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511-49BJ01-102 Honeywell Sensing and Control 500 Series air/gas temperature probe, NTC, 1,000 Ohm, ±20.0% tolerance, 25 °C [77 °F] accuracy, plastic, adhesion, flying leads (two), 24 gauge PVC insulation, 305 mm [12 in] pdf Buy

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1149.1 Datasheet

Part Manufacturer Description PDF Type Ordering
1149.1 Texas Instruments JTAG/IEEE 1149.1 Design Considerations
ri

13 pages,
94.94 Kb

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1149.1 Texas Instruments Hierarchically Accessing 1149.1 Applications in a System Environment
ri

12 pages,
872.5 Kb

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1149.1 Texas Instruments A Proposed Method of Accessing 1149.1 in a Backplane Environment
ri

13 pages,
1066.23 Kb

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1149.1 Texas Instruments Partitioning Designs With 1149.1 Scan Capabilities
ri

14 pages,
471.68 Kb

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114-91-210-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount
ri

1 pages,
36.18 Kb

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114-91-304-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount
ri

1 pages,
36.18 Kb

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114-91-306-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount
ri

1 pages,
36.18 Kb

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114-91-308-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount
ri

1 pages,
36.18 Kb

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114-91-308-41-134161 PRECI-DIP Dual-in-line sockets and headers / open frame / surface mount pick and place
ri

1 pages,
32.72 Kb

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114-91-310-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount
ri

1 pages,
36.18 Kb

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1149.1

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: 1149.1-1990 was ratified in September 1994. AL 10Sept.-97 1149.1(JTAG)-Tut.I-42 1997 TI Test Symposium , JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory JTAG (IEEE 1149.1/P1149.4) Tutorial Introductory AL 10Sept.-97 1149.1(JTAG)-Tut.I-1 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149 , Applications For More Information Q&A AL 10Sept.-97 1149.1(JTAG)-Tut.I-2 (10 minutes) (5 minutes) (10 minutes) 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory What Is JTAG ... Texas Instruments
Original
datasheet

46 pages,
398.68 Kb

SATV002 P-1149 ieee embedded system papers free ieee 1149.1 jtag boundary scan electronics parts tutorial ABT18502 symposium SN74BCT8244 1/P1149 TEXT
datasheet frame
Abstract: IEEE 1149.1 (JTAG) Boundary-Scan Testing ® in Altera Devices August 1999, ver. 4.04 , IEEE Std. 1149.1-1990 specification. This boundary-scan test (BST) architecture offers the capability , boundary-scan testing. Figure 1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In , . 1149.11990 specification by providing BST capability for input, output, and dedicated configuration pins. Altera Corporation A-AN-039-04.04 1 AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera ... Altera
Original
datasheet

29 pages,
321.87 Kb

altera jtag ii EPF7128S EPF81500A EPF8282A EPF8282AV EPF8636A EPF8820A EPM7032S EPM7064S EPM7128S FLEX controller vhdl code download register epm9320 IEEE 1149.1 JTAG testing of diode TEXT
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Abstract: ® IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices Application Note 39 August , developed a specification for boundary-scan testing that was later standardized as the IEEE 1149.1-1990 , 1. IEEE 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Pin Signal , Table 1 summarizes Altera devices that comply with the IEEE 1149.1-1990 specification by providing BST , AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices Table 1. Altera Devices with BST ... Altera
Original
datasheet

29 pages,
278.46 Kb

TEXT
datasheet frame
Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices MII51014-1 MII51014-1.7 Introduction As , specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification , Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Serial Data Out , Device 2 This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in MAX® II devices. The topics are as follows: "IEEE Std. 1149.1 Boundary-Scan Register" on page 13­3 "IEEE Std ... Altera
Original
datasheet

18 pages,
257.95 Kb

BSDL ieee 1532 MII51014-1 TEXT
datasheet frame
Abstract: . 1149.1-compliant MAX II devices, see the Altera web site at www.altera.com. The IEEE Std. 1149.1 BST , Chapter 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices MII51014 MII51014 , specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification , 13­1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Serial Data , IEEE Std. 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST ... Altera
Original
datasheet

