NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
MIL-PRF-19500/574B MIL-S-19500/574A 1N6497 1N6498 1N6499 1N6503 1N6504 1N6505 - Datasheet Archive
The documentation and process conversion measures necessary to comply with this revision shall be completed by 30 January 1999
INCH-POUND The documentation and process conversion measures necessary to comply with this revision shall be completed by 30 January 1999 MIL-PRF-19500/574B MIL-PRF-19500/574B 30 October 1998 SUPERSEDING MIL-S-19500/574A MIL-S-19500/574A(USAF) 1 December 1994 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, DIODE, LIGHT EMITTING TYPES 1N6497 1N6497, 1N6498 1N6498, 1N6499 1N6499, 1N6503 1N6503, 1N6504 1N6504, AND 1N6505 1N6505 JAN AND JANTX This specification is approved for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the performance requirements for red, yellow, and green light-emitting diodes (LED) with internal current regulation requiring no external resistors for operation on any voltage from 3 V dc to 30 V dc. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500 MIL-PRF-19500. 1.2 Physical dimensions. See figure 1 for 1N6497 1N6497 through 1N6499 1N6499 and figure 2 for 1N6503 1N6503 through 1N6505 1N6505. 1.3 Maximum ratings. VF V(BR) PFM 1/ Top and Tstg IR = 10 µA dc V dc V dc mW(pk) °C 30 5 225 -65 to +100 1/ Derate at 3.0 mW/°C above +25°C. 1.4 Characteristics, radiometric (physical), and photometric (visual). Color VF IV = 0° IF V IR VR = 3 V C VR = 0 V V dc Type mcd min mA dc nm µA dc pF Min 1N6497 1N6497, 1N6503 1N6503 1N6498 1N6498, 1N6504 1N6504 1N6499 1N6499, 1N6505 1N6505 Red Yellow Green 20 20 25 .5 .5 .4 Max Min Max 3.5 3.5 3.5 7.5 7.5 7.5 595 570 525 695 595 580 1 1 1 500 500 500 Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAT, 3990 East Broad Street, Columbus, OH 43216-5000, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter. AMSC N/A DISTRIBUTION STATEMENT A. Approved for public release, distribution is unlimited. FSC 5980 MIL-PRF-19500/574B MIL-PRF-19500/574B Dimensions Ltr Inches Min Max Millimeters Min Max A .093 .099 2.36 2.51 A1 .003 .005 0.08 0.13 B .385 .445 9.78 11.30 C .112 .128 2.84 3.25 D .045 Nominal .100 BSC 2.54 BSC 3 1.14 Nominal e g .020 .022 0.51 0.56 h .018 .022 0.46 0.56 J .123 .127 3.12 3.23 K .015 .045 0.38 1.14 L .125 .145 3.18 3.68 M .075 .082 1.90 2.08 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. The front and back pins are recessed on the two sides to prevent shorting of an adjacent device. 4. The basic pin spacing is between centerlines. FIGURE 1. Physical dimensions for types 1N6497 1N6497, 1N6498 1N6498, and 1N6499 1N6499. 2 Notes 4 MIL-PRF-19500/574B MIL-PRF-19500/574B Dimensions Ltr Inches Min Max Millimeters Min Max A .093 .099 2.36 2.51 A1 .003 .005 0.08 0.13 B .385 .445 9.78 11.30 C .312 .328 7.92 8.33 D .045 Nominal .300 BSC 7.62 BSC g .020 .022 0.51 0.56 h .018 .022 0.46 0.56 J .123 .127 3.12 3.23 K .015 .045 0.38 1.14 L .125 .145 3.18 3.68 M .075 .082 1.90 2.08 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. The front and back pins are recessed on the two sides to prevent shorting of an adjacent device. 4. The basic pin spacing is between centerlines. FIGURE 2. Physical dimensions for types 1N6503 1N6503, 1N6504 1N6504, and 1N6505 1N6505. 3 1.14 Nominal e 3 Notes 4 MIL-PRF-19500/574B MIL-PRF-19500/574B 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-19500 MIL-PRF-19500 - Semiconductor Devices, General Specification for. STANDARD MILITARY MIL-STD-750 MIL-STD-750 - Test Methods for Semiconductor Devices. (Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for related associated specifications or specification sheets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Devices furnished under this specification shall be products that are authorized by the qualifying activity for listing on the applicable qualified products list before contract award (see 4.2 and 6.3). 3.2 Associated specification. The individual item requirements shall be in accordance with MIL-PRF-19500 MIL-PRF-19500 and as specified herein. 