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SCANSTA112EVK Texas Instruments 7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer
5962-9681201Q3A Texas Instruments 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 28-LCCC -55 to 125
5962-9681201QLA Texas Instruments 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CDIP -55 to 125
SNJ54ABT8996FK Texas Instruments 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 28-LCCC -55 to 125
5962-9681201QKA Texas Instruments 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP -55 to 125
SNJ54ABT8996W Texas Instruments 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP -55 to 125

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1149.1 Datasheet

Part Manufacturer Description PDF Type
1149.1 Texas Instruments JTAG/IEEE 1149.1 Design Considerations Original
1149.1 Texas Instruments Hierarchically Accessing 1149.1 Applications in a System Environment Original
1149.1 Texas Instruments A Proposed Method of Accessing 1149.1 in a Backplane Environment Original
1149.1 Texas Instruments Partitioning Designs With 1149.1 Scan Capabilities Original
114-91-210-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-304-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-306-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-308-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-308-41-134161 PRECI-DIP Dual-in-line sockets and headers / open frame / surface mount pick and place Original
114-91-310-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-314-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-314-41-134161 PRECI-DIP Dual-in-line sockets and headers / open frame / surface mount pick and place Original
114-91-316-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-316-41-134161 PRECI-DIP Dual-in-line sockets and headers / open frame / surface mount pick and place Original
114-91-318-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-318-41-134161 PRECI-DIP Dual-in-line sockets and headers / open frame / surface mount pick and place Original
114-91-320-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-320-41-134161 PRECI-DIP Dual-in-line sockets and headers / open frame / surface mount pick and place Original
114-91-322-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
114-91-324-41-117 PRECI-DIP Dual-in-line sockets and headers Open frame / surface mount Original
Showing first 20 results.

1149.1

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: 1149.1-1990 was ratified in September 1994. AL 10Sept.-97 1149.1(JTAG)-Tut.I-42 1997 TI Test Symposium , JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory JTAG (IEEE 1149.1/P1149.4) Tutorial Introductory AL 10Sept.-97 1149.1(JTAG)-Tut.I-1 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149 , Applications For More Information Q&A AL 10Sept.-97 1149.1(JTAG)-Tut.I-2 (10 minutes) (5 minutes) (10 minutes) 1997 TI Test Symposium JTAG (IEEE 1149.1/P1149.4) Tutorial - Introductory What Is JTAG Texas Instruments
Original
SN74BCT8244 symposium ABT18502 electronics parts tutorial ieee 1149.1 jtag boundary scan ieee embedded system papers free 1/P1149
Abstract: IEEE 1149.1 (JTAG) Boundary-Scan Testing ® in Altera Devices August 1999, ver. 4.04 , IEEE Std. 1149.1-1990 specification. This boundary-scan test (BST) architecture offers the capability , boundary-scan testing. Figure 1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In , . 1149.11990 specification by providing BST capability for input, output, and dedicated configuration pins. Altera Corporation A-AN-039-04.04 1 AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Altera
Original
EPF8282AV EPF8282A EPF8636A EPF8820A EPF7128S EPM7032S testing of diode IEEE 1149.1 JTAG epm9320 register FLEX controller vhdl code download EPM7128S EPM7192S 7000S EPF8820
Abstract: ® IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices Application Note 39 August , developed a specification for boundary-scan testing that was later standardized as the IEEE 1149.1-1990 , 1. IEEE 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Pin Signal , Table 1 summarizes Altera devices that comply with the IEEE 1149.1-1990 specification by providing BST , AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Devices Table 1. Altera Devices with BST Altera
Original
EPF10K10 EPF10K10A EPF10K20 EPF10K30 EPF10K30A EPF10K40
Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices MII51014-1.7 Introduction As , specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification , Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Serial Data Out , Device 2 This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in MAX® II devices. The topics are as follows: "IEEE Std. 1149.1 Boundary-Scan Register" on page 13­3 "IEEE Std Altera
Original
ieee 1532 BSDL
Abstract: . 1149.1-compliant MAX II devices, see the Altera web site at www.altera.com. The IEEE Std. 1149.1 BST , Chapter 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices MII51014 , specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification , 13­1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Serial Data , IEEE Std. 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST Altera
Original
Abstract: 14. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Cyclone II Devices CII51014-2.1 Introduction , specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification , Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC Core Logic JTAG , Connection JTAG Device 2 14­1 IEEE Std. 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in CycloneTM II devices, including: IEEE Altera
Original
VHDL code for TAP controller
Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing in Stratix III Devices SIII51013-1.9 This chapter discusses how to use the IEEE Std. 1149.1 boundary-scan test (BST) circuitry in Stratix® III devices. The , 13­1 shows the concept of BST. Figure 13­1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell , Tested Connection JTAG Device 2 In addition to BST, you can use the IEEE Std. 1149.1 controller , feature of the IEEE Std. 1149.1 circuitry. f For information about configuring Stratix III devices by Altera
Original
ic tms 1000 1.9 TDI EP3SE50 TMS 1100 EP3SL150ES
Abstract: 9. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Stratix II & Stratix II GX Devices SII52009 , boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This Boundary-Scan , 9­1 illustrates the concept of BST. Figure 9­1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan , . 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in Stratix® II and Stratix GX devices, including: IEEE Std. 1149.1 BST architecture IEEE Altera
Original
SII52009-3
Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Arria GX Devices AGX52013-1.2 Introduction , boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This Boundary-Scan , 13­1 illustrates the concept of BST. Figure 13­1. IEEE Std. 1149.1 Boundary-Scan Testing , Introduction This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in ArriaTM GX devices, including: IEEE Std. 1149.1 BST architecture IEEE Std. 1149.1 boundary-scan register Altera
Original
vhdl code for phase shift
Abstract: IEEE 1149.1 (JTAG) Boundary-Scan Testing ® in Altera Devices September 2000, ver. 4.05 , IEEE Std. 1149.1 specification. This boundary-scan test (BST) architecture offers the capability to , testing. Figure 1. IEEE Std. 1149.1 Boundary-Scan Testing Boundary-Scan Cell Serial Data In IC , . 1149.1 specification by providing BST capability for input, output, and dedicated configuration pins. Altera Corporation A-AN-039-04.05 1 AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera Altera
Original
20KACEX EPM7064S 7000B
Abstract: 13. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Arria GX Devices AGX52013-1.1 Introduction , boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This Boundary-Scan , 13­1 illustrates the concept of BST. Figure 13­1. IEEE Std. 1149.1 Boundary-Scan Testing , . 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in ArriaTM GX devices, including: IEEE Std. 1149.1 BST architecture IEEE Std. 1149.1 Altera
Original
Arria II GX FPGA Development Board
Abstract: frequencies using the IEEE 1149.1 pins-in and pins-out test methods. Actually, an IEEE 1149.1-based pins-in , Design Tradeoffs When Implementing IEEE 1149.1 SCTA045A January 1997 1 IMPORTANT NOTICE , . . . . . . . . . . . . 1 What is IEEE 1149.1? . . . . . . . . . . . . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . 2 Design Tradeoffs in Implementing IEEE 1149.1 IC Level , Title Page 1 2 IEEE 1149.1 Pins-In and Pins-Out Testing Via Boundary Scan . . . . . . . . . . Texas Instruments
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ACT8999 delta pwb free ieee paper on vlsi latest star delta control board wiring diagram
