ISO/TS16949 A9273 JESD22-A104 JESD22-A101 JESD22-B106 JESD22-B102 IEC68-2-20

Zetex Technology Park, Chadderton, Oldham, OL9 9LL, United Kingdom. Telephone No.: +44 (0)161 622 4533 Quality Dept Fax No: +44

Diodes Zetex Semiconductors Limited Zetex Technology Park, Chadderton, Oldham, OL9 9LL, United Kingdom. Telephone No.: +44 (0)161 622 4533 Quality Dept Fax No: +44 (0)161 622 4543 E-mail:dfitton@zetex.com Internet: http://www.zetex.com Date: 17/09/2008 Device Family: Package: Date From: Date To: Diodes Zetex Semiconductors Limited ISO/TS16949 ISO/TS16949:2002 FILE NO. A9273 A9273 Reliability Test Summary RTS No: 1181 MOSFET SOT23 SOT23 & SOT23-6 16/01/2008 28/08/2008 Environmental Trial Data 1 3 5 6 Devices Tested 45 12 225 462 Devices Failed 0 0 0 0 Cumulative Hours 45360 12 226800 44352 % Failures 0.000 0.000 0.000 0.000 1 77 0 1155000 0.000 JESD22-A104 JESD22-A104 4 308 0 310464 0.000 JESD22-A101 JESD22-A101 5 385 0 391776 0.000 JESD22-B106 JESD22-B106 JESD22-B102 JESD22-B102 IEC68-2-20 IEC68-2-20 8 6 1 579 398 45 0 0 0 579 398 45 0.000 0.000 0.000 Trial Type Specification Lots CS (Cold Store) DPA (Destructive Physical Analysis) HS (Hot Store) PCLV (Pre-conditioned Autoclave) PIOL (Pre-conditioned Intermittent Operating Life) PTC (Pre-conditioned Temperature Cycle Air to Air) PTHB (Pre-conditioned Temperature Humidity + Bias) RSHF (Resistance to Solder Heat Float) Solderability Solderability (Post Hot Store) JESD22-A119 JESD22-A119 AEC-Q101-004 AEC-Q101-004 JESD22-A103 JESD22-A103 JESD22-A102 JESD22-A102 MIL-STD-750 MIL-STD-750 Method 1037 Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg C): Ambient Temperature (Deg C): Activation Energy (eV): Confidence Level (%): HTRB (High Temperature Reverse Bias - JESD22-A108 JESD22-A108) 55 150 0.9 60 Actual Device Hours Equivalent Device Hours Lots Devices Tested: Devices Failed: 467544 5.951E+08 6 462 0 Mean Time To Failure (Hours): Failure Rate FITs: Failure Rate %/1000 Hours: 6.495E+08 1.5397 1.540E-04 540E-04 David Fitton Quality Engineer Copyright © 2008 Diodes Zetex Semiconductors Limited Page 1 of 1