NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
| Part | Manufacturer | Description | Samples | Ordering |
| Part | Manufacturer | Description | Type | Ordering |
| 1149.1 | Texas Instruments | JTAG/IEEE 1149.1 Design Considerations |
13 pages, |
Original | |
| 1149.1 | Texas Instruments | Hierarchically Accessing 1149.1 Applications in a System Environment |
12 pages, |
Original | |
| 1149.1 | Texas Instruments | A Proposed Method of Accessing 1149.1 in a Backplane Environment |
13 pages, |
Original | |
| 1149.1 | Texas Instruments | Partitioning Designs With 1149.1 Scan Capabilities |
14 pages, |
Original | |
| 114-91-210-41-117 | Preci-Dip Durtal SA | Dual-in-line sockets and headers Open frame / surface mount |
1 pages, |
Original | |
| 114-91-304-41-117 | Preci-Dip Durtal SA | Dual-in-line sockets and headers Open frame / surface mount |
1 pages, |
Original | |
| 114-91-306-41-117 | Preci-Dip Durtal SA | Dual-in-line sockets and headers Open frame / surface mount |
1 pages, |
Original | |
| 114-91-308-41-117 | Preci-Dip Durtal SA | Dual-in-line sockets and headers Open frame / surface mount |
1 pages, |
Original | |
| 114-91-308-41-134161 | Preci-Dip Durtal SA | Dual-in-line sockets and headers / open frame / surface mount pick and place |
1 pages, |
Original | |
| 114-91-310-41-117 | Preci-Dip Durtal SA | Dual-in-line sockets and headers Open frame / surface mount |
1 pages, |
Original | |
| Catalog Datasheet Results | Type | Document Tags |
| Abstract: SCAN90CP02 SCAN90CP02 SCAN90CP02 SCAN90CP02 1313 2005 SCAN90CP02 SCAN90CP02 3 (DfT) , JTAG IEEE 1149.1 JTAG IEEE 1149.6 ( StuckAt ) JTAG 'STA111 STA111 'STA112 STA112 JTAG IEEE-1149.1 IEEE 1149.1 JTAG IEEE 1149.1 IEEE 1149.1 DfT AN-891 AN-891 JTAG IC JTAG IC 4 5 " " IEEE 1149.1-1990, IEEE 1000 IEEE 1149.6 TAP VLSI ASIC IEEE 1149.6 IEEE 1149.1 JTAG (BIST , , PC IEEE 1149.1 ICT Telecom IEEE 1149.6 , Datacom JTAG IEEE1149 IEEE1149.1 IC JTAG ... | Original |
3 pages, |
STA112 STA111 SCAN90CP02 IEEE 1149.1 JTAG AN-891 AN-1313 1.9 TDI SCAN90CP02 abstract |
| Abstract: stitcher IEEE 1149.1 IC JTAG 1149.1.1 IEEE 1149.1IC JTAGTDI TDO TMS TCK 4 TRST CPLD , IEEE 1149.1 Application Brief 121 · JTAG JTAG · IEEE 1149.1JTAG · · TAP TAPJTAG · BGA IEEE 1149.1 IEEE 1149.1 IEEE 1149.1 5 IC JTAG Brian Stearns , JTAG 2 JTAG FPGA FPGA JTAG ASIC JTAG IEEE 1149.1 1149.1JTAG JTAG JTAG JTAG LSP3 JTAG LSPn SCANSTA112 SCANSTA112 JTAG IEEE 1149.1 ... | Original |
2 pages, |
STA111 SCANSTA112 SCANSTA111 jtag datasheet abstract |
| Abstract: 'ABT8996 ABT8996 Addressable Scan Port (ASP) Extending IEEE 1149.1 (JTAG) across system-level test solutions How PCI and IEEE 1149.1 (JTAG) work together Three PCI add-in cards, each containing one or more , 1149.1 bus to the card's internal IEEE 1149.1 bus. The combination of a PCI local bus, IEEE 1149.1 , providing a flexible, cost-effective way to achieve IEEE 1149.1 (JTAG) testing at the system level. System-level test solutions Send for your Boundary-Scan Logic IEEE Std. 1149.1 (JTAG) Data Book today! ... | Original |
1 pages, |
SN74ABT8996 IEEE 1149.1 JTAG ABT8996 ABT8996 abstract |