3.3 Abbreviations, symbols and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-19500 MIL-PRF-19500, MIL-STD-1241 MIL-STD-1241, and as follows: a. IFM . Forward current (the subscript M indicates maximum). b. PFM Forward power dissipation (the subscript M indicates maximum) c. IV . Luminous intensity (the subscript V is used to designate a photometric or visual quantity to differentiate from I and used herein for current). d. mcd. Milli-candela; the candela is a unit of luminous intensity defined such that the luminance of a blackbody radiator at the temperature of solidification of platinum is 60 candelas per square centimeter. e. V . Peak radiometric wavelength of diode light emission. f. . The angle at or off the axis of symmetry of a light source at which luminous intensity is measured. g. LED . Light emitting diode. 4 MIL-PRF-19500/574B MIL-PRF-19500/574B 3.4 Interface requirements and physical dimensions. The interface requirements and physical dimensions shall be as specified in MIL-PRF-19500 MIL-PRF-19500 and on figures 1 and 2 herein. 3.4.1 Terminal lead length. Terminal lead lengths other than that specified on figure 1 may be furnished when so stipulated in the acquisition document (see 6.2) where the devices covered herein are required directly for particular equipment-circuit installation or for automatic-assembly-technique programs. 3.4.2 Lead material and finish. Lead finish shall be solderable as defined in MIL-PRF-19500 MIL-PRF-19500, MIL-STD-750 MIL-STD-750, and herein. Where a choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2). 3.5 Marking. Marking shall be in accordance with MIL-PRF-19500 MIL-PRF-19500. 3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in 1.3, 1.4, and table I herein. 3.7 Electrical test requirements. The electrical test requirements shall be the subgroups specified in 4.4.2 and 4.4.3 herein. 4. VERIFICATION 4.1 Classification of inspections. The inspection requirements specified herein are classified as follows: a. Qualification inspection (see 4.2). b. Screening (see 4.3) c. Conformance inspection (see 4.4). 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 MIL-PRF-19500. 4.3 Screening (JANTX level only). Screening shall be in accordance with MIL-PRF-19500 MIL-PRF-19500 (Appendix E, table IV), and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I herein shall not be acceptable. Screen (see appendix E, table IV, of MIL-PRF-19500 MIL-PRF-19500) Measurements JANTX level 7 9 and 10 Method 1071, fine leak, test condition H (leak testing 30 minutes after pressurization is acceptable). Method 1071, gross leak, test condition C, except that leak indicator fluid shall be maintained at +100°C ± 5°C. Not applicable. 11 Table I, group A, subgroup 2 12 VF = 30 mA dc; TA = +25°C, t = 96 hours 13 Subgroup 2 of table I herein; IV1 = -20 percent of initial readings. I F = ± 1 mA dc. 4.3.1 Process and power conditioning. JANTX diodes shall be subjected to the 100-percent inspection specified in table I, in the order shown. 4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 MIL-PRF-19500. 5 MIL-PRF-19500/574B MIL-PRF-19500/574B 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table V of MIL-PRF-19500 MIL-PRF-19500, and table I herein. 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in appendix E, table VIb (JANTX only) of MIL-PRF-19500 MIL-PRF-19500 and as specified herein. Electrical measurements (end-points) shall be in accordance with the inspections of table I, group A, subgroup 2 herein. 4.4.2.1 Group B inspection, appendix E, table VIb (JANTX only) of MIL-PRF-19500 MIL-PRF-19500. Subgroup Method Condition 2 1051 Test condition A, except T(high) = +100°C (10 cycles); time at temperature extremes 15 minutes minimum. 2 1071 Fine leak: test condition H (leak testing 30 minutes after pressurization is acceptable). Gross leak: test condition C, except that leak indicator fluid shall be maintained at +100°C ± 5°C. 3 1027 IF = 35 mA dc; TA = +25°C; t = 340 hours. 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in appendix E, table VII of MIL-PRF-19500 MIL-PRF-19500 and as follows. Electrical measurements (end-points) shall be in accordance with the inspections of table I, group A, subgroup 2 herein. 4.4.3.1 Group B inspection, appendix E, table VII of MIL-PRF-19500 MIL-PRF-19500. Subgroup Method Condition 2 1056 Test condition A. 2 2036 Test condition E. 2 1071 Fine leak: test condition H (leak testing 30 minutes after pressurization is acceptable). Gross leak: test condition C, except that leak indicator fluid shall be maintained at +100°C ± 5°C. 3 2016 Nonoperating; 1,500 g's; t = 0.5 ms; 5 blows in each orientation: X1, Y1, and Y2. 