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A01013L

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Abstract: the table below. Lot Device Type Test Description A01013L T89C51CC02 SOIC 28 EFR , . Lot Device Type Test Description Step A01013L T89C51CC02 SOIC 28 165°C High Temp , Acceleration T89C51CC02 - A01013L 15 1,0E+07 10 1076331 1,0E+06 LEG END Normal (94541 , provided. Lots Device Type Test Description Step A01013L T89C51CC02 SOIC 28 AMKOR Atmel
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MTBF calculation AT89C5131 Amkor Technology 1999 TS16949 Q100 JESD22-A118 BP70602
Abstract: Test Description A01013L T89C51CC02* SOIC 28 EFR Dynamic Life Test (140°c / 3.7v) LFR , Endurance: Typical 125d distribution Endurance Temperature Acceleration T89C51CC02 - A01013L 1,0E+07 , related to other packages is provided. Lots Device Type Test Description Step A01013L Atmel
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T89C5115 T89C51RD2 Marking AT89C5114 A00470 JESD22-A110 JESD22-A101
Abstract: A00648 A00712 P01709 A00151S A00397Z A00588A A01459 A01460 A01615 A01110C A01110D A01013L Atmel
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MIL-STD-883 Method 3015.7 atmel lot marking eeprom atmel 922 Atmel eeprom Cross Reference atmel 336 DYNAMIC RAM CROSS REFERENCE C5121
Abstract: P01709 A00151S A00397Z A00588A A00712 A01459 A01460 A01110C A01110D A01013L A01110C A01110D Atmel
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AT89C51SND1C atmel lot marking ATMEL 634 AT35500 atmel h 306 transistor WL 431 at56800
Abstract: Endurance Temperature Acceleration T89C51CC02 - A01013L 1,0E+07 1076331 1,0E+06 94415 1,0E+05 Atmel
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AT89C51RD2 AT89C51ED2 AT89C51RD2 -um atmel package marking AT89C51E2 atmel at89c51ed2
Abstract: A01013L 1,0E+07 1076331 1,0E+06 1,0E+05 94415 Nc(50%) 1,0E+04 1,0E+03 25°C 125 Atmel
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T89C51AC2 T89C51CC01 T89C51AC2 ATMEL package qualification