistance (Junction to Ambient) Meets or exceeds JEDEC Spec EIA/JESD78 IC Freescale Semiconductor
Original
MC100ES7011P MC100ES7011PD MC100ES7011PDR2
Abstract: exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Symbol VSUPPLY VIN Freescale Semiconductor
Original
MC100ES8011H MC100ES8011HD MC100ES8011HDR2
Abstract: Ambient) Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Freescale Semiconductor
Original
MC100ES8011P MC100ES8011PD MC100ES8011PDR2
Abstract: exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Table 2. Absolute Maximum Ratings1 Symbol VSUPPLY VIN Freescale Semiconductor
Original

ON Semiconductor marking

Abstract: fairchild marking codes sot-23 _C 3. Tested to EIA/JESD22­A114­A 4. Tested to EIA/JESD22­A115­A 5. Tested to JESD22­C101­A 6. Tested to EIA/JESD78 RECOMMENDED OPERATING CONDITIONS Symbol Characteristics Min Max Unit , TSOP5 Package: ­6 mW/_C from 65_ to 125_C 3. Tested to EIA/JESD22­A114­A 4. Tested to EIA/JESD22­A115­A 5. Tested to JESD22­C101­A 6. Tested to EIA/JESD78 RECOMMENDED OPERATING CONDITIONS Symbol , /JESD22­A115­A 5. Tested to JESD22­C101­A 6. Tested to EIA/JESD78 RECOMMENDED OPERATING CONDITIONS Symbol
ON Semiconductor
Original
ON Semiconductor marking fairchild marking codes sot-23 W2D SOT23 SOT-353 MARKING L5 diode w2d marking code vk, sot-363 DLD601/D DLD601

E142 wafer format

Abstract: HEL32 Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Moisture Sensitivity Level 1 For Additional Information
ON Semiconductor
Original
E142 wafer format HEL32 MR 4710 IC HEL05 300w power amplifier circuit diagram HEL12 HEL31 DL140/D

motorola HEP cross reference

Abstract: EPT 4045 JEDEC Spec EIA/JESD78 IC Latchup Test 1. For additional information, see Application Note AND8003/D , 137 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 1. For additional information, refer to , 1/8" 28 to 34 Transistor Count 135 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
ON Semiconductor
Original
motorola HEP cross reference EPT 4045 KPT23 motorola HEP 320 cross reference vef 202 manual KEP52 BR1513/D
Abstract: Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test Moisture Sensitivity Level: Pb = 1 , '0 @ 0.125 in, Oxygen Index: 28 to 34 Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test ON Semiconductor
Original
MC10E157 MC100E157 MC10E/100E157 E157FNG MC10E157/D

IC LM 3210

Abstract: MC100E157 Standard EIA/JESD78 IC Latchup Test Moisture Sensitivity Level: Pb = 1 Pb-Free = 3 For Additional , 34 Meets or Exceeds JEDEC Spec EIA/JESD78 IC Latchup Test Transistor Count = 137 devices Pb-Free
ON Semiconductor
Original
IC LM 3210 MC10E157FN PLCC-28
Abstract: Model; > 200 V Charged Device Model; > 2 kV Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test , Flammability Rating: UL 94 V-0 @ 0.125 in, Oxygen Index: 28 to 34 Meets or Exceeds JEDEC Spec EIA/JESD78 IC ON Semiconductor
Original

MC100E157

Abstract: MC10E157 Body Model; > 1 kV, Machine Model; > 75 V Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test , EIA/JESD78 IC Latchup Test Transistor Count = 137 devices Pb-Free Packages are Available* PLCC
ON Semiconductor
Original
pin diagram ic 4030

T0404

Abstract: T0404-03 HBM Mil-Std-883, Method-3015 ESD-CDM JESD22-C101 ESD-MM EIAJ-IC-121 Latch-up EIA/JESD78 SS/Acc # Test
Integrated Device Technology
Original
T0404-03 IDT82V2082 T0404 mark CA transistor mark code 3015 QFI-03-09 MIL-STD-883 FRA-1509-01 QCA-1795

IDT82P2284BB

Abstract: IDT82P2288BB ) EIA/JESD78 6/0 JESD22-A118 45/0 JESD22-A104-A 75/0 JESD22-A103-B 45/0 Test
Integrated Device Technology
Original
T0403-06 IDT82P2288BB IDT82P2284BB QFI-03-12R1 JESD-22-A110B
Showing first 20 results.