Abstract: IEEE 1149.1 IEEE 1149.1 (TAP) ( ) at-speed BIST (at-speed) IEEE 1149.1 (JTAG) at-speed BIST PLL (Tx Rx , 10 Bus BLVDS / IEEE 1149.1 (JTAG) at-speed BIST 30-80MHz 10 Bus BLVDS / IEEE 1149.1 (JTAG) at-speed BIST Converted to nat2000 DTD Changed to released status, added subscripts , 20010607 SCAN921025 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access CMOS National Semiconductor
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SCAN921226 SCAN921025SLC SCAN921226SLC AN-1217 DS92LV1210 DS92LV1212 DS200248-01-JP SCAN921025/SCAN921226 30-80MH 35-80M 30-80M
Abstract: What Does TI Offer in IEEE 1149.1 (JTAG) Silicon Solutions? 40+ commercially released devices IEEE 1149.1 (JTAG) Boundary-Scan Logic Devices Octal Octal (8-bit) (8-bit) BCT BCT , LVTH* LVTH* (3.3V) (3.3V) New www.ti.com/sc/jtag IEEE 1149.1 (JTAG) Silicon Solutions , . IEEE 1149.1 (JTAG) Silicon Solutions Universal Bus Transceivers (UBTsTM) with IEEE 1149.1 (JTAG , Driver Transceiver Latched Trans. C C C IEEE 1149.1 UBTTMs Replace 50+ Bus Interface Texas Instruments
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LVT8980 LVT8996 IEEE1149 SN74LVT8980 SN74LVT8996 tms 374 tms 374 chip Programmable Silicon Solutions ieee1149.1 SN74LVT8 LVT89
Abstract: methodology, defined by IEEE Std 1149.1, is used to ease problems associated with both product development , both manufacturing test and field test, IEEE Std 1149.1 logic and test vectors can be used to test , testing has a different set of fault characteristics. IEEE Std 1149.1 logic can be used throughout the , (SSA) State machine-based generation/comparison IEEE Std 1149.1 commands can initiate BIST tests and , now include internal IEEE Std 1149.1-compliant scan circuitry. High-pin-count and fine-pitch packages Texas Instruments
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SN54ACT8997 SN74ACT8997
Abstract: 12. IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family CIII51014-2.2 This chapter provides guidelines on using the IEEE Std. 1149.1 boundary-scan test (BST) circuitry in , following sections: "IEEE Std. 1149.1 BST Architecture" on page 12­1 "IEEE Std. 1149.1 BST , for IEEE Std. 1149.1 BST" on page 12­6 "Boundary-Scan Description Language Support" on page 12­7 IEEE Std. 1149.1 BST Architecture Cyclone III device family operating in the IEEE Std. 1149.1 Altera
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altera cyclone 3 pins EP3CLS200 EP3CLS100 EP3C55 EP3C40 EP3C25 pin guideline
Abstract: 12. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Cyclone III Devices CIII51012-2.0 Introduction This chapter provides guidelines on using the IEEE Std. 1149.1 boundary-scan test (BST , the following sections: "IEEE Std. 1149.1 BST Architecture" on page 12­1 "IEEE Std. 1149.1 , "Guidelines for IEEE Std. 1149.1 BST" on page 12­6 "Boundary-Scan Description Language Support" on page 12­7 IEEE Std. 1149.1 BST Architecture Cyclone III family devices operating in the IEEE Std. 1149.1 Altera
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AN39 EP3C25 EP3C16 EP3C120 EP3C10 EP3CLS70
Abstract: 15. IEEE 1149.1 (JTAG) Boundary-Scan Testing for Stratix II & Stratix II GX Devices SII52009 , boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This Boundary-Scan , 15­1 illustrates the concept of BST. Figure 15­1. IEEE Std. 1149.1 Boundary-Scan Testing , . 1149.1 BST Architecture This chapter discusses how to use the IEEE Std. 1149.1 BST circuitry in Stratix® II and Stratix GX devices, including: IEEE Std. 1149.1 BST architecture IEEE Altera
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Abstract: SCAN90CP02 SCAN90CP02 1313 2005 SCAN90CP02 3 (DfT) , JTAG IEEE 1149.1 JTAG IEEE 1149.6 ( StuckAt ) JTAG 'STA111 'STA112 JTAG IEEE-1149.1 IEEE 1149.1 JTAG IEEE 1149.1 IEEE 1149.1 DfT AN-891 JTAG IC JTAG IC 4 5 " " IEEE 1149.1-1990, IEEE 1000 IEEE 1149.6 TAP VLSI ASIC IEEE 1149.6 IEEE 1149.1 JTAG (BIST , , PC IEEE 1149.1 ICT Telecom IEEE 1149.6 , Datacom JTAG IEEE1149.1 IC JTAG National Semiconductor
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AN-1313 PEM10 JTAG IEEE 1149.6 AN200949 PEM00 PEM01 PEM11
Abstract: SECTION 9 IEEE 1149.1 TEST ACCESS PORT The MC68307 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture , levels NOTE Certain precautions must be observed to ensure that the IEEE 1149.1 test logic does not interfere with non-test operation. See Section 9.6 Non-IEEE 1149.1 Operation for details. 9.1 OVERVIEW NOTE This description is not intended to be used without the supporting IEEE 1149.1 document. The discussion -
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