| Abstract: SCANSTA111 SCANSTA111 Multidrop Addressable JTAG Port Improves Throughput and Fault Isolation in IEEE 1149.1 , Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach , IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is , Throughput and Fault Isolation in IEEE 1149.1 Environment SCANSTA111 SCANSTA111 Used in a Multi-board System LSP3 IEEE 1149.1 Configurable FPGA LSP3 IEEE 1149.1 Configurable FPGA IEEE 1149.1 Configurable ... | Original |
2 pages, |
TRST STA111 SCANSTA111SM SCANSTA111MT SCANSTA111 SCAN92LV090 SCAN921224 SCAN921023 SCANSTA111 abstract |
| Abstract: SCAN921023/1224 SCAN921023/1224 20 MHz-66 MHz 10-Bit SerDes with IEEE 1149.1 and At-speed BIST Test Modes Product , Clock Recovery BSC BSC IEEE 1149.1 Test Access Port Quick BERT TDI TDO TMS TCK , /LOCK REFCLK BSC RCLK BSC RCLK R/F IEEE 1149.1 Test Access Port TDI TDO TMS TCK Detected with 1149.1 /TRST Detected with National's At-speed BIST /TRST Description Features , bus and recovers the parallel clock. Both devices are compliant with the IEEE 1149.1 Standard for ... | Original |
1 pages, |
SCAN921224 SCAN921023 SCAN921023/1224 SCAN921023/1224 abstract |
| Abstract: What Does TI Offer in IEEE 1149.1 (JTAG) Silicon Solutions? 40+ commercially released devices IEEE 1149.1 (JTAG) Boundary-Scan Logic Devices Octal Octal (8-bit) (8-bit) BCT BCT , LVTH* LVTH* (3.3V) (3.3V) New www.ti.com/sc/jtag IEEE 1149.1 (JTAG) Silicon Solutions , IEEE 1149.1 (JTAG) Silicon Solutions Universal Bus Transceivers (UBTsTM) with IEEE 1149.1 (JTAG , Driver Transceiver Latched Trans. C C C IEEE 1149.1 UBTTMs Replace 50+ Bus Interface ... | Original |
12 pages, |
SN74LVT8996 SN74LVT8980 LVT8996 LVT8980 IEEE1149 Programmable Silicon Solutions IEEE 1149.1 JTAG tms 374 datasheet abstract |
| Abstract: 1149.1-1990 was ratified in September 1994. AL 10Sept.-97 1149.1(JTAG)-Tut.I-42 1997 TI Test Symposium , JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory JTAG (IEEE 1149.1/P1149.4) Tutorial Introductory AL 10Sept.-97 1149.1(JTAG)-Tut.I-1 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149.4 , Applications For More Information Q&A AL 10Sept.-97 1149.1(JTAG)-Tut.I-2 (10 minutes) (5 minutes) (10 minutes) 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory What Is JTAG? ... | Original |
46 pages, |
SN74BCT8244 SATV002 P-1149 electronics parts tutorial ABT18502 symposium 1/P1149 1/P1149 abstract |
| Abstract: 1149.1 STA Master SCANSTA101 SCANSTA101 Architecture ADDRESS (4.0) DATA (15:0) CE R/W STB DTACK INT , SCANSTA101 SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements , flexible. The device architecture supports IEEE 1149.1, BIST, and IEEE 1532. The flexibility will allow it , data from the parallel bus for shifting through the chain of 1149.1 compliant components (i.e., scan , with either polling or interrupts. Applications The STA101 STA101 device is a system level 1149.1-support ... | Original |
2 pages, |
SN74LVT8980 SN74ACT8990 SCANSTA101 SCANSTA101 abstract |
| Abstract: SCANSTA111 SCANSTA111 Multidrop Addressable IEEE 1149.1 (JTAG) Multiplexer Product Brief PASS BITS TDI , Description The SCANSTA111 SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The , simultaneously tested. Features & Benefits · True IEEE 1149.1 hierarchical and multidrop addressable capability · 3 IEEE 1149.1-compatible configurable local scan ports · Transparent mode can be enabled with a single instruction to conveniently buffer the backplane IEEE 1149.1 pins to those on a single ... | Original |
