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40H-721-052-037

Catalog Datasheet MFG & Type PDF Document Tags

ta3842

Abstract: APPLICATION CD4094 40H-721-050-001 40H-721-050-026 40H-721-050-202 40H-721-052-037 GROUP D 40H-721-052-039 GROUP C
Harris Semiconductor
Original
ta3842 APPLICATION CD4094 CD40110 equivalent cd40110 87XXXX 211026001 02-JUN-1997

APPLICATION CD4094

Abstract: ta3842 40H-721-050-026 40H-721-050-202 40H-721-052-037 GROUP D 40H-721-052-039 GROUP C 40H-721-053-005 40H-721-054-001
Harris Semiconductor
Original
tA 1507 989XXXX TA384 icl7667 die ta1313 51122A 19-SEP-1997

nikon STEPPER

Abstract: 40F-701-1-15 40H-721-052-037 QML, JAN, DESC/883, QCI Inspection Procedures (Domestic) QML, JAN, DESC/883, Group A Inspection
Harris Semiconductor
Original
nikon STEPPER 40F-701-1-15 MIL-STD-883 method 5003 71007 harris top marking product change notification INCOMING MATERIAL INSPECTION procedure DOC004 DOC005 210XXX 710-010-XX 40F-400-0-0

MIL-STD-883 method 5003

Abstract: TM2004 . QUALITY SUPPORT DOCUMENTS 240111 40H-721-010-001 863009 40H-721-052-034 40H-721-052-037 QML, JAN, DESC
Harris Semiconductor
Original
TM2004 TM1011 marking 25b ACT-R01 Harris top marking 54XXXX