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| Catalog Datasheet Results | Type | Document Tags |
| Abstract: Output Tristate control / NC Vcc Reference Standard MIL-STD-883D 1011.9, cond. B JIS-C 7022B-5 7022B-5, Cond. C MIL-STD-883D 1009.8, cond. C MIL-STD-883D 1008 MIL-STD-883D 2002.3, cond. B MIL-STD-883D ... | Original |
2 pages, |
883D mil-std 883d MIL-STD883D Mil-Std-883D VFTX312 VFTX312 abstract |
| Abstract: Mechanical Shock Vibration MIL-STD-883D Method 2003.7 MIL-STD-883D Method 2002 MIL-STD-883D Method , Shock IEC 68-2-20A Method 1B MIL-STD-883D Method 1001 Cyclic Moisture Resistance Fast Temperature Cycling Accelerated Aging (Biased) Damp Heat MIL-STD-883D Method 1004 MIL-STD-883D , MIL-STD-883D Method 2003.7 - No Steam Aging Device PSE6256/03 PSE6256/03 Change in Sensitivity (dB)* - 1.4 Change , and Vibration Mechanical Shock - MIL-STD-883D Method 2002 - Condition B 500 g, 1.0 ms, 5 times/axis ... | Original |
6 pages, |
UL-94-VO SG608 SDX1155 mil-std 883d method 1010 CDX2622 CDX2155 Mil-Std-883D TA-NWT-000983 CDX2155 abstract |
| Abstract: using the IEC 61000-4-2 contact discharge method. Using the MIL-STD-883D (Method 3015) specification , withstand voltage*: Human Body Model (MIL-STD -883D , method 3015) � IEC 61000-4-2, contact discharge method � Clamping voltage during ESD discharge Positive MIL-STD -883D (Method 3015), 8kV Negative ... | Original |
2 pages, |
sot23-5 marking pac 30KV 20KV DIODE 20KV mil-std 883d DN046 HIGH VOLTAGE DIODE 20kv DN042/043/044/046 DN042/043/044/046 abstract |
| Abstract: seconds (maximum) Reference Standard MIL-STD-883D 1011.9, cond. B JIS-C 7022B-5 7022B-5, Cond. C JIS-C-5021 JIS-C-5021 MIL-STD-883D 2002.3, cond. B MIL-STD-883D 2007.2, cond. B 75 South Street, Hopkinton, MA 01748 � ... | Original |
3 pages, |
VFTX332 VCTCXO 12.8Mhz TCXO 20MHz TCXO 26MHz tcxo 13MHz tcxo 10mhz dbc Mil-Std-883D 12,8MHz VFTX332 abstract |
| Abstract: rated at 20kV ESD using the IEC 61000-42 contact discharge method. Using the MIL-STD-883D (Method 3015 , In-system ESD withstand voltage*: Human Body Model (MIL-STD-883D, method 3015) � IEC 61000-4-2, contact discharge method � Clamping voltage during ESD discharge Positive MIL-STD-883D (Method 3015), 8kV ... | Original |
2 pages, |
PACDN046 PACDN045 PACDN044 PACDN043 PACDN042 HIGH VOLTAGE DIODE 20kv PACDN042/043/ MIL-STD-883D PACDN042/043/ abstract |
| Abstract: international standard (Level 4, 8kV contact discharge). Using the MIL-STD-883D (Method 3015) specification , In-system ESD withstand voltage*: Human Body Model (MIL-STD-883D, method 3015) IEC 61000-4-2, contact , * MIL-STD-883D (Method 3015), 8kV 13 V Capacitance at 0V dc, 1MHz 45 pF Temperature Range ... | Original |
2 pages, |
PACDN3401C P0402FC05C PACDN3401C abstract |
| Abstract: : 3DSD1280-323H 3DSD1280-323H /883D-S DC : 2599 ORDERING INFORMATION - Serial Number on request 3DSD1280-323H/PROTO 3DSD1280-323H/PROTO CQFJ 84 - prototype ( 0°C to +70°C ) 3DSD1280-323H/883D-S CQFJ 84 - MIL STD 883D - Class S , MIL-STD-883D Class S screening temperature range : -15°C to +80° The 3DSD1280-323H 3DSD1280-323H is a highly integrated ... | Original |
2 pages, |
3DSD1280-323H 3D marking airborn A12 marking 3d plus 3DSD1280-323H abstract |