1 pages, |
STA111 SCANSTA111 Parking counter MTD48 SCANSTA111 abstract |
| Abstract: SCANSTA112 SCANSTA112 7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer Evaluation Kit Documentation Rev , 1149.1 interface. The user will also have to provide a target boundary scan chain (one or more devices , B0 backplane 1149.1 signals are connected to the STA112 STA112, and 2) how the power is provided to the , a more detailed view of the multidrop card. LSPB1 1149.1 Bus LSP1 1149.1 Bus LSP2 1149.1 Bus LSPB1 LSP1 LSP2 B0 1149.1 Bus LSP5 LSP_06 Control Switches LSP4 ... | Original |
4 pages, |
STA112 SCANSTA112EVK SCANSTA112 j9 diode SCANSTA112 abstract |
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| Texas Instruments IEEE 1149.1/JTAG/Boundary Scan IEEE 1149.1 (JTAG) Testability Primer: Download Complete Primer Download Ch. 3: What is IEEE 1149.1 Download Ch. 4: Using Design-For Test (DFT) in ASICs Download Ch. 6: Suggested Design Flow Download Ch. 7: IEEE 1149.1 Applications IEEE 1149.1 (JTAG) Testability Primer, New for 1997 The Texas Instruments IEEE 1149.1 (JTAG) Testability Primer (ssya002c.pdf, 562.7 KB www.datasheetarchive.com/files/texas-instruments/sc/docs/jtag/jtag2.htm |
Texas Instruments | 12/02/1997 | 4.1 Kb | HTM | jtag2.htm |
| Texas Instruments IEEE 1149.1/JTAG/Boundary Scan Instruments IEEE 1149.1 (JTAG) Boundary-Scan Application Reports Impact of JTAG/1149.1 Testability An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip (scta034.pdf, 1044 KB, 1991) A Proposed Method of Accessing 1149.1 in a Backplane Environment (scta032.pdf, 1067 KB, 1992) Hierarchically Accessing 1149.1 Applications in System Environments (scta033.pdf, 873 KB, 1993) JTAG / IEEE 1149.1 www.datasheetarchive.com/files/texas-instruments/sc/docs/jtag/jtag3.htm |
Texas Instruments | 12/02/1997 | 5.32 Kb | HTM | jtag3.htm |
| Texas Instruments IEEE 1149.1/JTAG/Boundary Scan IEEE 1149.1 Product Families: Silicon products Software products Educational products IEEE 1149.1 Literature: Application Reports IEEE 1149.1 (JTAG) Product Brochure New! (PDF file download) IEEE Std 1149.1 (JTAG) Testability Primer New! ABT8996 ABT8996 ABT8996 ABT8996 Addressable Scan Addresses PCI Multi-drop for IEEE 1149.1 Texas Instruments IEEE 1149.1/JTAG www.datasheetarchive.com/files/texas-instruments/sc/docs/jtag/jtaghome.htm |
Texas Instruments | 12/02/1997 | 4.61 Kb | HTM | jtaghome.htm |
| for 1149.1 continues on-line Surf the net for TI testability support TI'S home page Semiconductors Select IEEE 1149.1/JTAG/Boundary Scan Texas Instruments offers several IEEE 1149.1 Boundary Scan products to help the design engineer, whether novice or master. And now of TI's IEEE 1149.1 devices BSDL (Boundary Scan Description Language) files for devices. Scan Educator, which introduces the fundamentals of the IEEE 1149.1 boundary-scan standard www.datasheetarchive.com/files/texas-instruments/data/sc/docs/integrat/95oct/internet.htm |
Texas Instruments | 08/02/1999 | 3.97 Kb | HTM | internet.htm |