21 pages,
215.53 Kb

MII51014-1 TEXT
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Abstract: 14. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Cyclone II Devices CII51014-2 CII51014-2.1 Introduction , specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification , Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Core Logic JTAG , Connection JTAG Device 2 14­1 IEEE Std. 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in CycloneTM II devices, including: IEEE ... Altera
Original
datasheet

20 pages,
210.97 Kb

VHDL code for TAP controller CII51014-2 TEXT
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Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing in Stratix III Devices SIII51013-1 SIII51013-1.9 This chapter discusses how to use the IEEE Std. 1149.1 boundary-scan test (BST) circuitry in Stratix® III devices. The , 13­1 shows the concept of BST. Figure 13­1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell , Tested Connection JTAG Device 2 In addition to BST, you can use the IEEE Std. 1149.1 controller , feature of the IEEE Std. 1149.1 circuitry. f For information about configuring Stratix III devices by ... Altera
Original
datasheet

22 pages,
398.8 Kb

TMS 1100 EP3SE50 1.9 TDI ic tms 1000 SIII51013-1 TEXT
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Abstract: 9. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Stratix II & Stratix II GX Devices SII52009 SII52009 , boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This Boundary-Scan , 9­1 illustrates the concept of BST. Figure 9­1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan , . 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in Stratix® II and Stratix GX devices, including: IEEE Std. 1149.1 BST architecture IEEE ... Altera
Original
datasheet

22 pages,
203.65 Kb

SII52009-3 TEXT
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Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Arria GX Devices AGX52013-1 AGX52013-1.2 Introduction , boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This Boundary-Scan , 13­1 illustrates the concept of BST. Figure 13­1. IEEE Std. 1149.1 Boundary-Scan Testing , Introduction This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in ArriaTM GX devices, including: IEEE Std. 1149.1 BST architecture IEEE Std. 1149.1 boundary-scan register ... Altera
Original
datasheet

22 pages,
212.08 Kb

vhdl code for phase shift AGX52013-1 TEXT
datasheet frame
Abstract: IEEE 1149.1 (JTAG) Boundary-Scan Testing ® in Altera Devices September 2000, ver. 4.05 , IEEE Std. 1149.1 specification. This boundary-scan test (BST) architecture offers the capability to , testing. Figure 1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC , . 1149.1 specification by providing BST capability for input, output, and dedicated configuration pins. Altera Corporation A-AN-039-04.05 1 AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera ... Altera
Original
datasheet

