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Part : 1SNA010135R1000 Supplier : ABB Manufacturer : Newark element14 Stock : - Best Price : $15.55 Price Each : $21.55
Part : 1SNA010136R1100 Supplier : ABB Manufacturer : Newark element14 Stock : - Best Price : $15.57 Price Each : $21.57
Part : DBPC1031A010-130 Supplier : Fischer Connectors Manufacturer : Bristol Electronics Stock : 10 Best Price : $86.5350 Price Each : $90.00
Part : S1031A010-132+ Supplier : Fischer Connectors Manufacturer : Bristol Electronics Stock : 24 Best Price : $44.3040 Price Each : $48.00
Part : VA01-0130 PK1012 Supplier : Oeneva Oy Manufacturer : TME Electronic Components Stock : 63 Best Price : $0.54 Price Each : $0.76
Part : VA01-0131 PK1610 Supplier : Oeneva Oy Manufacturer : TME Electronic Components Stock : 98 Best Price : $0.55 Price Each : $0.79
Part : VA01-0132 PK1612 Supplier : Oeneva Oy Manufacturer : TME Electronic Components Stock : 72 Best Price : $0.75 Price Each : $1.08
Part : VA01-0133 PK1614 Supplier : Oeneva Oy Manufacturer : TME Electronic Components Stock : 122 Best Price : $0.75 Price Each : $1.08
Part : VA01-0135 PK18514 Supplier : Oeneva Oy Manufacturer : TME Electronic Components Stock : 20 Best Price : $6.76 Price Each : $9.65
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A01013L

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: the table below. Lot Device Type Test Description A01013L T89C51CC02 SOIC 28 EFR , . Lot Device Type Test Description Step A01013L T89C51CC02 SOIC 28 165°C High Temp , Acceleration T89C51CC02 - A01013L 15 1,0E+07 10 1076331 1,0E+06 LEG END Normal (94541 , provided. Lots Device Type Test Description Step A01013L T89C51CC02 SOIC 28 AMKOR Atmel
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MTBF calculation AT89C5131 Amkor Technology 1999 TS16949 Q100 JESD22-A118 BP70602
Abstract: Test Description A01013L T89C51CC02* SOIC 28 EFR Dynamic Life Test (140°c / 3.7v) LFR , Endurance: Typical 125d distribution Endurance Temperature Acceleration T89C51CC02 - A01013L 1,0E+07 , related to other packages is provided. Lots Device Type Test Description Step A01013L Atmel
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T89C5115 T89C51RD2 Marking AT89C5114 A00470 JESD22-A110 JESD22-A101
Abstract: A00648 A00712 P01709 A00151S A00397Z A00588A A01459 A01460 A01615 A01110C A01110D A01013L Atmel
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MIL-STD-883 Method 3015.7 atmel lot marking eeprom atmel 922 breakdown gate oxide Atmel eeprom Cross Reference atmel 336 C5121
Abstract: P01709 A00151S A00397Z A00588A A00712 A01459 A01460 A01110C A01110D A01013L A01110C A01110D Atmel
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AT89C51SND1C atmel lot marking ATMEL 634 transistor WL 431 atmel h 306 AT35500
Abstract: Endurance Temperature Acceleration T89C51CC02 - A01013L 1,0E+07 1076331 1,0E+06 94415 1,0E+05 Atmel
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AT89C51RD2 AT89C51ED2 AT89C51RD2 -um atmel package marking AT89C51E2 atmel at89c51ed2
Abstract: A01013L 1,0E+07 1076331 1,0E+06 1,0E+05 94415 Nc(50%) 1,0E+04 1,0E+03 25°C 125 Atmel
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T89C51AC2 T89C51CC01 T89C51AC2 ATMEL package qualification