ISO/TS16949 A9273 SC70-5 JESD22-A102 JESD22-A103 JESD22-B106 JESD22-A104

Zetex Technology Park, Chadderton, Oldham, OL9 9LL, United Kingdom. Telephone No.: +44 (0)161 622 4533 Quality Dept Fax No: +44

Diodes Zetex Semiconductors Limited Zetex Technology Park, Chadderton, Oldham, OL9 9LL, United Kingdom. Telephone No.: +44 (0)161 622 4533 Quality Dept Fax No: +44 (0)161 622 4543 E-mail:dfitton@zetex.com Internet: http://www.zetex.com Date: 20/08/2008 Device Family: Package: Date From: Date To: Diodes Zetex Semiconductors Limited ISO/TS16949 ISO/TS16949:2002 FILE NO. A9273 A9273 Reliability Test Summary RTS No: 1176 IC REFERENCE SOT23 SOT23 & SC70-5 SC70-5 13/12/2006 12/01/2007 Environmental Trial Data Trial Type Specification Lots Tested Failed CLV (Autoclave) HS (Hot Store) RSHF (Resistance to Solder Heat Float) TC (Temperature Cycle Air to Air) THB (Temperature Humidity + Bias) JESD22-A102 JESD22-A102 JESD22-A103 JESD22-A103 JESD22-B106 JESD22-B106 JESD22-A104 JESD22-A104 JESD22-A101 JESD22-A101 1 1 1 1 1 45 45 45 45 45 0 0 0 0 0 Cumulative Hours 4320 45360 45 45360 45360 Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg C): Ambient Temperature (Deg C): Activation Energy (eV): Confidence Level (%): HTOL (High Temperature Operating Life - JESD22-A108 JESD22-A108) 55 125 0.9 60 Actual Device Hours Equivalent Device Hours Lots Devices Tested: Devices Failed: 408240 1.102E+08 2 90 0 Mean Time To Failure (Hours): Failure Rate FITs: Failure Rate %/1000 Hours: % Failures 0.000% 0.000% 0.000% 0.000% 0.000% 1.203E+08 8.3119 8.312E-04 312E-04 David Fitton Quality Engineer Copyright © 2008 Diodes Zetex Semiconductors Limited Page 1 of 1