29 pages,
260.41 Kb

EPM7064S EPM7032S EPF8636A EPF8282AV EPF8282A TEXT
datasheet frame

Archived Files

Abstract Saved from Date Saved File Size Type Download
432 Full production       SCAN162512SM SCAN162512SM Low Voltage Universal 16-bit IEEE 1149.1 Bus Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs FBGA 64 Full production 1K+ $4.2500   SCAN16512SM SCAN16512SM Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs FBGA 64 Full production 1K+ $4.2500   SCANH162512 SCANH162512 MDC Low Voltage Universal 16-bit IEEE 1149.1 Bus
/datasheets/files/national/htm/nsc02691-v5.htm
National 01/11/2002 44.05 Kb HTM nsc02691-v5.htm
Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs FBGA 64 Full production 1K+ $4.2500   SCAN162512SMX SCAN162512SMX Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs FBGA 64 Full production 1K+ $4.2500   SCAN16512SMX SCAN16512SMX Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs FBGA 64 Full production 1K+ $4.2500
/datasheets/files/national/htm/nsc03779.htm
National 16/08/2002 38.33 Kb HTM nsc03779.htm
1149.1 continues on-line Surf the net for TI testability support TI'S home page: http Select IEEE 1149.1/JTAG/Boundary Scan Texas Instruments offers several IEEE 1149.1 Page on the World Wide Web. What's available on-line? Device listing of TI's IEEE 1149.1 , which introduces the fundamentals of the IEEE 1149.1 boundary-scan standard, including architecture 1149.1 and how it works, using DFT in ASICs, IEEE 1149.1 data formats (including BSDL), and application
/datasheets/files/texas-instruments/data/sc/docs/integrat/95oct/internet.htm
Texas Instruments 08/02/1999 3.97 Kb HTM internet.htm
Texas Instruments IEEE 1149.1/JTAG/Boundary Scan IEEE 1149.1 Product Families: Silicon products Software products Educational products IEEE 1149.1 Literature: Application Reports IEEE 1149.1 (JTAG) Product Brochure New! (PDF file download) IEEE Std 1149.1 (JTAG) Testability Primer New! ABT8996 ABT8996 Testing TI Addresses PCI Multi-drop for IEEE 1149.1 Texas Instruments IEEE 1149.1
/datasheets/files/texas-instruments/sc/docs/jtag/jtaghome.htm
Texas Instruments 12/02/1997 4.61 Kb HTM jtaghome.htm
IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES SCBS676B SCBS676B - DECEMBER 1996 - Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture Provide Built-In Access to IEEE Std 1149.1 Scan-Accessible Test/Maintenance Facilities at Board and Mastering Both 5-V and/or 3.3-V IEEE Std 1149.1 Targets Simple Interface to Low-Cost 3.3-V family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit
/datasheets/files/texas-instruments/data/html/scbs676b-v1.htm
Texas Instruments 26/08/1997 7.13 Kb HTM scbs676b-v1.htm
1149.1 continues on-line Surf the net for TI testability support TI'S home page: http Select IEEE 1149.1/JTAG/Boundary Scan Texas Instruments offers several IEEE 1149.1 Page on the World Wide Web. What's available on-line? Device listing of TI's IEEE 1149.1 , which introduces the fundamentals of the IEEE 1149.1 boundary-scan standard, including architecture 1149.1 and how it works, using DFT in ASICs, IEEE 1149.1 data formats (including BSDL), and application
/datasheets/files/texas-instruments/sc/docs/integrat/95oct/internet.htm
Texas Instruments 08/11/1995 3.64 Kb HTM internet.htm
and repair. All products conform to the IEEE 1149.1 Standard established by the Joint Test Action SCAN18245T SCAN18245T 56 18-Bit Bidirectional Transceiver with 1149.1 F 5962-9311501 x SCAN18373T SCAN18373T 56 18-Bit Latch with 1149.1 F 5962-9311801 x SCAN18374T SCAN18374T 56 18-Bit Flip-Flop with 1149.1 F 5962-9320701 x SCAN18540T SCAN18540T 56 18-Bit Inverting Buffer with 1149.1 F 5962-9312701 x SCAN18541T SCAN18541T 56 18-Bit Buffer with 1149.1
/datasheets/files/national/htm/nsc00885-v1.htm
National 13/08/1999 11.5 Kb HTM nsc00885-v1.htm
National P/N SCANSTA101 SCANSTA101 - Low Voltage IEEE 1149.1 STA Master SCANSTA101 SCANSTA101  Product Folder Low Voltage IEEE 1149.1 STA Master Generic P/N 101 1149.1 STA Master 790 Kbytes 5-Jan-05 View Online Download Receive via Email master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer (uP 1149.1, BIST, and IEEE 1532. The flexibility will allow it to adapt to any changes that may occur in 1532
/datasheets/files/national/pf/scansta101.html
National 17/02/2005 10.73 Kb HTML scansta101.html
 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST  $24.00  LBGA   -40   85  Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST  $24.00  LBGA   -40   85   3.30  with IEEE 1149.1 and at-speed BIST  $24.00  LBGA   -40   85   3.30   Undefined   1800   Yes    SCAN921023 SCAN921023    20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access  SCAN921025 SCAN921025    30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access  $6.60  FBGA   -40 
/datasheets/files/national/0,185329.htm
National 27/02/2004 11.82 Kb HTM 0,185329.htm
:1 Serializer with IEEE 1149.1 and At-Speed BIST  $24.00  LBGA   -40   85   3.30  Deserializers with IEEE 1149.1 and At-Speed BIST  $24.00  LBGA   -40   85   3.30   Undefined   Deserializer   6   660   3960   Yes    SCAN921260 SCAN921260    six 1 to 10 deserializers with IEEE 1149.1  3000   Yes        SCAN921023 SCAN921023    20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test SCAN921025 SCAN921025    30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access  $6.60  FBGA   -40 
/datasheets/files/national/0,185337.htm
National 27/02/2004 11.82 Kb HTM 0,185337.htm