3 2056 Nonoperating. 3 2006 Nonoperating; 20,000 g's; X1, Y1, and Y2. 5 1026 IF = 35 mA dc; TA = +25°C. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows. 4.5.1 Luminous intensity. This measurement is made with a photometer described, calibrated, and operated as follows. 4.5.1.1 Description of photometer. 4.5.1.1.1 Type of response. The photometer shall be of a type that is designed to respond to illuminance or (luminous incidence), that is, incident luminous flux density or lumens per unit area. Units for luminous incidence are lux (lm/m2). The output of the photometer shall be linearly related to luminous incidence over the range of levels encountered in calibration and measurement. The output may be a voltage or a current, or may be rendered directly in the units of luminous incidence. 6 MIL-PRF-19500/574B MIL-PRF-19500/574B TABLE I. Group A inspection. Inspection 1/ MIL-STD-750 MIL-STD-750 Method Subgroup 1 Symbol Conditions Limits Min Unit Max 2071 Visual and mechanical inspection Subgroup 2 = 0° (see 3.3f and 4.5.3), VF = 5 V dc Luminous intensity mcd IV 0.5 0.5 0.4 1N6497 1N6497, 1N6498 1N6498 1N6503 1N6503, 1N6504 1N6504 1N6499 1N6499, 1N6505 1N6505 Reverse current 4016 DC method; VR = 3 V dc IR Forward voltage 4026 DC method 1.0 IF µA dc mA dc 1N6497 1N6497,1N6498 1N6498,1N6499 1N6499 1N6503 1N6503,1N6504 1N6504,1N6505 1N6505 VF = 30 V dc 3.5 7.5 1N6497 1N6497,1N6498 1N6498,1N6499 1N6499 1N6503 1N6503,1N6504 1N6504,1N6505 1N6505 VF = 5 V dc 3.5 7.5 mA dc Subgroup 3 High temperature: TA = +100°C Luminous intensity = 15° (see 3.3f and 4.5.1) IV2 mcd VF = 5 V dc 1N6499 1N6499, 1N6505 1N6505 0.25 VF = 5 V dc 1N6497 1N6497, 1N6498 1N6498 1N6503 1N6503, 1N6504 1N6504 0.2 Reverse current 4016 DC method; VR = 3 V dc IR Forward voltage 4026 DC method IF 1N6497 1N6497,1N6498 1N6498,1N6499 1N6499 1N6503 1N6503,1N6504 1N6504,1N6505 1N6505 1N6497 1N6497,1N6498 1N6498,1N6499 1N6499 1N6503 1N6503,1N6504 1N6504,1N6505 1N6505 VF = 30 V dc VF = 5 V dc See footnote at end of table. 8 1.0 3.0 µA dc mA dc MIL-PRF-19500/574B MIL-PRF-19500/574B TABLE I. Group A inspection - Continued. Inspection 1/ MIL-STD-750 MIL-STD-750 Method Symbol Conditions Limits Min Unit Max Subgroup 3 - Continued Low temperature: TA = -55°C Reverse current 4016 DC method; VR = 3 V dc IR 1.0 µA dc Forward voltage 4026 DC method IF 15.0 mA dc C 500 pF 1N6497 1N6497,1N6498 1N6498,1N6499 1N6499 1N6503 1N6503,1N6504 1N6504,1N6505 1N6505 VF = 30 V dc VF = 5 V dc 1N6497 1N6497,1N6498 1N6498,1N6499 1N6499 1N6503 1N6503,1N6504 1N6504,1N6505 1N6505 Subgroup 4 Capacitance 4001 VR = 0; f = 1 MHz Subgroups 5, 6, and 7 Not applicable 1/ For sampling plans, see MIL-PRF-19500 MIL-PRF-19500. 9 MIL-PRF-19500/574B MIL-PRF-19500/574B 5. PACKAGING 5.1 Packaging. Packaging shall prevent mechanical damage of the devices during shipping and handling and shall not be detrimental to the device. When actual packaging of material is to be performed by DoD personnel, these personnel need to contact the responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the Inventory Control Points' packaging activity within the Military Department or Defense Agency, or within the Military Departments' System Command. Packaging data retrieval is available from the managing Military Departments' or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 5.2 Marking. Unless otherwise specified (see 6.2), marking shall be in accordance with MIL-PRF-19500 MIL-PRF-19500. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.) 6.1 Notes. The notes specified in MIL-PRF-19500 MIL-PRF-19500 are applicable to this specification. 6.2 Acquisition requirements. See MIL- PRF-19500 PRF-19500. 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Products List QPL No.19500 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from Defense Supply Center Columbus, ATTN: DSCC-VQE, 3990 East Broad Street, Columbus, OH 43216-5000. 6.4 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. Custodians: Air Force - 17 Preparing activity: DLA - CC Review activities: Air Force - 85, 99 (Project 5980-0019) 10