| Abstract: liquid. -65°C to +150°C 100 cycles Solderability Mil Std 883D, M2003 M2003 (245°C ±5°C) Lead Integrity Mil Std 883D, M2004 M2004 Lid Torque Mil Std 883D, M2024 M2024 Marking Permanency Mil Std 883D, M2015 M2015 16 leads Salt Atmosphere Mil Std 883D, M1009 M1009 15 leads ESD, Human Body Model Mil Std 883D, M3015 M3015 12 leads 15 leads (Hermetic ) 24 hours (Hermetic) Table 3-B. Long-Term ... | Original |
4 pages, |
vishay siliconix M2015 M2004 M2003 M1009 M2024 7086 04-May-99 datasheet abstract |
| Abstract: Status D1 Solderability MIL-STD 883D Method 2003.7 D1 Connector Mate/Demate Mechanical Shock No Steam Aging 200 cycles D2 Mechanical Integrity D2 MIL-STD-883D Method 2007 D3 , MIL-STD-883D Method 1001 MIL-STD-883D Method 1004 MIL-STD-883D Method 1010 D1 D1 Flammability , hrs. MIL-STD-883D Method 2002 Complete No. Tested 11 Complete 11 11 +40°C/95% , Appendix B Solderability MIL STD 883D Method 2003.7 No Steam Aging Device SD668203 SD668203 SD668204 SD668204 ... | Original |
9 pages, |
UL-94-VO TA-NWT-000983 SDX1155B SDX1155 IEC-68-2-20 FDX1125B SE621 sd667 SDX1155B abstract |
| Abstract: 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) MIL-STD-750D MIL-STD-750D: 1026 MIL-STD-883D: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 � 2.t=1000 hrs (-24hrs, +72hrs) MIL-STD-883D:1008 JIS C 7021: B-10 , MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1011 MIL-STD-202F MIL-STD-202F: 208D MIL-STD-750D MIL-STD-750D: 2026 MIL-STD-883D: 2003 IEC 68 Part 2-20 JIS C 7021: A-2 MIL-STD-202F MIL-STD-202F: 107D MIL-STD-750D MIL-STD-750D: 1051 MIL-STD-883D: 1010 JIS C 7021: A-4 ... | Original |
8 pages, |
datasheet abstract |
| Abstract: Special Tests D2 Fiber Pull D1 RGA 550 Reference IEC 68-2-20A Method 1B MIL-STD-883D Method 2002 MIL-STD-883D Method 2007 MIL-STD-883D Method 2002 MIL-STD-883D Method 2003.7 MIL-STD-883D Method 1001 MIL-STD-883D Method 1004 MIL-STD-202 MIL-STD-202 Method 103 MIL-STD-883D Method 1010 Condition , cycles 20 cycles UL-94-VO UL-94-VO H.B.M. 500 V 1 kg x 3 times MIL-STD-883D 5000 ppm limit Method 1018 , Reference D4 Mechanical Shock Condition Status No. No. Tested Passed MIL-STD-883D Cond. B ... | Original |
11 pages, |
LST3921 LST3821 LST292X LST282X HFBR 5000 CMAC 20063 197412 210895 QP0044 LST292X abstract |
| Abstract: 61000-4-2 contact discharge method. Using the MILSTD-883D (Method 3015) specification for Human Body Model , (MIL-STD-883D, method 3015 IEC 61000-4-2, contact discharge method ±30 ±25 kV kV Clamping voltage during ESD discharge MIL-STD-883D (Method 3015), 8kV 12 8 V V 30 pF Positive Negative , ESD withstand voltage*: Human Body Model (MIL-STD-883D, method 3015 IEC 61000-4-2, contact discharge method ±30 ±18 kV kV Clamping voltage during ESD discharge MIL-STD-883D (Method 3015), 8kV ... | Original |
3 pages, |
PACDN2408C PACDN1408C without underfill PACDN1408C abstract |
| Abstract: MIL-STD-883D 1011.9, cond. B JIS-C 7022B-5 7022B-5, Cond. C JIS-C-5021 JIS-C-5021 MIL-STD-883D 2002.3, cond. B MIL-STD-883D ... | Original |
3 pages, |
883-D 19.44MHz TCXO 16.384MHZ tcxo 13MHz STRATUM* vftx332 12.8mhz vftx332 VFTX332 VFTX332 abstract |
| Abstract | Saved from | Date Saved | File Size | Type | Download |
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| to MIL STD 883D, Method 3051.7. 43 K 09.98 LB 5436 Colorless, clear package taped on reel. ESD withstand voltage of 2 kV according to MIL STD 883D, Method 3051.7. 43 K 09 STD 883D, Method 3051.7. 65 K 11.98 LB 3356 Colorless, diffused packag. For use of 2 kV according to MIL STD 883D, Method 3051.7. 45 K 09.98 LB 3336 Colorless stand-off. Available taped on reel. ESD withstand voltage of 2 kV according to MIL STD 883D, Method 3051 www.datasheetarchive.com/files/infineon/products/37/37010.htm |