| for 1149.1 continues on-line Surf the net for TI testability support TI'S home page: http://www.ti.com Select TI's Main Menu Select Products and Services Select Semiconductors Select IEEE 1149.1/JTAG/Boundary Scan Texas Instruments offers several IEEE 1149.1 Boundary Scan products to help . What's available on-line? Device listing of TI's IEEE 1149.1 devices BSDL (Boundary fundamentals of the IEEE 1149.1 boundary-scan standard, including architecture, protocols and required www.datasheetarchive.com/files/texas-instruments/sc/docs/integrat/95oct/internet.htm |
Texas Instruments | 08/11/1995 | 3.64 Kb | HTM | internet.htm |
| App Note Abstract: DESIGN TRADEOFFS WHEN IMPLEMENTING IEEE 1149.1 DESIGN TRADEOFFS WHEN IMPLEMENTING IEEE 1149.1 Many design trade-offs occur when implementing the IEEE 1149.1 in integrated circuits (ICs), printed wiring boards (PWB), and systems. This document presents an overview of IEEE 1149.1, its logic and design trade-offs, PWB design, and system tasks. View the complete PDF document: scta045a.pdf (71 K Bytes) (Requires Acrobat Reader 3.x ) Go to the Engineering www.datasheetarchive.com/files/texas-instruments/sc/psheets/abstract/apps/scta045a.htm |
Texas Instruments | 01/07/1998 | 3.96 Kb | HTM | scta045a.htm |
| SCAN921023 SCAN921023 SCAN921023 SCAN921023 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access $9.55 FBGA 3.3V CMOS Serializer 1 660 660 JTAG (IEEE1149.1),BIST SCAN921025 SCAN921025 SCAN921025 SCAN921025 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access $10.00 FBGA 3.3V CMOS Serializer 1 800 800 JTAG(IEEE1149.1),BIST SCAN921224 SCAN921224 SCAN921224 SCAN921224 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access $9.55 FBGA 3.3V CMOS Deserializer 1 www.datasheetarchive.com/files/national/htm/nsc02518-v3.htm |
National | 16/08/2002 | 18.5 Kb | HTM | nsc02518-v3.htm |
| SCAN16512 SCAN16512 SCAN16512 SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs $3.25 FBGA, die -40 85 SCAN16512A SCAN16512A SCAN16512A SCAN16512A Low Voltage Universal 16-bit IEEE 1149.1 Bus Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs $3.25 FBGA -40 85 SCAN921023 SCAN921023 SCAN921023 SCAN921023 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access IEEE 1149.1 Test Access $6.60 FBGA -40 85 SCAN921224 SCAN921224 SCAN921224 SCAN921224 20 MHz-66MHz www.datasheetarchive.com/files/national/0,,4548,.htm |
National | 27/02/2004 | 9.24 Kb | HTM | 0,,4548,.htm |
| IEEE 1149.1 Software Products IEEE 1149.1 Software Products ASSET InterTech acquired Texas Instruments ASSET boundary responsible for the IEEE 1149.1 boundary-scan diagnostic software, ASSET. ASSET InterTech can be reached at (214) 437-2800. The IEEE 1149.1 software products are: ASSET Scan Engine 1149.1-compliant circuits, boards, and systems. Scan Engine The Scan Engine www.datasheetarchive.com/files/texas-instruments/sc/docs/jtag/software.htm |
Texas Instruments | 08/11/1996 | 5.07 Kb | HTM | software.htm |
| Systemtest with Boundary Scan according to IEEE 1149.1 (JTAG) Hierarchical Teststrategy from Device to System SCAN EDUCATOR Standard devices with IEEE 1149.1 Bus interface logic Test Bus Scan Board Standard Data Formats for IEEE 1149.1 Boundary Scan Description Language -testable systems Application-specific Devices with IEEE 1149.1 Fixed Point Digital Signal Processor Floating Point DSP DSP Emulation via IEEE 1149.1 Protocol Multi Media Processors and Decoders www.datasheetarchive.com/files/texas-instruments/sc/docs/training/europe/workshop/scan.htm |
Texas Instruments | 03/01/1997 | 4.53 Kb | HTM | scan.htm |