SNJ54BCT8374AJT
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Texas Instruments
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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 |
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SNJ54BCT8374AFK
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Texas Instruments
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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 |
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SN74BCT8374ADW
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Texas Instruments
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Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 |
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TIPD116
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Texas Instruments
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Data Acquisition Block for ECG Systems, discrete LEAD I ECG implementation Reference Design |
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TPS65235-1RUKR
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Texas Instruments
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LNB Voltage Regulator With I2C Interface 20-WQFN -40 to 85 |
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TPS65235-1RUKT
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Texas Instruments
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LNB Voltage Regulator With I2C Interface 20-WQFN -40 to 85 |
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