Infineon | 26/11/1998 | 7.56 Kb | HTM | 37010.htm |
| Worst Case ESD Mil-Std-883D Method 3015 www.datasheetarchive.com/files/xilinx/docs/wcd00007/wcd00720.htm |
Xilinx | 17/07/1998 | 3.63 Kb | HTM | wcd00720.htm |
| Worst Case ESD Mil-Std-883D Method 3015 www.datasheetarchive.com/files/xilinx/docs/wcd00007/wcd0078d-v1.htm |
Xilinx | 16/02/1999 | 3.72 Kb | HTM | wcd0078d-v1.htm |
| MIL STD 883D, Method 3015.7. JEDEC Level 2. White colored SMT package. Suitable for all SMT assembly tape). ESD withstand voltage of 2 kV according to MIL STD 883D, Method 3015.7. JEDEC Level 2. 43 K -soldering methods. Available taped on reel (8 mm tape). ESD withstand voltage of 2 kV according to MIL STD 883D withstand voltage of 2 kV according to MIL STD 883D, Method 3015.7. JEDEC Level 2. 42 K 09 . Available taped on reel (8 mm tape). ESD withstand voltage of 2 kV according to MIL STD 883D, Method 3015 www.datasheetarchive.com/files/infineon/products/37/3711.htm |
Infineon | 26/11/1998 | 24.27 Kb | HTM | 3711.htm |
| No abstract text available www.datasheetarchive.com/download/72423303-837043ZC/p883d.jpg |
STMicroelectronics | 13/09/2000 | 12.86 Kb | JPG | p883d.jpg |
| No abstract text available www.datasheetarchive.com/download/3223807-837044ZC/p883d-v1.jpg |
STMicroelectronics | 29/01/2001 | 0.84 Kb | JPG | p883d-v1.jpg |
| ST | STMicroelectronics Introduces Piezoelectric Actuator Driver IC Targeting Dual Servo Hard Disk Drives | P883D STMicroelectronics Introduces Piezoelectric Actuator Driver IC Targeting Dual Servo Hard Disk Drives Produced in 90V BCD technology, driver chip generates +/-35V /-35V /-35V /-35V from 5V supply, simplifying use of piezo actuator for fine head positioning www.datasheetarchive.com/files/stmicroelectronics/stonline/press/news/year2000/p883d.htm |
STMicroelectronics | 13/09/2000 | 4.97 Kb | HTM | p883d.htm |
| New Test Method for Low Dose Rate Applications Getting Realistic Test Results for Low Dose Rate Applications It is long recognized that MIL-STD-883D, Method 1019.4 does not accurately predict a microcircuit's low dose rate irradiation response. In particular, the standby leakage (ICC) and/or TRI-STATE® leakage currents are inaccurately represented. The present Test Method 1019.4 uses a stated dose rate range of 50 - 300 rad(Si)/s which generates induced radiation leakage current www.datasheetarchive.com/files/national/docs/wcd00012/wcd0121f.htm |
National | 03/04/1998 | 5.93 Kb | HTM | wcd0121f.htm |
| Device Results CD Home | Military/Space - Military ICs - Standard /883 - D/A Converters Device Datasheet Link Device Description Package 80C286/883 80C286/883 80C286/883 80C286/883 High Speed, Monolithic D/A Converter with Reference 24 Ld SBDIP *Data listed above is for reference only, please refer to Product Data Sheets for current specifications. www.datasheetarchive.com/files/intersil/device_pages/parametric_7025.html |
Intersil | 17/09/2006 | 2.14 Kb | HTML | parametric_7025.html |
| 1000-4-2 level 4 MIL STD 883D-Method 3015-7 : class 3. (human body model) COMPLIES WITH THE FOLLOWING CL slope :1 / R d Symbol Parameter Test conditions Value Unit V PP ESD discharge MIL STD 883D www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6548-v1.htm |
STMicroelectronics | 02/04/1999 | 8.67 Kb | HTM | 6548-v1.htm |