NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: the table below. Lot Device Type Test Description A01013L T89C51CC02 T89C51CC02 SOIC 28 EFR , Lot Device Type Test Description Step A01013L T89C51CC02 T89C51CC02 SOIC 28 165°C High Temp , Acceleration T89C51CC02 T89C51CC02 - A01013L 15 1,0E+07 10 1076331 1,0E+06 LEG END Normal (94541 , provided. Lots Device Type Test Description Step A01013L T89C51CC02 T89C51CC02 SOIC 28 AMKOR ... | Original |
24 pages, |
TSS463 JESD22-A101 JESD22-A110 JESD22-A118 MTBF calculation Q100 T89C51CC02 TS16949 AT89C5114 AT89C5131 T89C51CC02 abstract |
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| Abstract: Test Description A01013L T89C51CC02 T89C51CC02* SOIC 28 EFR Dynamic Life Test (140°c / 3.7v) LFR , Endurance: Typical 125d distribution Endurance Temperature Acceleration T89C51CC02 T89C51CC02 - A01013L 1,0E+07 , related to other packages is provided. Lots Device Type Test Description Step A01013L ... | Original |
24 pages, |
TS16949 AT89C5131 JESD22-A101 JESD22-A110 JESD22-A118 Q100 T89C5115 T89C51RD2 Marking AT89C5114 T89C5115 abstract |
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| Abstract: A00648 A00648 A00712 A00712 P01709 P01709 A00151S A00151S A00397Z A00397Z A00588A A00588A A01459 A01459 A01460 A01460 A01615 A01615 A01110C A01110C A01110D A01110D A01013L ... | Original |
16 pages, |
T89C5121 AT56K Atmel 434 atmel 442 Atmel eeprom Cross Reference atmel plcc package marking PLCC52 SSOP24 T83C5121 T85C5121 A0146 DYNAMIC RAM CROSS REFERENCE Atmel AT35523 Product Reliability Test atmel 922 datasheet abstract |
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| Abstract: A00648 A00648 A00712 A00712 P01709 P01709 A00151S A00151S A00397Z A00397Z A00588A A00588A A00712 A00712 A01459 A01459 A01460 A01460 A01110C A01110C A01110D A01110D A01013L ... | Original |
23 pages, |
0.35uM STI Q100 JESD22-A110 AT89C51SND1C AT35500 ATMEL 634 AT89C51SND1C abstract |
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| Abstract: Endurance Temperature Acceleration T89C51CC02 T89C51CC02 - A01013L 1,0E+07 1076331 1,0E+06 94415 1,0E+05 ... | Original |
24 pages, |
TS16949 AT89C5131 atmel at89c51rd2 ATMEL Packing method failure rate TDDB JESD22-A101 Q100 A00808A JESD22-A110 ATMEL 634 AT89C51ED2 UM AT89C51ED2 atmel at89c51ed2 AT89C51RD2 AT89C51RD2 AT89C51ED2 AT89C51RD2 abstract |
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| Abstract: distribution Endurance Temperature Acceleration T89C51CC02 T89C51CC02 - A01013L 1,0E+07 1076331 1,0E+06 1 ... | Original |
25 pages, |
TS16949 T89C51AC2 Q100 JESD22-A118 JESD22-A101 AT89C5131 T89C51AC2 abstract |
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